X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 7
Temperature 300.0
Details 50% MPD, pH 7, VAPOR DIFFUSION, HANGING DROP, temperature 300K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 89.39 α = 90
b = 89.39 β = 90
c = 94.75 γ = 90
Symmetry
Space Group I 4

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD RIGAKU SATURN 944 -- 2011-01-24
Diffraction Radiation
Monochromator Protocol
-- SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
ROTATING ANODE RIGAKU -- -- --

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.4 45 100.0 -- -- -- -- 14629 14629 0.0 2.0 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 2.398 32.511 -- 0.0 14629 14629 1501 99.9 -- 0.192 0.184 0.2358 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.3997 2.477 -- 141 1183 0.2987 0.3238 -- 89.0
X Ray Diffraction 2.477 2.5653 -- 129 1182 0.297 0.3766 -- 90.0
X Ray Diffraction 2.5653 2.6678 -- 129 1184 0.2667 0.3232 -- 90.0
X Ray Diffraction 2.6678 2.7889 -- 128 1195 0.245 0.2656 -- 90.0
X Ray Diffraction 2.7889 2.9355 -- 134 1200 0.2257 0.2948 -- 90.0
X Ray Diffraction 2.9355 3.1187 -- 129 1180 0.2195 0.2736 -- 90.0
X Ray Diffraction 3.1187 3.3584 -- 129 1190 0.1901 0.2861 -- 90.0
X Ray Diffraction 3.3584 3.6942 -- 150 1186 0.1652 0.2035 -- 89.0
X Ray Diffraction 3.6942 4.2241 -- 142 1188 0.1421 0.2089 -- 89.0
X Ray Diffraction 4.2241 5.3041 -- 146 1198 0.1302 0.1877 -- 89.0
X Ray Diffraction 5.3041 19.5023 -- 144 1208 0.1784 0.2278 -- 89.0
Temperature Factor Modeling
Temperature Factor Value
Anisotropic B[1][1] -9.4821
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] 0.0
Anisotropic B[2][2] -9.4821
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] 18.9643
RMS Deviations
Key Refinement Restraint Deviation
f_plane_restr 0.009
f_chiral_restr 0.068
f_dihedral_angle_d 14.234
f_angle_d 1.187
f_bond_d 0.01
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 3010
Nucleic Acid Atoms 0
Heterogen Atoms 21
Solvent Atoms 89

Software

Computing
Computing Package Purpose
HKL-2000 Data Collection
HKL-2000 Data Reduction (intensity integration)
HKL-2000 Data Reduction (data scaling)
PHASER Structure Solution
PHENIX (phenix.refine: 1.7_650) Structure Refinement
Software
Software Name Purpose
PHENIX version: (phenix.refine: 1.7_650) refinement
PHASER model building
HKL-2000 data collection