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X-RAY DIFFRACTION
Materials and Methods page
4DF1
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 5.6
    Temperature 293.0
    Details 30% PEG 4000, 0.1M Sodium citrate, 0.2M ammonium acetate, pH 5.6, VAPOR DIFFUSION, HANGING DROP, temperature 293.0K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 47.16 α = 90
    b = 62.07 β = 97.46
    c = 72.71 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315r
    Collection Date 2010-11-19
     
    Diffraction Radiation
    Monochromator MIRRORS
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type NSLS BEAMLINE X29A
    Wavelength List 1.075
    Site NSLS
    Beamline X29A
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 1.9
    Resolution(Low) 37.35
    Number Reflections(All) 31340
    Number Reflections(Observed) 31340
    Percent Possible(Observed) 95.04
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.899
    Resolution(Low) 37.348
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 31340
    Number of Reflections(Observed) 31340
    Number of Reflections(R-Free) 1578
    Percent Reflections(Observed) 95.04
    R-Factor(All) 0.1511
    R-Factor(Observed) 0.1511
    R-Work 0.1496
    R-Free 0.1791
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Anisotropic B[1][1] 0.2994
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] -0.6122
    Anisotropic B[2][2] -0.3985
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 0.0991
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8995
    Shell Resolution(Low) 1.9608
    Number of Reflections(R-Free) 107
    Number of Reflections(R-Work) 1858
    R-Factor(R-Work) 0.2093
    R-Factor(R-Free) 0.2742
    Percent Reflections(Observed) 66.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9608
    Shell Resolution(Low) 2.0308
    Number of Reflections(R-Free) 111
    Number of Reflections(R-Work) 2573
    R-Factor(R-Work) 0.1368
    R-Factor(R-Free) 0.1711
    Percent Reflections(Observed) 90.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0308
    Shell Resolution(Low) 2.1121
    Number of Reflections(R-Free) 150
    Number of Reflections(R-Work) 2721
    R-Factor(R-Work) 0.1321
    R-Factor(R-Free) 0.1711
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1121
    Shell Resolution(Low) 2.2083
    Number of Reflections(R-Free) 160
    Number of Reflections(R-Work) 2767
    R-Factor(R-Work) 0.1279
    R-Factor(R-Free) 0.1644
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2083
    Shell Resolution(Low) 2.3247
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 2803
    R-Factor(R-Work) 0.1339
    R-Factor(R-Free) 0.1731
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3247
    Shell Resolution(Low) 2.4703
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2802
    R-Factor(R-Work) 0.1431
    R-Factor(R-Free) 0.1803
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4703
    Shell Resolution(Low) 2.661
    Number of Reflections(R-Free) 152
    Number of Reflections(R-Work) 2807
    R-Factor(R-Work) 0.16
    R-Factor(R-Free) 0.2091
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.661
    Shell Resolution(Low) 2.9287
    Number of Reflections(R-Free) 151
    Number of Reflections(R-Work) 2838
    R-Factor(R-Work) 0.1619
    R-Factor(R-Free) 0.1996
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9287
    Shell Resolution(Low) 3.3522
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 2850
    R-Factor(R-Work) 0.1585
    R-Factor(R-Free) 0.182
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3522
    Shell Resolution(Low) 4.2225
    Number of Reflections(R-Free) 155
    Number of Reflections(R-Work) 2843
    R-Factor(R-Work) 0.144
    R-Factor(R-Free) 0.1614
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.2225
    Shell Resolution(Low) 37.3548
    Number of Reflections(R-Free) 170
    Number of Reflections(R-Work) 2900
    R-Factor(R-Work) 0.1535
    R-Factor(R-Free) 0.1653
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.005
    f_chiral_restr 0.072
    f_dihedral_angle_d 13.093
    f_angle_d 1.084
    f_bond_d 0.007
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 3054
    Nucleic Acid Atoms 0
    Heterogen Atoms 46
    Solvent Atoms 323
     
     
  •   Software and Computing Hide
    Computing
    Data Collection CBASS
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHENIX
    Structure Refinement PHENIX (phenix.refine: 1.6.4_486)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.6.4_486)
    model building PHENIX
    data collection CBASS