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X-RAY DIFFRACTION
Materials and Methods page
4D8S
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 7
    Temperature 300.0
    Details 50% MPD, pH 7, VAPOR DIFFUSION, HANGING DROP, temperature 300K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 89.39 α = 90
    b = 89.39 β = 90
    c = 94.75 γ = 90
     
    Space Group
    Space Group Name:    I 4
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type RIGAKU SATURN 944
    Collection Date 2011-01-24
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source ROTATING ANODE
    Type RIGAKU
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 2.0
    Resolution(High) 2.4
    Resolution(Low) 45
    Number Reflections(All) 14629
    Number Reflections(Observed) 14629
    Percent Possible(Observed) 100.0
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.398
    Resolution(Low) 32.511
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 14629
    Number of Reflections(Observed) 14629
    Number of Reflections(R-Free) 1501
    Percent Reflections(Observed) 99.9
    R-Factor(Observed) 0.192
    R-Work 0.184
    R-Free 0.2358
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Anisotropic B[1][1] -9.4821
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] -9.4821
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 18.9643
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3997
    Shell Resolution(Low) 2.477
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 1183
    R-Factor(R-Work) 0.2987
    R-Factor(R-Free) 0.3238
    Percent Reflections(Observed) 89.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.477
    Shell Resolution(Low) 2.5653
    Number of Reflections(R-Free) 129
    Number of Reflections(R-Work) 1182
    R-Factor(R-Work) 0.297
    R-Factor(R-Free) 0.3766
    Percent Reflections(Observed) 90.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5653
    Shell Resolution(Low) 2.6678
    Number of Reflections(R-Free) 129
    Number of Reflections(R-Work) 1184
    R-Factor(R-Work) 0.2667
    R-Factor(R-Free) 0.3232
    Percent Reflections(Observed) 90.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6678
    Shell Resolution(Low) 2.7889
    Number of Reflections(R-Free) 128
    Number of Reflections(R-Work) 1195
    R-Factor(R-Work) 0.245
    R-Factor(R-Free) 0.2656
    Percent Reflections(Observed) 90.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7889
    Shell Resolution(Low) 2.9355
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 1200
    R-Factor(R-Work) 0.2257
    R-Factor(R-Free) 0.2948
    Percent Reflections(Observed) 90.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9355
    Shell Resolution(Low) 3.1187
    Number of Reflections(R-Free) 129
    Number of Reflections(R-Work) 1180
    R-Factor(R-Work) 0.2195
    R-Factor(R-Free) 0.2736
    Percent Reflections(Observed) 90.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1187
    Shell Resolution(Low) 3.3584
    Number of Reflections(R-Free) 129
    Number of Reflections(R-Work) 1190
    R-Factor(R-Work) 0.1901
    R-Factor(R-Free) 0.2861
    Percent Reflections(Observed) 90.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3584
    Shell Resolution(Low) 3.6942
    Number of Reflections(R-Free) 150
    Number of Reflections(R-Work) 1186
    R-Factor(R-Work) 0.1652
    R-Factor(R-Free) 0.2035
    Percent Reflections(Observed) 89.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.6942
    Shell Resolution(Low) 4.2241
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 1188
    R-Factor(R-Work) 0.1421
    R-Factor(R-Free) 0.2089
    Percent Reflections(Observed) 89.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.2241
    Shell Resolution(Low) 5.3041
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 1198
    R-Factor(R-Work) 0.1302
    R-Factor(R-Free) 0.1877
    Percent Reflections(Observed) 89.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.3041
    Shell Resolution(Low) 19.5023
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 1208
    R-Factor(R-Work) 0.1784
    R-Factor(R-Free) 0.2278
    Percent Reflections(Observed) 89.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.009
    f_chiral_restr 0.068
    f_dihedral_angle_d 14.234
    f_angle_d 1.187
    f_bond_d 0.01
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 3010
    Nucleic Acid Atoms 0
    Heterogen Atoms 21
    Solvent Atoms 89
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHASER
    Structure Refinement PHENIX (phenix.refine: 1.7_650)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7_650)
    model building PHASER
    data collection HKL-2000