X-RAY DIFFRACTION Experimental Data & Validation


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Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop
pH 9
Temperature 298.0
Details 0.1 M Tris-Cl, 1.8 M Na malonate, pH 9.0, VAPOR DIFFUSION, SITTING DROP, temperature 298K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 102.93 α = 90
b = 102.93 β = 90
c = 121.84 γ = 120
Symmetry
Space Group P 32 2 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD ADSC QUANTUM 315 -- 2009-02-25
Diffraction Radiation
Monochromator Protocol
-- SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ALS BEAMLINE 8.2.2 0.99980 ALS 8.2.2

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.64 50 -- -- -- -- -- -- 21581 -- -- --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 2.643 47.4185 -- 0.0 22389 21581 1097 96.52 -- 0.1807 0.1788 0.218 --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.643 2.7631 -- 118 2353 0.1981 0.261 -- 90.0
X Ray Diffraction 2.7631 2.9088 -- 127 2430 0.1938 0.2759 -- 93.0
X Ray Diffraction 2.9088 3.091 -- 131 2479 0.2004 0.2256 -- 95.0
X Ray Diffraction 3.091 3.3296 -- 125 2559 0.1877 0.2478 -- 96.0
X Ray Diffraction 3.3296 3.6646 -- 158 2560 0.176 0.214 -- 98.0
X Ray Diffraction 3.6646 4.1945 -- 167 2632 0.168 0.2314 -- 100.0
X Ray Diffraction 4.1945 5.2836 -- 137 2668 0.1645 0.1783 -- 100.0
X Ray Diffraction 5.2836 47.4185 -- 134 2803 0.184 0.2108 -- 100.0
Temperature Factor Modeling
Temperature Factor Value
Anisotropic B[1][1] 5.6734
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] 0.0
Anisotropic B[2][2] 5.6734
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] -11.3468
RMS Deviations
Key Refinement Restraint Deviation
f_plane_restr 0.004
f_chiral_restr 0.067
f_dihedral_angle_d 19.072
f_angle_d 1.132
f_bond_d 0.008
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 3799
Nucleic Acid Atoms 0
Heterogen Atoms 96
Solvent Atoms 44

Software

Computing
Computing Package Purpose
HKL-2000 Data Reduction (intensity integration)
HKL-2000 Data Reduction (data scaling)
CCP4 Structure Solution
PHENIX (phenix.refine: 1.7_650) Structure Refinement
Software
Software Name Purpose
PHENIX version: (phenix.refine: 1.7_650) refinement
CCP4 model building