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X-RAY DIFFRACTION
Materials and Methods page
4CEH
  •   Crystallization Hide
    Crystallization Experiments
    pH 7.5
    Details 0.1M TRIS-HCL PH 7.5, 15% PEG 4000, 0.8M SODIUM FORMATE, VAPOR DIFFUSION, HANGING DROP, 285K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 77.37 α = 104.38
    b = 96.77 β = 96.11
    c = 109.69 γ = 90.03
     
    Space Group
    Space Group Name:    P 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector PIXEL (PILATUS 6M)
    Type DECTRIS
    Collection Date 2012-10-08
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type DIAMOND BEAMLINE I02
    Wavelength 0.97949
    Site DIAMOND
    Beamline I02
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 2.0
    Resolution(High) 3.24
    Resolution(Low) 39.52
    Number Reflections(Observed) 47940
    Percent Possible(Observed) 98.5
    R Merge I(Observed) 0.05
    Redundancy 2.9
     
    High Resolution Shell Details
    Resolution(High) 3.24
    Resolution(Low) 3.35
    Percent Possible(All) 97.7
    R Merge I(Observed) 0.33
    Mean I Over Sigma(Observed) 2.3
    Redundancy 2.9
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 3.24
    Resolution(Low) 29.939
    Cut-off Sigma(F) 1.97
    Number of Reflections(Observed) 47592
    Number of Reflections(R-Free) 2374
    Percent Reflections(Observed) 97.89
    R-Factor(Observed) 0.231
    R-Work 0.2292
    R-Free 0.2638
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.24
    Shell Resolution(Low) 3.3061
    Number of Reflections(R-Free) 130
    Number of Reflections(R-Work) 2426
    R-Factor(R-Work) 0.292
    R-Factor(R-Free) 0.375
    Percent Reflections(Observed) 90.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3061
    Shell Resolution(Low) 3.3779
    Number of Reflections(R-Free) 130
    Number of Reflections(R-Work) 2596
    R-Factor(R-Work) 0.2925
    R-Factor(R-Free) 0.3404
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3779
    Shell Resolution(Low) 3.4564
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 2673
    R-Factor(R-Work) 0.2787
    R-Factor(R-Free) 0.3291
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4564
    Shell Resolution(Low) 3.5427
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2673
    R-Factor(R-Work) 0.2683
    R-Factor(R-Free) 0.3528
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5427
    Shell Resolution(Low) 3.6383
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2680
    R-Factor(R-Work) 0.2609
    R-Factor(R-Free) 0.2848
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.6383
    Shell Resolution(Low) 3.7452
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 2652
    R-Factor(R-Work) 0.2588
    R-Factor(R-Free) 0.2959
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7452
    Shell Resolution(Low) 3.8658
    Number of Reflections(R-Free) 155
    Number of Reflections(R-Work) 2697
    R-Factor(R-Work) 0.2548
    R-Factor(R-Free) 0.3187
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.8658
    Shell Resolution(Low) 4.0037
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2631
    R-Factor(R-Work) 0.2596
    R-Factor(R-Free) 0.2913
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.0037
    Shell Resolution(Low) 4.1636
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 2669
    R-Factor(R-Work) 0.2523
    R-Factor(R-Free) 0.3064
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.1636
    Shell Resolution(Low) 4.3525
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 2681
    R-Factor(R-Work) 0.2401
    R-Factor(R-Free) 0.2691
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.3525
    Shell Resolution(Low) 4.5812
    Number of Reflections(R-Free) 125
    Number of Reflections(R-Work) 2722
    R-Factor(R-Work) 0.2277
    R-Factor(R-Free) 0.2974
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.5812
    Shell Resolution(Low) 4.8671
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2688
    R-Factor(R-Work) 0.2243
    R-Factor(R-Free) 0.2572
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.8671
    Shell Resolution(Low) 5.2411
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2668
    R-Factor(R-Work) 0.2168
    R-Factor(R-Free) 0.2268
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.2411
    Shell Resolution(Low) 5.7651
    Number of Reflections(R-Free) 158
    Number of Reflections(R-Work) 2694
    R-Factor(R-Work) 0.2348
    R-Factor(R-Free) 0.2756
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.7651
    Shell Resolution(Low) 6.5916
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 2684
    R-Factor(R-Work) 0.2382
    R-Factor(R-Free) 0.2569
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 6.5916
    Shell Resolution(Low) 8.2755
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 2708
    R-Factor(R-Work) 0.2079
    R-Factor(R-Free) 0.2515
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 8.2755
    Shell Resolution(Low) 29.9403
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 2676
    R-Factor(R-Work) 0.1819
    R-Factor(R-Free) 0.1947
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.003
    f_chiral_restr 0.024
    f_dihedral_angle_d 15.744
    f_angle_d 0.616
    f_bond_d 0.003
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 18669
    Nucleic Acid Atoms 756
    Heterogen Atoms 8
    Solvent Atoms 0
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) SCALA
    Structure Solution PHENIX PHASER-MR
    Structure Refinement PHENIX (PHENIX.REFINE)
     
    Software
    refinement PHENIX version: (PHENIX.REFINE)
    model building PHENIX version: PHASER-MR