X-RAY DIFFRACTION Experimental Data & Validation


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Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop
pH 6.6
Temperature 298.0
Details 0.1 M Bis-Tris Propane, 2.6 M ammonium sulfate, pH 6.6, VAPOR DIFFUSION, SITTING DROP, temperature 298K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 104.2 α = 90
b = 104.2 β = 90
c = 123.29 γ = 120
Symmetry
Space Group P 32 2 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD ADSC QUANTUM 315r -- 2008-11-11
Diffraction Radiation
Monochromator Protocol
-- SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ALS BEAMLINE 8.2.2 1.0332 ALS 8.2.2

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.82 50 -- -- -- -- -- -- 18227 -- -- --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 2.82 42.373 -- 0.0 -- 18227 943 95.36 -- 0.1896 0.1866 0.2466 --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.82 2.9687 -- 135 2305 0.2017 0.2667 -- 92.0
X Ray Diffraction 2.9687 3.1547 -- 139 2423 0.1768 0.2805 -- 95.0
X Ray Diffraction 3.1547 3.3981 -- 134 2371 0.1782 0.2256 -- 93.0
X Ray Diffraction 3.3981 3.7399 -- 130 2390 0.2019 0.2795 -- 93.0
X Ray Diffraction 3.7399 4.2807 -- 131 2473 0.1955 0.2565 -- 96.0
X Ray Diffraction 4.2807 5.3914 -- 138 2607 0.1686 0.2161 -- 100.0
X Ray Diffraction 5.3914 42.373 -- 136 2715 0.19 0.2328 -- 99.0
Temperature Factor Modeling
Temperature Factor Value
Anisotropic B[1][1] 3.1416
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] 0.0
Anisotropic B[2][2] 3.1416
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] -6.2832
RMS Deviations
Key Refinement Restraint Deviation
f_plane_restr 0.004
f_chiral_restr 0.067
f_dihedral_angle_d 18.803
f_angle_d 1.178
f_bond_d 0.008
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 3804
Nucleic Acid Atoms 0
Heterogen Atoms 96
Solvent Atoms 39

Software

Computing
Computing Package Purpose
HKL-2000 Data Reduction (intensity integration)
HKL-2000 Data Reduction (data scaling)
CCP4 Structure Solution
PHENIX (phenix.refine: 1.7_650) Structure Refinement
Software
Software Name Purpose
PHENIX version: (phenix.refine: 1.7_650) refinement
CCP4 model building