X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
pH 6.2
Temperature 290.0
Details 8% PEG 8K, 0.1 M NaCl, 0.1 M Na/K phosphate pH 6.2, VAPOR DIFFUSION, temperature 290K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 90.69 α = 90
b = 90.69 β = 90
c = 130.03 γ = 120
Symmetry
Space Group P 32 2 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD ADSC QUANTUM 315r -- 2009-03-18
Diffraction Radiation
Monochromator Protocol
CHANNEL CUT CRYOGENICALLY COOLED MONOCHROMATOR CRYSTAL MAD
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SOLEIL BEAMLINE PROXIMA 1 0.9791, 0.9794, 0.9770 SOLEIL PROXIMA 1

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.35 27.85 99.8 0.056 0.056 -- 6.5 -- 26274 -- 0.0 68.8
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.35 2.39 99.8 0.353 0.353 4.4 3.8 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MAD 2.35 27.85 -- 0.0 26329 26274 1299 99.8 -- 0.192 0.19 0.23 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.35 2.45 -- 151 2768 0.2176 0.2512 -- 99.79
Temperature Factor Modeling
Temperature Factor Value
Mean Isotropic B 72.87
Anisotropic B[1][1] 7.0106
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] 0.0
Anisotropic B[2][2] 7.0106
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] -14.0211
RMS Deviations
Key Refinement Restraint Deviation
t_bond_d 0.01
t_angle_deg 1.08
t_omega_torsion 3.02
t_other_torsion 17.7
Coordinate Error
Parameter Value
Luzzati ESD (Observed) 0.39
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 3193
Nucleic Acid Atoms 0
Heterogen Atoms 21
Solvent Atoms 67

Software

Computing
Computing Package Purpose
HKL-2000 Data Reduction (intensity integration)
HKL-2000 Data Reduction (data scaling)
SHARP Structure Solution
BUSTER 2.10.0 Structure Refinement
Software
Software Name Purpose
BUSTER version: 2.10.0 refinement
SHARP model building
HKL-2000 data collection