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X-RAY DIFFRACTION
Materials and Methods page
4DBZ
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 9
    Temperature 298.0
    Details 0.1 M Tris-Cl, 1.8 M Na malonate, pH 9.0, VAPOR DIFFUSION, SITTING DROP, temperature 298K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 102.93 α = 90
    b = 102.93 β = 90
    c = 121.84 γ = 120
     
    Space Group
    Space Group Name:    P 32 2 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315
    Collection Date 2009-02-25
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type ALS BEAMLINE 8.2.2
    Wavelength List 0.99980
    Site ALS
    Beamline 8.2.2
     
     
  •   Refinement Data Hide
    Reflection Details
    Resolution(High) 2.64
    Resolution(Low) 50
    Number Reflections(Observed) 21581
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.643
    Resolution(Low) 47.4185
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 22389
    Number of Reflections(Observed) 21581
    Number of Reflections(R-Free) 1097
    Percent Reflections(Observed) 96.52
    R-Factor(Observed) 0.1807
    R-Work 0.1788
    R-Free 0.218
     
    Temperature Factor Modeling
    Anisotropic B[1][1] 5.6734
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 5.6734
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -11.3468
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.643
    Shell Resolution(Low) 2.7631
    Number of Reflections(R-Free) 118
    Number of Reflections(R-Work) 2353
    R-Factor(R-Work) 0.1981
    R-Factor(R-Free) 0.261
    Percent Reflections(Observed) 90.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7631
    Shell Resolution(Low) 2.9088
    Number of Reflections(R-Free) 127
    Number of Reflections(R-Work) 2430
    R-Factor(R-Work) 0.1938
    R-Factor(R-Free) 0.2759
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9088
    Shell Resolution(Low) 3.091
    Number of Reflections(R-Free) 131
    Number of Reflections(R-Work) 2479
    R-Factor(R-Work) 0.2004
    R-Factor(R-Free) 0.2256
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.091
    Shell Resolution(Low) 3.3296
    Number of Reflections(R-Free) 125
    Number of Reflections(R-Work) 2559
    R-Factor(R-Work) 0.1877
    R-Factor(R-Free) 0.2478
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3296
    Shell Resolution(Low) 3.6646
    Number of Reflections(R-Free) 158
    Number of Reflections(R-Work) 2560
    R-Factor(R-Work) 0.176
    R-Factor(R-Free) 0.214
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.6646
    Shell Resolution(Low) 4.1945
    Number of Reflections(R-Free) 167
    Number of Reflections(R-Work) 2632
    R-Factor(R-Work) 0.168
    R-Factor(R-Free) 0.2314
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.1945
    Shell Resolution(Low) 5.2836
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 2668
    R-Factor(R-Work) 0.1645
    R-Factor(R-Free) 0.1783
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.2836
    Shell Resolution(Low) 47.4185
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 2803
    R-Factor(R-Work) 0.184
    R-Factor(R-Free) 0.2108
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.004
    f_chiral_restr 0.067
    f_dihedral_angle_d 19.072
    f_angle_d 1.132
    f_bond_d 0.008
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 3799
    Nucleic Acid Atoms 0
    Heterogen Atoms 96
    Solvent Atoms 44
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution CCP4
    Structure Refinement PHENIX (phenix.refine: 1.7_650)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7_650)
    model building CCP4