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X-RAY DIFFRACTION
Materials and Methods page
4CEI
  •   Crystallization Hide
    Crystallization Experiments
    pH 7.5
    Details 0.1M HEPES PH 7.5, 17.5 % PEG 1500, 0.25M NACL, 0.1M SODIUM FORMATE, 0.1M MGCL2, VAPOR DIFFUSION, HANGING DROP, 285K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 75.94 α = 90
    b = 151.34 β = 95.95
    c = 124.56 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector PIXEL (PILATUS 6M)
    Type DECTRIS
    Collection Date 2012-03-24
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type DIAMOND BEAMLINE I04
    Wavelength 0.97950
    Site DIAMOND
    Beamline I04
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 2.0
    Resolution(High) 2.8
    Resolution(Low) 47.93
    Number Reflections(Observed) 68664
    Percent Possible(Observed) 99.9
    R Merge I(Observed) 0.06
    Redundancy 6.4
     
    High Resolution Shell Details
    Resolution(High) 2.8
    Resolution(Low) 2.86
    Percent Possible(All) 99.9
    R Merge I(Observed) 0.36
    Mean I Over Sigma(Observed) 3.8
    Redundancy 6.5
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.8
    Resolution(Low) 29.949
    Cut-off Sigma(F) 1.35
    Number of Reflections(Observed) 68623
    Number of Reflections(R-Free) 3455
    Percent Reflections(Observed) 99.74
    R-Factor(Observed) 0.1976
    R-Work 0.1953
    R-Free 0.2398
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8
    Shell Resolution(Low) 2.8383
    Number of Reflections(R-Free) 130
    Number of Reflections(R-Work) 2589
    R-Factor(R-Work) 0.2786
    R-Factor(R-Free) 0.3388
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8383
    Shell Resolution(Low) 2.8789
    Number of Reflections(R-Free) 126
    Number of Reflections(R-Work) 2618
    R-Factor(R-Work) 0.2751
    R-Factor(R-Free) 0.3451
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8789
    Shell Resolution(Low) 2.9218
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2591
    R-Factor(R-Work) 0.2654
    R-Factor(R-Free) 0.3319
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9218
    Shell Resolution(Low) 2.9674
    Number of Reflections(R-Free) 127
    Number of Reflections(R-Work) 2594
    R-Factor(R-Work) 0.2851
    R-Factor(R-Free) 0.3646
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9674
    Shell Resolution(Low) 3.016
    Number of Reflections(R-Free) 160
    Number of Reflections(R-Work) 2584
    R-Factor(R-Work) 0.2758
    R-Factor(R-Free) 0.3886
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.016
    Shell Resolution(Low) 3.068
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 2595
    R-Factor(R-Work) 0.261
    R-Factor(R-Free) 0.3006
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.068
    Shell Resolution(Low) 3.1237
    Number of Reflections(R-Free) 125
    Number of Reflections(R-Work) 2587
    R-Factor(R-Work) 0.2593
    R-Factor(R-Free) 0.3134
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1237
    Shell Resolution(Low) 3.1837
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 2582
    R-Factor(R-Work) 0.2513
    R-Factor(R-Free) 0.3276
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1837
    Shell Resolution(Low) 3.2486
    Number of Reflections(R-Free) 128
    Number of Reflections(R-Work) 2597
    R-Factor(R-Work) 0.2447
    R-Factor(R-Free) 0.3032
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2486
    Shell Resolution(Low) 3.3192
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 2643
    R-Factor(R-Work) 0.2359
    R-Factor(R-Free) 0.3041
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3192
    Shell Resolution(Low) 3.3963
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 2558
    R-Factor(R-Work) 0.2311
    R-Factor(R-Free) 0.3011
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3963
    Shell Resolution(Low) 3.4811
    Number of Reflections(R-Free) 159
    Number of Reflections(R-Work) 2593
    R-Factor(R-Work) 0.2122
    R-Factor(R-Free) 0.279
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4811
    Shell Resolution(Low) 3.5751
    Number of Reflections(R-Free) 124
    Number of Reflections(R-Work) 2617
    R-Factor(R-Work) 0.2023
    R-Factor(R-Free) 0.2379
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5751
    Shell Resolution(Low) 3.6801
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 2602
    R-Factor(R-Work) 0.2029
    R-Factor(R-Free) 0.2511
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.6801
    Shell Resolution(Low) 3.7986
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 2622
    R-Factor(R-Work) 0.186
    R-Factor(R-Free) 0.2495
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7986
    Shell Resolution(Low) 3.9341
    Number of Reflections(R-Free) 152
    Number of Reflections(R-Work) 2581
    R-Factor(R-Work) 0.1867
    R-Factor(R-Free) 0.2253
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.9341
    Shell Resolution(Low) 4.0913
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2599
    R-Factor(R-Work) 0.1743
    R-Factor(R-Free) 0.2268
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.0913
    Shell Resolution(Low) 4.277
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 2632
    R-Factor(R-Work) 0.1738
    R-Factor(R-Free) 0.2293
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.277
    Shell Resolution(Low) 4.5018
    Number of Reflections(R-Free) 123
    Number of Reflections(R-Work) 2623
    R-Factor(R-Work) 0.1561
    R-Factor(R-Free) 0.1953
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.5018
    Shell Resolution(Low) 4.7827
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 2645
    R-Factor(R-Work) 0.1588
    R-Factor(R-Free) 0.1814
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.7827
    Shell Resolution(Low) 5.1503
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2603
    R-Factor(R-Work) 0.156
    R-Factor(R-Free) 0.1963
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.1503
    Shell Resolution(Low) 5.6655
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 2612
    R-Factor(R-Work) 0.1662
    R-Factor(R-Free) 0.1961
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.6655
    Shell Resolution(Low) 6.478
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 2608
    R-Factor(R-Work) 0.1872
    R-Factor(R-Free) 0.1991
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 6.478
    Shell Resolution(Low) 8.1345
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 2637
    R-Factor(R-Work) 0.174
    R-Factor(R-Free) 0.1895
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 8.1345
    Shell Resolution(Low) 29.9508
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2656
    R-Factor(R-Work) 0.1613
    R-Factor(R-Free) 0.1754
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.003
    f_chiral_restr 0.031
    f_dihedral_angle_d 17.273
    f_angle_d 0.749
    f_bond_d 0.004
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 18846
    Nucleic Acid Atoms 757
    Heterogen Atoms 72
    Solvent Atoms 8
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) SCALA
    Structure Solution PHENIX PHASER-MR
    Structure Refinement PHENIX (PHENIX.REFINE)
     
    Software
    refinement PHENIX version: (PHENIX.REFINE)
    model building PHENIX version: PHASER-MR