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X-RAY DIFFRACTION
Materials and Methods page
4C2T
  •   Crystallization Hide
    Crystallization Experiments
    Details 16-22% PEG 3350, 0.1 M BIS-TRIS PROPANE PH 6.5-7.5, 0.1-0.3 M NA-NITRATE
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 71.46 α = 90
    b = 390.04 β = 106.13
    c = 71.56 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD (QUANTUM 315R)
    Type ADSC
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type ESRF BEAMLINE ID23-1
    Wavelength 0.9395
    Site ESRF
    Beamline ID23-1
     
     
  •   Refinement Data Hide
    Reflection Details
    Resolution(High) 4
    Resolution(Low) 46.1
    Number Reflections(Observed) 30051
    Percent Possible(Observed) 99.6
    R Merge I(Observed) 0.11
    B(Isotropic) From Wilson Plot 149.79
    Redundancy 4.4
     
    High Resolution Shell Details
    Resolution(High) 4.0
    Resolution(Low) 4.22
    Percent Possible(All) 99.5
    R Merge I(Observed) 0.66
    Mean I Over Sigma(Observed) 2.3
    Redundancy 4.2
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 3.997
    Resolution(Low) 46.147
    Cut-off Sigma(F) 0.0
    Number of Reflections(Observed) 30051
    Number of Reflections(R-Free) 1516
    Percent Reflections(Observed) 94.51
    R-Factor(Observed) 0.2477
    R-Work 0.2464
    R-Free 0.2713
     
    Temperature Factor Modeling
    Mean Isotropic B Value 207.7
    Anisotropic B[1][1] 12.0222
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 23.0968
    Anisotropic B[2][2] -32.4405
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 20.4183
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.9971
    Shell Resolution(Low) 4.126
    Number of Reflections(R-Free) 129
    Number of Reflections(R-Work) 2183
    R-Factor(R-Work) 0.406
    R-Factor(R-Free) 0.4142
    Percent Reflections(Observed) 80.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.126
    Shell Resolution(Low) 4.2734
    Number of Reflections(R-Free) 120
    Number of Reflections(R-Work) 2368
    R-Factor(R-Work) 0.3621
    R-Factor(R-Free) 0.4309
    Percent Reflections(Observed) 86.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.2734
    Shell Resolution(Low) 4.4444
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 2513
    R-Factor(R-Work) 0.3106
    R-Factor(R-Free) 0.3598
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.4444
    Shell Resolution(Low) 4.6465
    Number of Reflections(R-Free) 123
    Number of Reflections(R-Work) 2554
    R-Factor(R-Work) 0.2828
    R-Factor(R-Free) 0.322
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.6465
    Shell Resolution(Low) 4.8912
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2657
    R-Factor(R-Work) 0.2703
    R-Factor(R-Free) 0.2956
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.8912
    Shell Resolution(Low) 5.1972
    Number of Reflections(R-Free) 155
    Number of Reflections(R-Work) 2685
    R-Factor(R-Work) 0.2507
    R-Factor(R-Free) 0.2524
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.1972
    Shell Resolution(Low) 5.5979
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2658
    R-Factor(R-Work) 0.27
    R-Factor(R-Free) 0.3132
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.5979
    Shell Resolution(Low) 6.1601
    Number of Reflections(R-Free) 155
    Number of Reflections(R-Work) 2697
    R-Factor(R-Work) 0.2898
    R-Factor(R-Free) 0.3575
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 6.1601
    Shell Resolution(Low) 7.0487
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2750
    R-Factor(R-Work) 0.2633
    R-Factor(R-Free) 0.3054
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 7.0487
    Shell Resolution(Low) 8.8703
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 2750
    R-Factor(R-Work) 0.2032
    R-Factor(R-Free) 0.1971
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 8.8703
    Shell Resolution(Low) 46.1505
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 2720
    R-Factor(R-Work) 0.1817
    R-Factor(R-Free) 0.1924
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.005
    f_chiral_restr 0.079
    f_dihedral_angle_d 18.905
    f_angle_d 1.075
    f_bond_d 0.006
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 20337
    Nucleic Acid Atoms 2080
    Heterogen Atoms 128
    Solvent Atoms 0
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (data scaling) SCALA
    Structure Solution PHASER
    Structure Refinement PHENIX (PHENIX.REFINE)
     
    Software
    refinement PHENIX version: (PHENIX.REFINE)
    model building PHASER