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X-RAY DIFFRACTION
Materials and Methods page
4DBE
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 6.5
    Temperature 293.0
    Details 25% PEG ME 550, 0.1M MES, 0.01M Zinc sulfate, pH 6.5, VAPOR DIFFUSION, HANGING DROP, temperature 293.0K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 72.41 α = 90
    b = 41.54 β = 94.08
    c = 73.12 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315r
    Collection Date 2010-06-11
     
    Diffraction Radiation
    Monochromator MIRRORS
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type NSLS BEAMLINE X29A
    Wavelength List 1.075
    Site NSLS
    Beamline X29A
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 1.79
    Resolution(Low) 32.75
    Number Reflections(All) 41028
    Number Reflections(Observed) 41028
    Percent Possible(Observed) 99.15
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.789
    Resolution(Low) 32.751
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 41028
    Number of Reflections(Observed) 41028
    Number of Reflections(R-Free) 2062
    Percent Reflections(Observed) 99.15
    R-Factor(All) 0.1973
    R-Factor(Observed) 0.1973
    R-Work 0.1953
    R-Free 0.2359
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Anisotropic B[1][1] 9.31
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] -3.8325
    Anisotropic B[2][2] -2.7631
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -6.5469
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7893
    Shell Resolution(Low) 1.831
    Number of Reflections(R-Free) 112
    Number of Reflections(R-Work) 2281
    R-Factor(R-Work) 0.3642
    R-Factor(R-Free) 0.375
    Percent Reflections(Observed) 88.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.831
    Shell Resolution(Low) 1.8767
    Number of Reflections(R-Free) 168
    Number of Reflections(R-Work) 2576
    R-Factor(R-Work) 0.3021
    R-Factor(R-Free) 0.3043
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8767
    Shell Resolution(Low) 1.9275
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 2569
    R-Factor(R-Work) 0.279
    R-Factor(R-Free) 0.331
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9275
    Shell Resolution(Low) 1.9842
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2614
    R-Factor(R-Work) 0.2446
    R-Factor(R-Free) 0.2852
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9842
    Shell Resolution(Low) 2.0482
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 2603
    R-Factor(R-Work) 0.226
    R-Factor(R-Free) 0.2672
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0482
    Shell Resolution(Low) 2.1214
    Number of Reflections(R-Free) 154
    Number of Reflections(R-Work) 2572
    R-Factor(R-Work) 0.2215
    R-Factor(R-Free) 0.2646
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1214
    Shell Resolution(Low) 2.2063
    Number of Reflections(R-Free) 130
    Number of Reflections(R-Work) 2626
    R-Factor(R-Work) 0.2069
    R-Factor(R-Free) 0.2504
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2063
    Shell Resolution(Low) 2.3067
    Number of Reflections(R-Free) 128
    Number of Reflections(R-Work) 2613
    R-Factor(R-Work) 0.1961
    R-Factor(R-Free) 0.243
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3067
    Shell Resolution(Low) 2.4283
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 2601
    R-Factor(R-Work) 0.1904
    R-Factor(R-Free) 0.2626
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4283
    Shell Resolution(Low) 2.5804
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2629
    R-Factor(R-Work) 0.2014
    R-Factor(R-Free) 0.2691
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5804
    Shell Resolution(Low) 2.7795
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2630
    R-Factor(R-Work) 0.2011
    R-Factor(R-Free) 0.2242
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7795
    Shell Resolution(Low) 3.0591
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2606
    R-Factor(R-Work) 0.1989
    R-Factor(R-Free) 0.3025
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0591
    Shell Resolution(Low) 3.5013
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 2643
    R-Factor(R-Work) 0.1962
    R-Factor(R-Free) 0.2443
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5013
    Shell Resolution(Low) 4.4095
    Number of Reflections(R-Free) 126
    Number of Reflections(R-Work) 2669
    R-Factor(R-Work) 0.1574
    R-Factor(R-Free) 0.1984
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.4095
    Shell Resolution(Low) 32.7564
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2734
    R-Factor(R-Work) 0.1677
    R-Factor(R-Free) 0.1663
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.004
    f_chiral_restr 0.07
    f_dihedral_angle_d 13.494
    f_angle_d 1.022
    f_bond_d 0.007
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 3319
    Nucleic Acid Atoms 0
    Heterogen Atoms 67
    Solvent Atoms 129
     
     
  •   Software and Computing Hide
    Computing
    Data Collection CBASS
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution phenix
    Structure Refinement PHENIX (phenix.refine: 1.7.1_743)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7.1_743)
    model building phenix
    data collection CBASS