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X-RAY DIFFRACTION
Materials and Methods page
4DBP
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 7
    Temperature 277.0
    Details 4.5% P8K, 50 mM MOPS pH7,3% I-prop, 3% tert-but,1mM TCEP, pH 7.0, VAPOR DIFFUSION, HANGING DROP, temperature 277K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 68.6 α = 90
    b = 104.39 β = 91.15
    c = 90.02 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector AREA DETECTOR
    Type ADSC QUANTUM 315r
    Collection Date 2008-06-15
     
    Diffraction Radiation
    Monochromator Si(111)
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type ESRF BEAMLINE ID23-1
    Wavelength List 0.97625
    Site ESRF
    Beamline ID23-1
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) -3.0
    Observed Criterion Sigma(I) -3.0
    Resolution(High) 2.2
    Resolution(Low) 19.9
    Number Reflections(All) 64374
    Number Reflections(Observed) 63904
    Percent Possible(Observed) 99.3
     
    High Resolution Shell Details
    Resolution(High) 2.2
    Resolution(Low) 2.25
    Percent Possible(All) 98.8
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.2
    Resolution(Low) 19.885
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 64374
    Number of Reflections(Observed) 63899
    Number of Reflections(R-Free) 3196
    Percent Reflections(Observed) 99.41
    R-Factor(Observed) 0.1653
    R-Work 0.1626
    R-Free 0.218
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2
    Shell Resolution(Low) 2.2785
    Number of Reflections(R-Free) 316
    Number of Reflections(R-Work) 5989
    R-Factor(R-Work) 0.2078
    R-Factor(R-Free) 0.2749
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2785
    Shell Resolution(Low) 2.3696
    Number of Reflections(R-Free) 318
    Number of Reflections(R-Work) 6050
    R-Factor(R-Work) 0.2019
    R-Factor(R-Free) 0.267
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3696
    Shell Resolution(Low) 2.4772
    Number of Reflections(R-Free) 316
    Number of Reflections(R-Work) 6010
    R-Factor(R-Work) 0.1931
    R-Factor(R-Free) 0.2562
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4772
    Shell Resolution(Low) 2.6076
    Number of Reflections(R-Free) 319
    Number of Reflections(R-Work) 6057
    R-Factor(R-Work) 0.1836
    R-Factor(R-Free) 0.2526
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6076
    Shell Resolution(Low) 2.7705
    Number of Reflections(R-Free) 319
    Number of Reflections(R-Work) 6063
    R-Factor(R-Work) 0.1708
    R-Factor(R-Free) 0.2481
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7705
    Shell Resolution(Low) 2.9838
    Number of Reflections(R-Free) 320
    Number of Reflections(R-Work) 6084
    R-Factor(R-Work) 0.1613
    R-Factor(R-Free) 0.2343
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9838
    Shell Resolution(Low) 3.2828
    Number of Reflections(R-Free) 320
    Number of Reflections(R-Work) 6071
    R-Factor(R-Work) 0.1629
    R-Factor(R-Free) 0.2267
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2828
    Shell Resolution(Low) 3.7551
    Number of Reflections(R-Free) 321
    Number of Reflections(R-Work) 6094
    R-Factor(R-Work) 0.1628
    R-Factor(R-Free) 0.2056
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7551
    Shell Resolution(Low) 4.7206
    Number of Reflections(R-Free) 321
    Number of Reflections(R-Work) 6108
    R-Factor(R-Work) 0.1307
    R-Factor(R-Free) 0.1725
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.7206
    Shell Resolution(Low) 19.885
    Number of Reflections(R-Free) 326
    Number of Reflections(R-Work) 6177
    R-Factor(R-Work) 0.1584
    R-Factor(R-Free) 0.2068
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.004
    f_chiral_restr 0.071
    f_dihedral_angle_d 13.596
    f_angle_d 0.999
    f_bond_d 0.007
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 7403
    Nucleic Acid Atoms 0
    Heterogen Atoms 90
    Solvent Atoms 781
     
     
  •   Software and Computing Hide
    Computing
    Data Collection DNA
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) XDS
    Structure Solution Molrep
    Structure Refinement PHENIX (phenix.refine: 1.7.2_869)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7.2_869)
    model building Molrep
    data collection DNA