X-RAY DIFFRACTION Experimental Data & Validation


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Crystallization

Crystalization Experiments
pH 6.5
Details pH 6.5

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 56.72 α = 90
b = 166.33 β = 90
c = 154.59 γ = 90
Symmetry
Space Group P 21 21 21

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 77
Diffraction Detector
Detector Diffraction Type Details Collection Date
PIXEL (PILATUS 6M) DECTRIS -- 2011-11-18
Diffraction Radiation
Monochromator Protocol
-- SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SLS BEAMLINE X06SA -- SLS X06SA

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.6 49.22 99.3 0.05 -- -- 4.28 -- 45637 -- -3.0 61.96
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.6 2.69 99.2 0.77 -- 2.77 4.3 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 2.6 49.222 -- 2.0 -- 45630 1851 99.31 -- 0.1657 0.1632 0.2255 --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.6 2.6703 -- 139 3307 0.2728 0.3749 -- 99.0
X Ray Diffraction 2.6703 2.7489 -- 141 3308 0.2556 0.3256 -- 100.0
X Ray Diffraction 2.7489 2.8376 -- 143 3378 0.2181 0.277 -- 100.0
X Ray Diffraction 2.8376 2.939 -- 138 3293 0.1978 0.2593 -- 100.0
X Ray Diffraction 2.939 3.0567 -- 141 3317 0.1898 0.2876 -- 99.0
X Ray Diffraction 3.0567 3.1958 -- 143 3379 0.183 0.2332 -- 100.0
X Ray Diffraction 3.1958 3.3642 -- 140 3327 0.1783 0.2835 -- 99.0
X Ray Diffraction 3.3642 3.575 -- 141 3345 0.1611 0.2641 -- 99.0
X Ray Diffraction 3.575 3.8509 -- 143 3353 0.1509 0.2097 -- 99.0
X Ray Diffraction 3.8509 4.2382 -- 141 3358 0.1385 0.1867 -- 99.0
X Ray Diffraction 4.2382 4.851 -- 145 3421 0.1252 0.1678 -- 100.0
X Ray Diffraction 4.851 6.11 -- 146 3431 0.1573 0.2083 -- 99.0
X Ray Diffraction 6.11 49.2308 -- 150 3562 0.1615 0.2191 -- 98.0
Temperature Factor Modeling
Temperature Factor Value
Mean Isotropic B 87.5
RMS Deviations
Key Refinement Restraint Deviation
f_plane_restr 0.006
f_chiral_restr 0.077
f_dihedral_angle_d 14.277
f_angle_d 1.427
f_bond_d 0.01
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 8681
Nucleic Acid Atoms 1028
Heterogen Atoms 164
Solvent Atoms 501

Software

Computing
Computing Package Purpose
XDS Data Reduction (intensity integration)
XSCALE Data Reduction (data scaling)
PHASER Structure Solution
PHENIX (PHENIX.REFINE) Structure Refinement
Software
Software Name Purpose
PHENIX version: (PHENIX.REFINE) refinement
PHASER model building