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X-RAY DIFFRACTION
Materials and Methods page
4C4W
  •   Crystallization Hide
    Crystallization Experiments
    pH 8
    Details 100 MM TRISHCL 8.5 AND 2.0 M MONO-AMMONIUM DIHYDROGEN PHOSPHATE
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 135.89 α = 90
    b = 155.54 β = 90
    c = 146.87 γ = 90
     
    Space Group
    Space Group Name:    C 2 2 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC
    Collection Date 2012-07-10
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type ESRF BEAMLINE ID23-1
    Wavelength 0.9763
    Site ESRF
    Beamline ID23-1
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 2.0
    Resolution(High) 2.95
    Resolution(Low) 30.46
    Number Reflections(Observed) 31598
    Percent Possible(Observed) 95.5
    R Merge I(Observed) 0.11
    B(Isotropic) From Wilson Plot 77.85
    Redundancy 6.8
     
    High Resolution Shell Details
    Resolution(High) 2.95
    Resolution(Low) 3.06
    Percent Possible(All) 93.7
    R Merge I(Observed) 0.75
    Mean I Over Sigma(Observed) 2.0
    Redundancy 5.3
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.95
    Resolution(Low) 30.456
    Cut-off Sigma(F) 1.34
    Number of Reflections(Observed) 31541
    Number of Reflections(R-Free) 1598
    Percent Reflections(Observed) 95.44
    R-Factor(Observed) 0.1692
    R-Work 0.167
    R-Free 0.2107
     
    Temperature Factor Modeling
    Mean Isotropic B Value 73.6
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.95
    Shell Resolution(Low) 3.0451
    Number of Reflections(R-Free) 150
    Number of Reflections(R-Work) 2606
    R-Factor(R-Work) 0.2993
    R-Factor(R-Free) 0.3351
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0451
    Shell Resolution(Low) 3.1539
    Number of Reflections(R-Free) 150
    Number of Reflections(R-Work) 2621
    R-Factor(R-Work) 0.2469
    R-Factor(R-Free) 0.3156
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1539
    Shell Resolution(Low) 3.28
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 2621
    R-Factor(R-Work) 0.2315
    R-Factor(R-Free) 0.3071
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.28
    Shell Resolution(Low) 3.4291
    Number of Reflections(R-Free) 161
    Number of Reflections(R-Work) 2617
    R-Factor(R-Work) 0.2145
    R-Factor(R-Free) 0.2129
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4291
    Shell Resolution(Low) 3.6096
    Number of Reflections(R-Free) 126
    Number of Reflections(R-Work) 2611
    R-Factor(R-Work) 0.1935
    R-Factor(R-Free) 0.2712
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.6096
    Shell Resolution(Low) 3.8354
    Number of Reflections(R-Free) 131
    Number of Reflections(R-Work) 2635
    R-Factor(R-Work) 0.1703
    R-Factor(R-Free) 0.2195
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.8354
    Shell Resolution(Low) 4.1308
    Number of Reflections(R-Free) 151
    Number of Reflections(R-Work) 2678
    R-Factor(R-Work) 0.1468
    R-Factor(R-Free) 0.2026
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.1308
    Shell Resolution(Low) 4.5453
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 2857
    R-Factor(R-Work) 0.1367
    R-Factor(R-Free) 0.1969
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.5453
    Shell Resolution(Low) 5.2002
    Number of Reflections(R-Free) 151
    Number of Reflections(R-Work) 2870
    R-Factor(R-Work) 0.1332
    R-Factor(R-Free) 0.169
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.2002
    Shell Resolution(Low) 6.541
    Number of Reflections(R-Free) 154
    Number of Reflections(R-Work) 2881
    R-Factor(R-Work) 0.1582
    R-Factor(R-Free) 0.1896
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 6.541
    Shell Resolution(Low) 30.4573
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 2946
    R-Factor(R-Work) 0.1571
    R-Factor(R-Free) 0.185
    Percent Reflections(Observed) 98.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.005
    f_chiral_restr 0.077
    f_dihedral_angle_d 15.29
    f_angle_d 1.174
    f_bond_d 0.008
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 4878
    Nucleic Acid Atoms 1486
    Heterogen Atoms 10
    Solvent Atoms 0
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) AIMLESS
    Structure Solution PHASER
    Structure Refinement PHENIX (PHENIX.REFINE)
     
    Software
    refinement PHENIX version: (PHENIX.REFINE)
    model building PHASER