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X-RAY DIFFRACTION
Materials and Methods page
4BPP
  •   Crystallization Hide
    Crystallization Experiments
    Details 0.1 M MOPS-KOH PH 7.7, 0.1 M AMMONIUM SULPHATE, 7.5% PEG 8K, 1MM PUTRESCINE
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 209.99 α = 90
    b = 471.55 β = 91.02
    c = 298.54 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector PILATUS 6M
    Type DECTRIS
    Collection Date 2011-07-01
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type SLS BEAMLINE X06SA
    Wavelength 1
    Site SLS
    Beamline X06SA
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) -3.0
    Resolution(High) 3.7
    Resolution(Low) 50
    Number Reflections(Observed) 607573
    Percent Possible(Observed) 99.0
    R Merge I(Observed) 0.15
    B(Isotropic) From Wilson Plot 97.62
    Redundancy 3.1
     
    High Resolution Shell Details
    Resolution(High) 3.7
    Resolution(Low) 3.93
    Percent Possible(All) 97.0
    R Merge I(Observed) 0.77
    Mean I Over Sigma(Observed) 1.66
    Redundancy 2.94
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 3.703
    Resolution(Low) 49.749
    Cut-off Sigma(F) 0.0
    Number of Reflections(Observed) 557638
    Number of Reflections(R-Free) 5349
    Percent Reflections(Observed) 90.98
    R-Factor(Observed) 0.2021
    R-Work 0.2019
    R-Free 0.2294
     
    Temperature Factor Modeling
    Mean Isotropic B Value 138.56
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.703
    Shell Resolution(Low) 3.7451
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 14502
    R-Factor(R-Work) 0.3431
    R-Factor(R-Free) 0.3407
    Percent Reflections(Observed) 72.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7451
    Shell Resolution(Low) 3.7891
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 15854
    R-Factor(R-Work) 0.3213
    R-Factor(R-Free) 0.3203
    Percent Reflections(Observed) 78.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7891
    Shell Resolution(Low) 3.8353
    Number of Reflections(R-Free) 171
    Number of Reflections(R-Work) 16197
    R-Factor(R-Work) 0.3075
    R-Factor(R-Free) 0.3438
    Percent Reflections(Observed) 80.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.8353
    Shell Resolution(Low) 3.8838
    Number of Reflections(R-Free) 150
    Number of Reflections(R-Work) 16358
    R-Factor(R-Work) 0.3012
    R-Factor(R-Free) 0.3425
    Percent Reflections(Observed) 81.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.8838
    Shell Resolution(Low) 3.9349
    Number of Reflections(R-Free) 172
    Number of Reflections(R-Work) 16399
    R-Factor(R-Work) 0.2921
    R-Factor(R-Free) 0.3154
    Percent Reflections(Observed) 81.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.9349
    Shell Resolution(Low) 3.9888
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 16830
    R-Factor(R-Work) 0.2816
    R-Factor(R-Free) 0.3364
    Percent Reflections(Observed) 83.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.9888
    Shell Resolution(Low) 4.0458
    Number of Reflections(R-Free) 160
    Number of Reflections(R-Work) 17167
    R-Factor(R-Work) 0.2715
    R-Factor(R-Free) 0.2938
    Percent Reflections(Observed) 85.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.0458
    Shell Resolution(Low) 4.1061
    Number of Reflections(R-Free) 169
    Number of Reflections(R-Work) 17551
    R-Factor(R-Work) 0.2603
    R-Factor(R-Free) 0.2767
    Percent Reflections(Observed) 87.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.1061
    Shell Resolution(Low) 4.1703
    Number of Reflections(R-Free) 171
    Number of Reflections(R-Work) 17523
    R-Factor(R-Work) 0.2537
    R-Factor(R-Free) 0.2507
    Percent Reflections(Observed) 87.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.1703
    Shell Resolution(Low) 4.2386
    Number of Reflections(R-Free) 172
    Number of Reflections(R-Work) 17870
    R-Factor(R-Work) 0.2478
    R-Factor(R-Free) 0.264
    Percent Reflections(Observed) 89.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.2386
    Shell Resolution(Low) 4.3117
    Number of Reflections(R-Free) 174
    Number of Reflections(R-Work) 18134
    R-Factor(R-Work) 0.2415
    R-Factor(R-Free) 0.2797
    Percent Reflections(Observed) 90.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.3117
    Shell Resolution(Low) 4.39
    Number of Reflections(R-Free) 183
    Number of Reflections(R-Work) 18291
    R-Factor(R-Work) 0.2385
    R-Factor(R-Free) 0.269
    Percent Reflections(Observed) 90.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.39
    Shell Resolution(Low) 4.4744
    Number of Reflections(R-Free) 180
    Number of Reflections(R-Work) 18513
    R-Factor(R-Work) 0.2264
    R-Factor(R-Free) 0.2457
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.4744
    Shell Resolution(Low) 4.5657
    Number of Reflections(R-Free) 179
    Number of Reflections(R-Work) 18721
    R-Factor(R-Work) 0.2171
    R-Factor(R-Free) 0.2298
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.5657
    Shell Resolution(Low) 4.6649
    Number of Reflections(R-Free) 185
    Number of Reflections(R-Work) 18912
    R-Factor(R-Work) 0.2079
    R-Factor(R-Free) 0.2463
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.6649
    Shell Resolution(Low) 4.7733
    Number of Reflections(R-Free) 180
    Number of Reflections(R-Work) 18889
    R-Factor(R-Work) 0.1981
    R-Factor(R-Free) 0.2138
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.7733
    Shell Resolution(Low) 4.8926
    Number of Reflections(R-Free) 182
    Number of Reflections(R-Work) 19008
    R-Factor(R-Work) 0.1937
    R-Factor(R-Free) 0.2219
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.8926
    Shell Resolution(Low) 5.0247
    Number of Reflections(R-Free) 191
    Number of Reflections(R-Work) 19153
    R-Factor(R-Work) 0.183
    R-Factor(R-Free) 0.1913
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.0247
    Shell Resolution(Low) 5.1724
    Number of Reflections(R-Free) 189
    Number of Reflections(R-Work) 19386
    R-Factor(R-Work) 0.1821
    R-Factor(R-Free) 0.2187
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.1724
    Shell Resolution(Low) 5.3392
    Number of Reflections(R-Free) 187
    Number of Reflections(R-Work) 19346
    R-Factor(R-Work) 0.1825
    R-Factor(R-Free) 0.202
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.3392
    Shell Resolution(Low) 5.5298
    Number of Reflections(R-Free) 192
    Number of Reflections(R-Work) 19600
    R-Factor(R-Work) 0.1763
    R-Factor(R-Free) 0.2202
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.5298
    Shell Resolution(Low) 5.7509
    Number of Reflections(R-Free) 190
    Number of Reflections(R-Work) 19611
    R-Factor(R-Work) 0.172
    R-Factor(R-Free) 0.2157
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.7509
    Shell Resolution(Low) 6.0122
    Number of Reflections(R-Free) 192
    Number of Reflections(R-Work) 19590
    R-Factor(R-Work) 0.1703
    R-Factor(R-Free) 0.2285
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 6.0122
    Shell Resolution(Low) 6.3286
    Number of Reflections(R-Free) 193
    Number of Reflections(R-Work) 19790
    R-Factor(R-Work) 0.1689
    R-Factor(R-Free) 0.1956
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 6.3286
    Shell Resolution(Low) 6.7242
    Number of Reflections(R-Free) 188
    Number of Reflections(R-Work) 19770
    R-Factor(R-Work) 0.1703
    R-Factor(R-Free) 0.2125
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 6.7242
    Shell Resolution(Low) 7.2419
    Number of Reflections(R-Free) 191
    Number of Reflections(R-Work) 19716
    R-Factor(R-Work) 0.1682
    R-Factor(R-Free) 0.2096
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 7.2419
    Shell Resolution(Low) 7.9681
    Number of Reflections(R-Free) 191
    Number of Reflections(R-Work) 19746
    R-Factor(R-Work) 0.1624
    R-Factor(R-Free) 0.195
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 7.9681
    Shell Resolution(Low) 9.1149
    Number of Reflections(R-Free) 196
    Number of Reflections(R-Work) 19991
    R-Factor(R-Work) 0.165
    R-Factor(R-Free) 0.1926
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 9.1149
    Shell Resolution(Low) 11.4606
    Number of Reflections(R-Free) 191
    Number of Reflections(R-Work) 19884
    R-Factor(R-Work) 0.1574
    R-Factor(R-Free) 0.1773
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 11.4606
    Shell Resolution(Low) 49.7533
    Number of Reflections(R-Free) 196
    Number of Reflections(R-Work) 19987
    R-Factor(R-Work) 0.1767
    R-Factor(R-Free) 0.198
    Percent Reflections(Observed) 98.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.005
    f_chiral_restr 0.075
    f_dihedral_angle_d 20.536
    f_angle_d 1.186
    f_bond_d 0.006
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 41716
    Nucleic Acid Atoms 36629
    Heterogen Atoms 83
    Solvent Atoms 474
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) XSCALE
    Structure Solution PHASER
    Structure Refinement PHENIX (PHENIX.REFINE)
     
    Software
    refinement PHENIX version: (PHENIX.REFINE)
    model building PHASER