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X-RAY DIFFRACTION
Materials and Methods page
4DF0
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 6.5
    Temperature 293.0
    Details 25% PEG 3350, 0.1M Bis-Tris, 0.2M Lithium sulfate, pH 6.5, VAPOR DIFFUSION, HANGING DROP, temperature 293.0K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 171.61 α = 90
    b = 171.61 β = 90
    c = 171.61 γ = 90
     
    Space Group
    Space Group Name:    I 41 3 2
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315r
    Collection Date 2010-08-09
     
    Diffraction Radiation
    Monochromator MIRRORS
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type NSLS BEAMLINE X29A
    Wavelength List 1.075
    Site NSLS
    Beamline X29A
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 1.5
    Resolution(Low) 38.37
    Number Reflections(All) 67964
    Number Reflections(Observed) 67964
    Percent Possible(Observed) 99.27
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.5
    Resolution(Low) 38.373
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 67964
    Number of Reflections(Observed) 67964
    Number of Reflections(R-Free) 3448
    Percent Reflections(Observed) 99.27
    R-Factor(All) 0.2067
    R-Factor(Observed) 0.2067
    R-Work 0.205
    R-Free 0.2382
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Anisotropic B[1][1] 0.0
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 0.0
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 0.0
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5
    Shell Resolution(Low) 1.5206
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 2582
    R-Factor(R-Work) 0.2907
    R-Factor(R-Free) 0.2996
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5206
    Shell Resolution(Low) 1.5423
    Number of Reflections(R-Free) 130
    Number of Reflections(R-Work) 2554
    R-Factor(R-Work) 0.2915
    R-Factor(R-Free) 0.3002
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5423
    Shell Resolution(Low) 1.5653
    Number of Reflections(R-Free) 150
    Number of Reflections(R-Work) 2563
    R-Factor(R-Work) 0.2917
    R-Factor(R-Free) 0.329
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5653
    Shell Resolution(Low) 1.5898
    Number of Reflections(R-Free) 131
    Number of Reflections(R-Work) 2570
    R-Factor(R-Work) 0.27
    R-Factor(R-Free) 0.3306
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5898
    Shell Resolution(Low) 1.6159
    Number of Reflections(R-Free) 123
    Number of Reflections(R-Work) 2579
    R-Factor(R-Work) 0.2517
    R-Factor(R-Free) 0.3014
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6159
    Shell Resolution(Low) 1.6437
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2544
    R-Factor(R-Work) 0.2649
    R-Factor(R-Free) 0.3031
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6437
    Shell Resolution(Low) 1.6736
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 2552
    R-Factor(R-Work) 0.2584
    R-Factor(R-Free) 0.3241
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6736
    Shell Resolution(Low) 1.7058
    Number of Reflections(R-Free) 127
    Number of Reflections(R-Work) 2590
    R-Factor(R-Work) 0.2484
    R-Factor(R-Free) 0.2601
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7058
    Shell Resolution(Low) 1.7406
    Number of Reflections(R-Free) 152
    Number of Reflections(R-Work) 2540
    R-Factor(R-Work) 0.2592
    R-Factor(R-Free) 0.3133
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7406
    Shell Resolution(Low) 1.7785
    Number of Reflections(R-Free) 150
    Number of Reflections(R-Work) 2560
    R-Factor(R-Work) 0.2468
    R-Factor(R-Free) 0.3215
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7785
    Shell Resolution(Low) 1.8199
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 2583
    R-Factor(R-Work) 0.2416
    R-Factor(R-Free) 0.3246
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8199
    Shell Resolution(Low) 1.8654
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2564
    R-Factor(R-Work) 0.2428
    R-Factor(R-Free) 0.3101
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8654
    Shell Resolution(Low) 1.9158
    Number of Reflections(R-Free) 131
    Number of Reflections(R-Work) 2566
    R-Factor(R-Work) 0.2384
    R-Factor(R-Free) 0.2652
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9158
    Shell Resolution(Low) 1.9722
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 2562
    R-Factor(R-Work) 0.2135
    R-Factor(R-Free) 0.2181
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9722
    Shell Resolution(Low) 2.0358
    Number of Reflections(R-Free) 127
    Number of Reflections(R-Work) 2585
    R-Factor(R-Work) 0.2051
    R-Factor(R-Free) 0.2393
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0358
    Shell Resolution(Low) 2.1086
    Number of Reflections(R-Free) 127
    Number of Reflections(R-Work) 2548
    R-Factor(R-Work) 0.2078
    R-Factor(R-Free) 0.2479
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1086
    Shell Resolution(Low) 2.193
    Number of Reflections(R-Free) 153
    Number of Reflections(R-Work) 2538
    R-Factor(R-Work) 0.2127
    R-Factor(R-Free) 0.2521
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.193
    Shell Resolution(Low) 2.2928
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 2559
    R-Factor(R-Work) 0.2037
    R-Factor(R-Free) 0.2304
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2928
    Shell Resolution(Low) 2.4137
    Number of Reflections(R-Free) 156
    Number of Reflections(R-Work) 2514
    R-Factor(R-Work) 0.1988
    R-Factor(R-Free) 0.2324
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4137
    Shell Resolution(Low) 2.5648
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2575
    R-Factor(R-Work) 0.2028
    R-Factor(R-Free) 0.2489
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5648
    Shell Resolution(Low) 2.7628
    Number of Reflections(R-Free) 119
    Number of Reflections(R-Work) 2578
    R-Factor(R-Work) 0.2091
    R-Factor(R-Free) 0.2413
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7628
    Shell Resolution(Low) 3.0408
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2593
    R-Factor(R-Work) 0.2134
    R-Factor(R-Free) 0.247
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0408
    Shell Resolution(Low) 3.4805
    Number of Reflections(R-Free) 123
    Number of Reflections(R-Work) 2632
    R-Factor(R-Work) 0.1984
    R-Factor(R-Free) 0.2157
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4805
    Shell Resolution(Low) 4.3841
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2677
    R-Factor(R-Work) 0.1709
    R-Factor(R-Free) 0.1845
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.3841
    Shell Resolution(Low) 38.3857
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 2808
    R-Factor(R-Work) 0.1813
    R-Factor(R-Free) 0.2249
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.006
    f_chiral_restr 0.07
    f_dihedral_angle_d 11.731
    f_angle_d 1.105
    f_bond_d 0.007
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 3054
    Nucleic Acid Atoms 0
    Heterogen Atoms 13
    Solvent Atoms 295
     
     
  •   Software and Computing Hide
    Computing
    Data Collection CBASS
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-3000
    Structure Solution PHENIX
    Structure Refinement PHENIX (phenix.refine: 1.6.4_486)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.6.4_486)
    model building PHENIX
    data collection CBASS