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X-RAY DIFFRACTION
Materials and Methods page
4DBR
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 8
    Temperature 277.0
    Details 50 mM TrisHCl pH 8, 5.5% PEG8K, 50 mM KSCN, 5% glycerol, 20 mM DTT, VAPOR DIFFUSION, HANGING DROP, temperature 277K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 91.94 α = 90
    b = 93.53 β = 90
    c = 102.43 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Detector
    Detector AREA DETECTOR
    Type ADSC QUANTUM 315r
    Collection Date 2010-12-09
     
    Diffraction Radiation
    Monochromator Si III
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type SOLEIL BEAMLINE PROXIMA 1
    Wavelength List 0.98011
    Site SOLEIL
    Beamline PROXIMA 1
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) -3.0
    Observed Criterion Sigma(I) -3.0
    Resolution(High) 1.9
    Resolution(Low) 29.36
    Number Reflections(All) 69738
    Number Reflections(Observed) 69466
    Percent Possible(Observed) 99.6
     
    High Resolution Shell Details
    Resolution(High) 1.9
    Resolution(Low) 1.95
    Percent Possible(All) 98.1
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.95
    Resolution(Low) 29.361
    Cut-off Sigma(F) 1.99
    Number of Reflections(all) 69738
    Number of Reflections(Observed) 64845
    Number of Reflections(R-Free) 3242
    Percent Reflections(Observed) 99.77
    R-Factor(Observed) 0.1757
    R-Work 0.1736
    R-Free 0.2159
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.95
    Shell Resolution(Low) 2.0197
    Number of Reflections(R-Free) 321
    Number of Reflections(R-Work) 6093
    R-Factor(R-Work) 0.2337
    R-Factor(R-Free) 0.2985
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0197
    Shell Resolution(Low) 2.1005
    Number of Reflections(R-Free) 320
    Number of Reflections(R-Work) 6071
    R-Factor(R-Work) 0.207
    R-Factor(R-Free) 0.2712
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1005
    Shell Resolution(Low) 2.1961
    Number of Reflections(R-Free) 320
    Number of Reflections(R-Work) 6099
    R-Factor(R-Work) 0.1979
    R-Factor(R-Free) 0.2565
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1961
    Shell Resolution(Low) 2.3118
    Number of Reflections(R-Free) 320
    Number of Reflections(R-Work) 6094
    R-Factor(R-Work) 0.1812
    R-Factor(R-Free) 0.2423
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3118
    Shell Resolution(Low) 2.4566
    Number of Reflections(R-Free) 321
    Number of Reflections(R-Work) 6108
    R-Factor(R-Work) 0.1832
    R-Factor(R-Free) 0.2503
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4566
    Shell Resolution(Low) 2.6462
    Number of Reflections(R-Free) 322
    Number of Reflections(R-Work) 6120
    R-Factor(R-Work) 0.1779
    R-Factor(R-Free) 0.2351
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6462
    Shell Resolution(Low) 2.9122
    Number of Reflections(R-Free) 323
    Number of Reflections(R-Work) 6127
    R-Factor(R-Work) 0.1798
    R-Factor(R-Free) 0.2495
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9122
    Shell Resolution(Low) 3.3332
    Number of Reflections(R-Free) 326
    Number of Reflections(R-Work) 6193
    R-Factor(R-Work) 0.1764
    R-Factor(R-Free) 0.2313
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3332
    Shell Resolution(Low) 4.1975
    Number of Reflections(R-Free) 328
    Number of Reflections(R-Work) 6238
    R-Factor(R-Work) 0.1537
    R-Factor(R-Free) 0.1881
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.1975
    Shell Resolution(Low) 29.361
    Number of Reflections(R-Free) 341
    Number of Reflections(R-Work) 6460
    R-Factor(R-Work) 0.1643
    R-Factor(R-Free) 0.1776
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.005
    f_chiral_restr 0.082
    f_dihedral_angle_d 13.419
    f_angle_d 1.257
    f_bond_d 0.009
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 6005
    Nucleic Acid Atoms 0
    Heterogen Atoms 65
    Solvent Atoms 727
     
     
  •   Software and Computing Hide
    Computing
    Data Collection DNA
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) XSCALE
    Structure Solution Molrep
    Structure Refinement PHENIX (phenix.refine: 1.7.2_869)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7.2_869)
    model building Molrep
    data collection DNA