X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop
pH 8.3
Temperature 298.0
Details 0.1 M Tris-Cl, 2.2 M ammonium sulfate, pH 8.3, VAPOR DIFFUSION, SITTING DROP, temperature 298K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 103.53 α = 90
b = 103.53 β = 90
c = 123.23 γ = 120
Symmetry
Space Group P 32 2 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD ADSC QUANTUM 315r -- 2008-11-11
Diffraction Radiation
Monochromator Protocol
-- SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ALS BEAMLINE 8.2.2 1.0332 ALS 8.2.2

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.81 50 -- -- -- -- -- -- 18465 -- -- --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 2.813 42.128 -- 0.0 -- 18465 956 97.07 -- 0.1912 0.1883 0.246 --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.813 2.9612 -- 138 2347 0.2245 0.3054 -- 93.0
X Ray Diffraction 2.9612 3.1467 -- 122 2419 0.1993 0.31 -- 94.0
X Ray Diffraction 3.1467 3.3896 -- 145 2407 0.1861 0.2304 -- 96.0
X Ray Diffraction 3.3896 3.7305 -- 142 2496 0.1688 0.2519 -- 98.0
X Ray Diffraction 3.7305 4.2698 -- 127 2539 0.1746 0.2298 -- 99.0
X Ray Diffraction 4.2698 5.3778 -- 144 2585 0.1698 0.212 -- 100.0
X Ray Diffraction 5.3778 42.128 -- 138 2716 0.2145 0.2634 -- 100.0
Temperature Factor Modeling
Temperature Factor Value
Anisotropic B[1][1] 4.8432
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] 0.0
Anisotropic B[2][2] 4.8432
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] -9.6864
RMS Deviations
Key Refinement Restraint Deviation
f_plane_restr 0.004
f_chiral_restr 0.065
f_dihedral_angle_d 20.079
f_angle_d 1.162
f_bond_d 0.008
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 3812
Nucleic Acid Atoms 0
Heterogen Atoms 96
Solvent Atoms 37

Software

Computing
Computing Package Purpose
HKL-2000 Data Reduction (intensity integration)
HKL-2000 Data Reduction (data scaling)
CCP4 Structure Solution
PHENIX (phenix.refine: 1.7_650) Structure Refinement
Software
Software Name Purpose
PHENIX version: (phenix.refine: 1.7_650) refinement
CCP4 model building