POP-OUT | CLOSE
 
X-RAY DIFFRACTION
Materials and Methods page
4DHL
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 4
    Temperature 291.0
    Details 2.3M ammonium sulfate, 0.1M sodium acetate pH 4.0, VAPOR DIFFUSION, HANGING DROP, temperature 291K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 126.1 α = 90
    b = 126.1 β = 90
    c = 297.98 γ = 120
     
    Space Group
    Space Group Name:    P 31 2 1
     
     
  •   Diffraction Hide
    Diffraction Detector
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type AUSTRALIAN SYNCHROTRON BEAMLINE MX2
    Wavelength List 0.9
    Site AUSTRALIAN SYNCHROTRON
    Beamline MX2
     
     
  •   Refinement Data Hide
    Reflection Details
    Resolution(High) 2.3
    Resolution(Low) 19.82
    Number Reflections(All) 115253
    Number Reflections(Observed) 115053
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.3
    Resolution(Low) 19.82
    Cut-off Sigma(F) 0.34
    Number of Reflections(Observed) 115053
    Number of Reflections(R-Free) 5775
    Percent Reflections(Observed) 94.11
    R-Factor(Observed) 0.1603
    R-Work 0.1578
    R-Free 0.2058
     
    Temperature Factor Modeling
    Anisotropic B[1][1] 0.3053
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 0.3053
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -0.6107
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3
    Shell Resolution(Low) 2.3261
    Number of Reflections(R-Free) 196
    Number of Reflections(R-Work) 3650
    R-Factor(R-Work) 0.192
    R-Factor(R-Free) 0.2721
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3261
    Shell Resolution(Low) 2.3534
    Number of Reflections(R-Free) 195
    Number of Reflections(R-Work) 3675
    R-Factor(R-Work) 0.2034
    R-Factor(R-Free) 0.2766
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3534
    Shell Resolution(Low) 2.3821
    Number of Reflections(R-Free) 193
    Number of Reflections(R-Work) 3695
    R-Factor(R-Work) 0.203
    R-Factor(R-Free) 0.2441
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3821
    Shell Resolution(Low) 2.4122
    Number of Reflections(R-Free) 187
    Number of Reflections(R-Work) 3609
    R-Factor(R-Work) 0.1924
    R-Factor(R-Free) 0.2652
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4122
    Shell Resolution(Low) 2.4439
    Number of Reflections(R-Free) 193
    Number of Reflections(R-Work) 3674
    R-Factor(R-Work) 0.1922
    R-Factor(R-Free) 0.257
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4439
    Shell Resolution(Low) 2.4773
    Number of Reflections(R-Free) 187
    Number of Reflections(R-Work) 3682
    R-Factor(R-Work) 0.192
    R-Factor(R-Free) 0.2677
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4773
    Shell Resolution(Low) 2.5126
    Number of Reflections(R-Free) 201
    Number of Reflections(R-Work) 3658
    R-Factor(R-Work) 0.1945
    R-Factor(R-Free) 0.2587
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5126
    Shell Resolution(Low) 2.55
    Number of Reflections(R-Free) 184
    Number of Reflections(R-Work) 3667
    R-Factor(R-Work) 0.175
    R-Factor(R-Free) 0.2628
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.55
    Shell Resolution(Low) 2.5898
    Number of Reflections(R-Free) 198
    Number of Reflections(R-Work) 3661
    R-Factor(R-Work) 0.1634
    R-Factor(R-Free) 0.2141
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5898
    Shell Resolution(Low) 2.6322
    Number of Reflections(R-Free) 188
    Number of Reflections(R-Work) 3688
    R-Factor(R-Work) 0.1638
    R-Factor(R-Free) 0.2286
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6322
    Shell Resolution(Low) 2.6774
    Number of Reflections(R-Free) 168
    Number of Reflections(R-Work) 3698
    R-Factor(R-Work) 0.1748
    R-Factor(R-Free) 0.2498
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6774
    Shell Resolution(Low) 2.726
    Number of Reflections(R-Free) 168
    Number of Reflections(R-Work) 3634
    R-Factor(R-Work) 0.1762
    R-Factor(R-Free) 0.2367
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.726
    Shell Resolution(Low) 2.7783
    Number of Reflections(R-Free) 196
    Number of Reflections(R-Work) 3662
    R-Factor(R-Work) 0.171
    R-Factor(R-Free) 0.2359
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7783
    Shell Resolution(Low) 2.8349
    Number of Reflections(R-Free) 193
    Number of Reflections(R-Work) 3638
    R-Factor(R-Work) 0.1682
    R-Factor(R-Free) 0.2415
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8349
    Shell Resolution(Low) 2.8963
    Number of Reflections(R-Free) 177
    Number of Reflections(R-Work) 3619
    R-Factor(R-Work) 0.1658
    R-Factor(R-Free) 0.2337
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8963
    Shell Resolution(Low) 2.9635
    Number of Reflections(R-Free) 202
    Number of Reflections(R-Work) 3655
    R-Factor(R-Work) 0.158
    R-Factor(R-Free) 0.2105
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9635
    Shell Resolution(Low) 3.0373
    Number of Reflections(R-Free) 204
    Number of Reflections(R-Work) 3657
    R-Factor(R-Work) 0.1631
    R-Factor(R-Free) 0.217
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0373
    Shell Resolution(Low) 3.1192
    Number of Reflections(R-Free) 198
    Number of Reflections(R-Work) 3612
    R-Factor(R-Work) 0.1594
    R-Factor(R-Free) 0.2035
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1192
    Shell Resolution(Low) 3.2106
    Number of Reflections(R-Free) 193
    Number of Reflections(R-Work) 3638
    R-Factor(R-Work) 0.1595
    R-Factor(R-Free) 0.2105
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2106
    Shell Resolution(Low) 3.3137
    Number of Reflections(R-Free) 203
    Number of Reflections(R-Work) 3653
    R-Factor(R-Work) 0.1614
    R-Factor(R-Free) 0.2022
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3137
    Shell Resolution(Low) 3.4316
    Number of Reflections(R-Free) 192
    Number of Reflections(R-Work) 3603
    R-Factor(R-Work) 0.1651
    R-Factor(R-Free) 0.2281
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4316
    Shell Resolution(Low) 3.5682
    Number of Reflections(R-Free) 212
    Number of Reflections(R-Work) 3587
    R-Factor(R-Work) 0.154
    R-Factor(R-Free) 0.1885
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5682
    Shell Resolution(Low) 3.7296
    Number of Reflections(R-Free) 198
    Number of Reflections(R-Work) 3644
    R-Factor(R-Work) 0.1402
    R-Factor(R-Free) 0.1794
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7296
    Shell Resolution(Low) 3.9248
    Number of Reflections(R-Free) 188
    Number of Reflections(R-Work) 3619
    R-Factor(R-Work) 0.1345
    R-Factor(R-Free) 0.1652
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.9248
    Shell Resolution(Low) 4.1686
    Number of Reflections(R-Free) 195
    Number of Reflections(R-Work) 3612
    R-Factor(R-Work) 0.1245
    R-Factor(R-Free) 0.1788
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.1686
    Shell Resolution(Low) 4.487
    Number of Reflections(R-Free) 194
    Number of Reflections(R-Work) 3613
    R-Factor(R-Work) 0.1183
    R-Factor(R-Free) 0.1531
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.487
    Shell Resolution(Low) 4.9322
    Number of Reflections(R-Free) 186
    Number of Reflections(R-Work) 3599
    R-Factor(R-Work) 0.116
    R-Factor(R-Free) 0.1569
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.9322
    Shell Resolution(Low) 5.6315
    Number of Reflections(R-Free) 192
    Number of Reflections(R-Work) 3581
    R-Factor(R-Work) 0.1404
    R-Factor(R-Free) 0.1877
    Percent Reflections(Observed) 91.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.6315
    Shell Resolution(Low) 7.0419
    Number of Reflections(R-Free) 201
    Number of Reflections(R-Work) 3618
    R-Factor(R-Work) 0.1687
    R-Factor(R-Free) 0.1872
    Percent Reflections(Observed) 90.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 7.0419
    Shell Resolution(Low) 19.8206
    Number of Reflections(R-Free) 193
    Number of Reflections(R-Work) 3677
    R-Factor(R-Work) 0.1862
    R-Factor(R-Free) 0.1946
    Percent Reflections(Observed) 89.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.005
    f_chiral_restr 0.073
    f_dihedral_angle_d 14.271
    f_angle_d 1.033
    f_bond_d 0.007
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 13974
    Nucleic Acid Atoms 0
    Heterogen Atoms 526
    Solvent Atoms 1545
     
     
  •   Software and Computing Hide
    Computing
    Structure Refinement PHENIX (phenix.refine: 1.7_650)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7_650)