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X-RAY DIFFRACTION
Materials and Methods page
4C7O
  •   Crystallization Hide
    Crystallization Experiments
    pH 6.5
    Details pH 6.5
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 56.72 α = 90
    b = 166.33 β = 90
    c = 154.59 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 77
     
    Diffraction Detector
    Detector PIXEL (PILATUS 6M)
    Type DECTRIS
    Collection Date 2011-11-18
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type SLS BEAMLINE X06SA
    Wavelength 1.0
    Site SLS
    Beamline X06SA
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) -3.0
    Resolution(High) 2.6
    Resolution(Low) 49.22
    Number Reflections(Observed) 45637
    Percent Possible(Observed) 99.3
    R Merge I(Observed) 0.05
    B(Isotropic) From Wilson Plot 61.96
    Redundancy 4.28
     
    High Resolution Shell Details
    Resolution(High) 2.6
    Resolution(Low) 2.69
    Percent Possible(All) 99.2
    R Merge I(Observed) 0.77
    Mean I Over Sigma(Observed) 2.77
    Redundancy 4.3
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.6
    Resolution(Low) 49.222
    Cut-off Sigma(F) 2.0
    Number of Reflections(Observed) 45630
    Number of Reflections(R-Free) 1851
    Percent Reflections(Observed) 99.31
    R-Factor(Observed) 0.1657
    R-Work 0.1632
    R-Free 0.2255
     
    Temperature Factor Modeling
    Mean Isotropic B Value 87.5
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6
    Shell Resolution(Low) 2.6703
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 3307
    R-Factor(R-Work) 0.2728
    R-Factor(R-Free) 0.3749
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6703
    Shell Resolution(Low) 2.7489
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 3308
    R-Factor(R-Work) 0.2556
    R-Factor(R-Free) 0.3256
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7489
    Shell Resolution(Low) 2.8376
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 3378
    R-Factor(R-Work) 0.2181
    R-Factor(R-Free) 0.277
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8376
    Shell Resolution(Low) 2.939
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 3293
    R-Factor(R-Work) 0.1978
    R-Factor(R-Free) 0.2593
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.939
    Shell Resolution(Low) 3.0567
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 3317
    R-Factor(R-Work) 0.1898
    R-Factor(R-Free) 0.2876
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0567
    Shell Resolution(Low) 3.1958
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 3379
    R-Factor(R-Work) 0.183
    R-Factor(R-Free) 0.2332
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1958
    Shell Resolution(Low) 3.3642
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 3327
    R-Factor(R-Work) 0.1783
    R-Factor(R-Free) 0.2835
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3642
    Shell Resolution(Low) 3.575
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 3345
    R-Factor(R-Work) 0.1611
    R-Factor(R-Free) 0.2641
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.575
    Shell Resolution(Low) 3.8509
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 3353
    R-Factor(R-Work) 0.1509
    R-Factor(R-Free) 0.2097
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.8509
    Shell Resolution(Low) 4.2382
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 3358
    R-Factor(R-Work) 0.1385
    R-Factor(R-Free) 0.1867
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.2382
    Shell Resolution(Low) 4.851
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 3421
    R-Factor(R-Work) 0.1252
    R-Factor(R-Free) 0.1678
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.851
    Shell Resolution(Low) 6.11
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 3431
    R-Factor(R-Work) 0.1573
    R-Factor(R-Free) 0.2083
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 6.11
    Shell Resolution(Low) 49.2308
    Number of Reflections(R-Free) 150
    Number of Reflections(R-Work) 3562
    R-Factor(R-Work) 0.1615
    R-Factor(R-Free) 0.2191
    Percent Reflections(Observed) 98.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.006
    f_chiral_restr 0.077
    f_dihedral_angle_d 14.277
    f_angle_d 1.427
    f_bond_d 0.01
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 8681
    Nucleic Acid Atoms 1028
    Heterogen Atoms 164
    Solvent Atoms 501
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) XSCALE
    Structure Solution PHASER
    Structure Refinement PHENIX (PHENIX.REFINE)
     
    Software
    refinement PHENIX version: (PHENIX.REFINE)
    model building PHASER