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X-RAY DIFFRACTION
Materials and Methods page
4D91
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 7.5
    Temperature 291.0
    Details 1.9 M cesium chloride, 50% DMSO, 50 mM Tris, pH 7.5, VAPOR DIFFUSION, SITTING DROP, temperature 291K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 93.43 α = 90
    b = 93.43 β = 90
    c = 129.92 γ = 120
     
    Space Group
    Space Group Name:    P 61 2 2
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type RAYONIX MX-225
    Details Collimating Mirror
    Collection Date 2010-06-25
     
    Diffraction Radiation
    Monochromator Double Crystal Si(111)
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type BESSY BEAMLINE 14.2
    Wavelength List 1.9
    Site BESSY
    Beamline 14.2
     
     
  •   Refinement Data Hide
    Reflection Details
    Resolution(High) 1.9
    Resolution(Low) 50
    Number Reflections(All) 49334
    Number Reflections(Observed) 49334
    Percent Possible(Observed) 98.3
    Redundancy 30.6
     
    High Resolution Shell Details
    Resolution(High) 1.9
    Resolution(Low) 1.93
    Percent Possible(All) 95.9
    Mean I Over Sigma(Observed) 11.3
    R-Sym I(Observed) 0.333
    Redundancy 27.5
    Number Unique Reflections(All) 1247
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method SAD
    reflnsShellList 1.9
    Resolution(Low) 34.34
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 51241
    Number of Reflections(Observed) 48848
    Number of Reflections(R-Free) 1292
    Percent Reflections(Observed) 97.74
    R-Factor(All) 0.1515
    R-Factor(Observed) 0.1515
    R-Work 0.1498
    R-Free 0.1844
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Anisotropic B[1][1] -1.2031
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] -1.2031
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 2.4063
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9
    Shell Resolution(Low) 1.9389
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 2585
    R-Factor(R-Work) 0.2543
    R-Factor(R-Free) 0.2659
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9389
    Shell Resolution(Low) 1.981
    Number of Reflections(R-Free) 128
    Number of Reflections(R-Work) 2653
    R-Factor(R-Work) 0.2139
    R-Factor(R-Free) 0.2766
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.981
    Shell Resolution(Low) 2.0271
    Number of Reflections(R-Free) 125
    Number of Reflections(R-Work) 2693
    R-Factor(R-Work) 0.1773
    R-Factor(R-Free) 0.2408
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0271
    Shell Resolution(Low) 2.0778
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 2662
    R-Factor(R-Work) 0.1561
    R-Factor(R-Free) 0.2406
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0778
    Shell Resolution(Low) 2.134
    Number of Reflections(R-Free) 116
    Number of Reflections(R-Work) 2707
    R-Factor(R-Work) 0.141
    R-Factor(R-Free) 0.1784
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.134
    Shell Resolution(Low) 2.1967
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 2694
    R-Factor(R-Work) 0.1389
    R-Factor(R-Free) 0.2184
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1967
    Shell Resolution(Low) 2.2676
    Number of Reflections(R-Free) 164
    Number of Reflections(R-Work) 2720
    R-Factor(R-Work) 0.1375
    R-Factor(R-Free) 0.2046
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2676
    Shell Resolution(Low) 2.3487
    Number of Reflections(R-Free) 160
    Number of Reflections(R-Work) 2716
    R-Factor(R-Work) 0.1264
    R-Factor(R-Free) 0.1944
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3487
    Shell Resolution(Low) 2.4427
    Number of Reflections(R-Free) 123
    Number of Reflections(R-Work) 2781
    R-Factor(R-Work) 0.1316
    R-Factor(R-Free) 0.1675
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4427
    Shell Resolution(Low) 2.5538
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2743
    R-Factor(R-Work) 0.138
    R-Factor(R-Free) 0.2081
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5538
    Shell Resolution(Low) 2.6884
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2779
    R-Factor(R-Work) 0.1441
    R-Factor(R-Free) 0.2165
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6884
    Shell Resolution(Low) 2.8568
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 2776
    R-Factor(R-Work) 0.1471
    R-Factor(R-Free) 0.176
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8568
    Shell Resolution(Low) 3.0772
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 2782
    R-Factor(R-Work) 0.1515
    R-Factor(R-Free) 0.184
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0772
    Shell Resolution(Low) 3.3866
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2791
    R-Factor(R-Work) 0.1556
    R-Factor(R-Free) 0.1653
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3866
    Shell Resolution(Low) 3.8761
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 2793
    R-Factor(R-Work) 0.1425
    R-Factor(R-Free) 0.1386
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.8761
    Shell Resolution(Low) 4.8813
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2795
    R-Factor(R-Work) 0.1277
    R-Factor(R-Free) 0.1674
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.8813
    Shell Resolution(Low) 34.3455
    Number of Reflections(R-Free) 166
    Number of Reflections(R-Work) 2785
    R-Factor(R-Work) 0.1754
    R-Factor(R-Free) 0.1692
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.004
    f_chiral_restr 0.072
    f_dihedral_angle_d 12.526
    f_angle_d 0.979
    f_bond_d 0.017
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2423
    Nucleic Acid Atoms 0
    Heterogen Atoms 17
    Solvent Atoms 368
     
     
  •   Software and Computing Hide
    Computing
    Data Collection MAR345dtb
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution SHELXC, SHELXD, SHELXE
    Structure Refinement PHENIX (phenix.refine: 1.7_650)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7_650)
    data collection MAR345dtb