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X-RAY DIFFRACTION
Materials and Methods page
4DBD
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 5.6
    Temperature 293.0
    Details 1.0M lithium sulfate, 0.1M sodium citrate, 0.5M ammonium sulfate, pH 5.6, VAPOR DIFFUSION, HANGING DROP, temperature 293.0K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 40.37 α = 90
    b = 64.82 β = 90
    c = 73.24 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 2
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315r
    Collection Date 2010-11-05
     
    Diffraction Radiation
    Monochromator MIRRORS
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type NSLS BEAMLINE X29A
    Wavelength List 1.075
    Site NSLS
    Beamline X29A
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 1.7
    Resolution(Low) 36.62
    Number Reflections(All) 21586
    Number Reflections(Observed) 21586
    Percent Possible(Observed) 98.82
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.699
    Resolution(Low) 36.618
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 21586
    Number of Reflections(Observed) 21586
    Number of Reflections(R-Free) 1107
    Percent Reflections(Observed) 98.82
    R-Factor(All) 0.2097
    R-Factor(Observed) 0.2097
    R-Work 0.2078
    R-Free 0.245
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Anisotropic B[1][1] -4.7229
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 10.7679
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -6.045
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6993
    Shell Resolution(Low) 1.7767
    Number of Reflections(R-Free) 122
    Number of Reflections(R-Work) 2320
    R-Factor(R-Work) 0.3067
    R-Factor(R-Free) 0.3604
    Percent Reflections(Observed) 91.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7767
    Shell Resolution(Low) 1.8703
    Number of Reflections(R-Free) 128
    Number of Reflections(R-Work) 2528
    R-Factor(R-Work) 0.2612
    R-Factor(R-Free) 0.3045
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8703
    Shell Resolution(Low) 1.9875
    Number of Reflections(R-Free) 157
    Number of Reflections(R-Work) 2539
    R-Factor(R-Work) 0.2147
    R-Factor(R-Free) 0.2773
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9875
    Shell Resolution(Low) 2.141
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 2573
    R-Factor(R-Work) 0.2141
    R-Factor(R-Free) 0.2459
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.141
    Shell Resolution(Low) 2.3564
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2561
    R-Factor(R-Work) 0.2114
    R-Factor(R-Free) 0.2784
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3564
    Shell Resolution(Low) 2.6973
    Number of Reflections(R-Free) 154
    Number of Reflections(R-Work) 2587
    R-Factor(R-Work) 0.2129
    R-Factor(R-Free) 0.3078
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6973
    Shell Resolution(Low) 3.3979
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 2614
    R-Factor(R-Work) 0.2122
    R-Factor(R-Free) 0.2116
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3979
    Shell Resolution(Low) 36.627
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2757
    R-Factor(R-Work) 0.1832
    R-Factor(R-Free) 0.2007
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.004
    f_chiral_restr 0.071
    f_dihedral_angle_d 13.397
    f_angle_d 0.992
    f_bond_d 0.006
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 1636
    Nucleic Acid Atoms 0
    Heterogen Atoms 15
    Solvent Atoms 82
     
     
  •   Software and Computing Hide
    Computing
    Data Collection CBASS
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution phenix
    Structure Refinement PHENIX (phenix.refine: 1.7.1_743)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7.1_743)
    model building phenix
    data collection CBASS