X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
pH 6.5
Details pH 6.5

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 56.72 α = 90
b = 166.33 β = 90
c = 154.59 γ = 90
Symmetry
Space Group P 21 21 21

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 77
Diffraction Detector
Detector Diffraction Type Details Collection Date
PIXEL DECTRIS PILATUS 6M -- 2011-11-18
Diffraction Radiation
Monochromator Protocol
-- SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SLS BEAMLINE X06SA -- SLS X06SA

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.6 49.22 99.3 0.05 -- -- 4.28 -- 45637 -- -3.0 61.96
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.6 2.69 99.2 0.77 -- 2.77 4.3 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 2.6 49.222 -- 2.0 -- 45630 1851 99.31 -- 0.1657 0.1632 0.2255 --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.6 2.6703 -- 139 3307 0.2728 0.3749 -- 99.0
X Ray Diffraction 2.6703 2.7489 -- 141 3308 0.2556 0.3256 -- 100.0
X Ray Diffraction 2.7489 2.8376 -- 143 3378 0.2181 0.277 -- 100.0
X Ray Diffraction 2.8376 2.939 -- 138 3293 0.1978 0.2593 -- 100.0
X Ray Diffraction 2.939 3.0567 -- 141 3317 0.1898 0.2876 -- 99.0
X Ray Diffraction 3.0567 3.1958 -- 143 3379 0.183 0.2332 -- 100.0
X Ray Diffraction 3.1958 3.3642 -- 140 3327 0.1783 0.2835 -- 99.0
X Ray Diffraction 3.3642 3.575 -- 141 3345 0.1611 0.2641 -- 99.0
X Ray Diffraction 3.575 3.8509 -- 143 3353 0.1509 0.2097 -- 99.0
X Ray Diffraction 3.8509 4.2382 -- 141 3358 0.1385 0.1867 -- 99.0
X Ray Diffraction 4.2382 4.851 -- 145 3421 0.1252 0.1678 -- 100.0
X Ray Diffraction 4.851 6.11 -- 146 3431 0.1573 0.2083 -- 99.0
X Ray Diffraction 6.11 49.2308 -- 150 3562 0.1615 0.2191 -- 98.0
Temperature Factor Modeling
Temperature Factor Value
Mean Isotropic B 87.5
RMS Deviations
Key Refinement Restraint Deviation
f_plane_restr 0.006
f_chiral_restr 0.077
f_bond_d 0.01
f_angle_d 1.427
f_dihedral_angle_d 14.277
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 8681
Nucleic Acid Atoms 1028
Heterogen Atoms 164
Solvent Atoms 501

Software

Software
Software Name Purpose
PHENIX refinement version: (PHENIX.REFINE)
XDS data reduction
XSCALE data scaling
PHASER phasing