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X-RAY DIFFRACTION
Materials and Methods page
4DDQ
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 9
    Temperature 295.0
    Details 0.1M Tris/HCl pH 9.0, 25% P400, 0.2M NaCl, VAPOR DIFFUSION, SITTING DROP, temperature 295K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 152.8 α = 90
    b = 165.11 β = 90
    c = 180.58 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector PIXEL
    Type DECTRIS PILATUS 6M
    Collection Date 2011-08-31
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type SLS BEAMLINE X10SA
    Wavelength 1.0000
    Wavelength List 1
    Site SLS
    Beamline X10SA
     
     
  •   Refinement Data Hide
    Reflection Details
    Resolution(High) 3.3
    Resolution(Low) 49.02
    Number Reflections(Observed) 69239
    Percent Possible(Observed) 99.8
    R Merge I(Observed) 0.1721
    Redundancy 7.3
     
    High Resolution Shell Details
    Resolution(High) 3.3
    Resolution(Low) 3.4
    Percent Possible(All) 100.0
    R Merge I(Observed) 0.8579
    Mean I Over Sigma(Observed) 1.06
    R-Sym I(Observed) 0.8579
    Redundancy 7.8
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 3.3
    Resolution(Low) 49.02
    Cut-off Sigma(F) 1.33
    Number of Reflections(Observed) 68987
    Number of Reflections(R-Free) 3489
    Percent Reflections(Observed) 99.56
    R-Factor(Observed) 0.177
    R-Work 0.174
    R-Free 0.2349
    R-Free Selection Details random
     
    Temperature Factor Modeling
    Anisotropic B[1][1] 3.8982
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] -16.1532
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 12.255
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3
    Shell Resolution(Low) 3.3452
    Number of Reflections(R-Free) 131
    Number of Reflections(R-Work) 2586
    R-Factor(R-Work) 0.3518
    R-Factor(R-Free) 0.4033
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3452
    Shell Resolution(Low) 3.393
    Number of Reflections(R-Free) 129
    Number of Reflections(R-Work) 2604
    R-Factor(R-Work) 0.3457
    R-Factor(R-Free) 0.3735
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.393
    Shell Resolution(Low) 3.4436
    Number of Reflections(R-Free) 166
    Number of Reflections(R-Work) 2528
    R-Factor(R-Work) 0.3486
    R-Factor(R-Free) 0.441
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4436
    Shell Resolution(Low) 3.4974
    Number of Reflections(R-Free) 126
    Number of Reflections(R-Work) 2546
    R-Factor(R-Work) 0.3402
    R-Factor(R-Free) 0.3856
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4974
    Shell Resolution(Low) 3.5547
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2614
    R-Factor(R-Work) 0.3037
    R-Factor(R-Free) 0.3801
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5547
    Shell Resolution(Low) 3.616
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2580
    R-Factor(R-Work) 0.3069
    R-Factor(R-Free) 0.3433
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.616
    Shell Resolution(Low) 3.6818
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2567
    R-Factor(R-Work) 0.2977
    R-Factor(R-Free) 0.3455
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.6818
    Shell Resolution(Low) 3.7525
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2602
    R-Factor(R-Work) 0.2681
    R-Factor(R-Free) 0.3519
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7525
    Shell Resolution(Low) 3.8291
    Number of Reflections(R-Free) 126
    Number of Reflections(R-Work) 2621
    R-Factor(R-Work) 0.2641
    R-Factor(R-Free) 0.3389
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.8291
    Shell Resolution(Low) 3.9123
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2557
    R-Factor(R-Work) 0.2562
    R-Factor(R-Free) 0.3444
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.9123
    Shell Resolution(Low) 4.0033
    Number of Reflections(R-Free) 155
    Number of Reflections(R-Work) 2602
    R-Factor(R-Work) 0.2332
    R-Factor(R-Free) 0.2956
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.0033
    Shell Resolution(Low) 4.1034
    Number of Reflections(R-Free) 122
    Number of Reflections(R-Work) 2609
    R-Factor(R-Work) 0.2146
    R-Factor(R-Free) 0.2868
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.1034
    Shell Resolution(Low) 4.2143
    Number of Reflections(R-Free) 131
    Number of Reflections(R-Work) 2620
    R-Factor(R-Work) 0.1969
    R-Factor(R-Free) 0.2827
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.2143
    Shell Resolution(Low) 4.3382
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2605
    R-Factor(R-Work) 0.1813
    R-Factor(R-Free) 0.2487
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.3382
    Shell Resolution(Low) 4.4781
    Number of Reflections(R-Free) 161
    Number of Reflections(R-Work) 2600
    R-Factor(R-Work) 0.1769
    R-Factor(R-Free) 0.2554
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.4781
    Shell Resolution(Low) 4.6381
    Number of Reflections(R-Free) 157
    Number of Reflections(R-Work) 2591
    R-Factor(R-Work) 0.1581
    R-Factor(R-Free) 0.2197
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.6381
    Shell Resolution(Low) 4.8236
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2617
    R-Factor(R-Work) 0.1435
    R-Factor(R-Free) 0.2086
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.8236
    Shell Resolution(Low) 5.0429
    Number of Reflections(R-Free) 131
    Number of Reflections(R-Work) 2625
    R-Factor(R-Work) 0.1405
    R-Factor(R-Free) 0.2487
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.0429
    Shell Resolution(Low) 5.3085
    Number of Reflections(R-Free) 159
    Number of Reflections(R-Work) 2630
    R-Factor(R-Work) 0.1444
    R-Factor(R-Free) 0.2121
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.3085
    Shell Resolution(Low) 5.6407
    Number of Reflections(R-Free) 131
    Number of Reflections(R-Work) 2658
    R-Factor(R-Work) 0.1485
    R-Factor(R-Free) 0.239
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.6407
    Shell Resolution(Low) 6.0754
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 2642
    R-Factor(R-Work) 0.1535
    R-Factor(R-Free) 0.2158
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 6.0754
    Shell Resolution(Low) 6.6855
    Number of Reflections(R-Free) 124
    Number of Reflections(R-Work) 2671
    R-Factor(R-Work) 0.1608
    R-Factor(R-Free) 0.25
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 6.6855
    Shell Resolution(Low) 7.6497
    Number of Reflections(R-Free) 125
    Number of Reflections(R-Work) 2706
    R-Factor(R-Work) 0.1657
    R-Factor(R-Free) 0.2422
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 7.6497
    Shell Resolution(Low) 9.6259
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 2717
    R-Factor(R-Work) 0.1194
    R-Factor(R-Free) 0.1788
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 9.6259
    Shell Resolution(Low) 49.027
    Number of Reflections(R-Free) 154
    Number of Reflections(R-Work) 2800
    R-Factor(R-Work) 0.1392
    R-Factor(R-Free) 0.1479
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.005
    f_chiral_restr 0.083
    f_dihedral_angle_d 17.804
    f_angle_d 1.296
    f_bond_d 0.011
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 21647
    Nucleic Acid Atoms 0
    Heterogen Atoms 14
    Solvent Atoms 3
     
     
  •   Software and Computing Hide
    Computing
    Data Collection beamline software
    Data Reduction (intensity integration) XDS (VERSION December 6, 2010)
    Data Reduction (data scaling) SCALA
    Structure Solution PHASER
    Structure Refinement PHENIX (phenix.refine: dev_934)
     
    Software
    refinement PHENIX version: (phenix.refine: dev_934)
    model building PHASER
    data collection beamline version: software