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X-RAY DIFFRACTION
Materials and Methods page
4BPN
  •   Crystallization Hide
    Crystallization Experiments
    pH 7.7
    Details 0.1 M MOPS-KOH PH 7.7, 0.1 M AMMONIUM SULPHATE, 7.5% PEG 8K, 1MM PUTRESCINE
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 209.99 α = 90
    b = 471.55 β = 91.02
    c = 298.54 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector PIXEL (PILATUS 6M)
    Type DECTRIS
    Collection Date 2011-07-01
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type SLS BEAMLINE X06SA
    Wavelength 1
    Site SLS
    Beamline X06SA
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) -3.0
    Resolution(High) 3.7
    Resolution(Low) 50
    Number Reflections(Observed) 607573
    Percent Possible(Observed) 99.0
    R Merge I(Observed) 0.15
    B(Isotropic) From Wilson Plot 97.62
    Redundancy 3.1
     
    High Resolution Shell Details
    Resolution(High) 3.7
    Resolution(Low) 3.93
    Percent Possible(All) 97.0
    R Merge I(Observed) 0.77
    Mean I Over Sigma(Observed) 1.66
    Redundancy 2.94
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 3.703
    Resolution(Low) 49.749
    Cut-off Sigma(F) 0.0
    Number of Reflections(Observed) 557638
    Number of Reflections(R-Free) 5349
    Percent Reflections(Observed) 90.98
    R-Factor(Observed) 0.2021
    R-Work 0.2019
    R-Free 0.2294
     
    Temperature Factor Modeling
    Mean Isotropic B Value 138.56
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.703
    Shell Resolution(Low) 3.7451
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 14502
    R-Factor(R-Work) 0.3431
    R-Factor(R-Free) 0.3407
    Percent Reflections(Observed) 72.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7451
    Shell Resolution(Low) 3.7891
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 15854
    R-Factor(R-Work) 0.3213
    R-Factor(R-Free) 0.3203
    Percent Reflections(Observed) 78.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7891
    Shell Resolution(Low) 3.8353
    Number of Reflections(R-Free) 171
    Number of Reflections(R-Work) 16197
    R-Factor(R-Work) 0.3075
    R-Factor(R-Free) 0.3438
    Percent Reflections(Observed) 80.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.8353
    Shell Resolution(Low) 3.8838
    Number of Reflections(R-Free) 150
    Number of Reflections(R-Work) 16358
    R-Factor(R-Work) 0.3012
    R-Factor(R-Free) 0.3425
    Percent Reflections(Observed) 81.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.8838
    Shell Resolution(Low) 3.9349
    Number of Reflections(R-Free) 172
    Number of Reflections(R-Work) 16399
    R-Factor(R-Work) 0.2921
    R-Factor(R-Free) 0.3154
    Percent Reflections(Observed) 81.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.9349
    Shell Resolution(Low) 3.9888
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 16830
    R-Factor(R-Work) 0.2816
    R-Factor(R-Free) 0.3364
    Percent Reflections(Observed) 83.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.9888
    Shell Resolution(Low) 4.0458
    Number of Reflections(R-Free) 160
    Number of Reflections(R-Work) 17167
    R-Factor(R-Work) 0.2715
    R-Factor(R-Free) 0.2938
    Percent Reflections(Observed) 85.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.0458
    Shell Resolution(Low) 4.1061
    Number of Reflections(R-Free) 169
    Number of Reflections(R-Work) 17551
    R-Factor(R-Work) 0.2603
    R-Factor(R-Free) 0.2767
    Percent Reflections(Observed) 87.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.1061
    Shell Resolution(Low) 4.1703
    Number of Reflections(R-Free) 171
    Number of Reflections(R-Work) 17523
    R-Factor(R-Work) 0.2537
    R-Factor(R-Free) 0.2507
    Percent Reflections(Observed) 87.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.1703
    Shell Resolution(Low) 4.2386
    Number of Reflections(R-Free) 172
    Number of Reflections(R-Work) 17870
    R-Factor(R-Work) 0.2478
    R-Factor(R-Free) 0.264
    Percent Reflections(Observed) 89.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.2386
    Shell Resolution(Low) 4.3117
    Number of Reflections(R-Free) 174
    Number of Reflections(R-Work) 18134
    R-Factor(R-Work) 0.2415
    R-Factor(R-Free) 0.2797
    Percent Reflections(Observed) 90.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.3117
    Shell Resolution(Low) 4.39
    Number of Reflections(R-Free) 183
    Number of Reflections(R-Work) 18291
    R-Factor(R-Work) 0.2385
    R-Factor(R-Free) 0.269
    Percent Reflections(Observed) 90.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.39
    Shell Resolution(Low) 4.4744
    Number of Reflections(R-Free) 180
    Number of Reflections(R-Work) 18513
    R-Factor(R-Work) 0.2264
    R-Factor(R-Free) 0.2457
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.4744
    Shell Resolution(Low) 4.5657
    Number of Reflections(R-Free) 179
    Number of Reflections(R-Work) 18721
    R-Factor(R-Work) 0.2171
    R-Factor(R-Free) 0.2298
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.5657
    Shell Resolution(Low) 4.6649
    Number of Reflections(R-Free) 185
    Number of Reflections(R-Work) 18912
    R-Factor(R-Work) 0.2079
    R-Factor(R-Free) 0.2463
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.6649
    Shell Resolution(Low) 4.7733
    Number of Reflections(R-Free) 180
    Number of Reflections(R-Work) 18889
    R-Factor(R-Work) 0.1981
    R-Factor(R-Free) 0.2138
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.7733
    Shell Resolution(Low) 4.8926
    Number of Reflections(R-Free) 182
    Number of Reflections(R-Work) 19008
    R-Factor(R-Work) 0.1937
    R-Factor(R-Free) 0.2219
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.8926
    Shell Resolution(Low) 5.0247
    Number of Reflections(R-Free) 191
    Number of Reflections(R-Work) 19153
    R-Factor(R-Work) 0.183
    R-Factor(R-Free) 0.1913
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.0247
    Shell Resolution(Low) 5.1724
    Number of Reflections(R-Free) 189
    Number of Reflections(R-Work) 19386
    R-Factor(R-Work) 0.1821
    R-Factor(R-Free) 0.2187
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.1724
    Shell Resolution(Low) 5.3392
    Number of Reflections(R-Free) 187
    Number of Reflections(R-Work) 19346
    R-Factor(R-Work) 0.1825
    R-Factor(R-Free) 0.202
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.3392
    Shell Resolution(Low) 5.5298
    Number of Reflections(R-Free) 192
    Number of Reflections(R-Work) 19600
    R-Factor(R-Work) 0.1763
    R-Factor(R-Free) 0.2202
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.5298
    Shell Resolution(Low) 5.7509
    Number of Reflections(R-Free) 190
    Number of Reflections(R-Work) 19611
    R-Factor(R-Work) 0.172
    R-Factor(R-Free) 0.2157
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.7509
    Shell Resolution(Low) 6.0122
    Number of Reflections(R-Free) 192
    Number of Reflections(R-Work) 19590
    R-Factor(R-Work) 0.1703
    R-Factor(R-Free) 0.2285
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 6.0122
    Shell Resolution(Low) 6.3286
    Number of Reflections(R-Free) 193
    Number of Reflections(R-Work) 19790
    R-Factor(R-Work) 0.1689
    R-Factor(R-Free) 0.1956
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 6.3286
    Shell Resolution(Low) 6.7242
    Number of Reflections(R-Free) 188
    Number of Reflections(R-Work) 19770
    R-Factor(R-Work) 0.1703
    R-Factor(R-Free) 0.2125
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 6.7242
    Shell Resolution(Low) 7.2419
    Number of Reflections(R-Free) 191
    Number of Reflections(R-Work) 19716
    R-Factor(R-Work) 0.1682
    R-Factor(R-Free) 0.2096
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 7.2419
    Shell Resolution(Low) 7.9681
    Number of Reflections(R-Free) 191
    Number of Reflections(R-Work) 19746
    R-Factor(R-Work) 0.1624
    R-Factor(R-Free) 0.195
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 7.9681
    Shell Resolution(Low) 9.1149
    Number of Reflections(R-Free) 196
    Number of Reflections(R-Work) 19991
    R-Factor(R-Work) 0.165
    R-Factor(R-Free) 0.1926
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 9.1149
    Shell Resolution(Low) 11.4606
    Number of Reflections(R-Free) 191
    Number of Reflections(R-Work) 19884
    R-Factor(R-Work) 0.1574
    R-Factor(R-Free) 0.1773
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 11.4606
    Shell Resolution(Low) 49.7533
    Number of Reflections(R-Free) 196
    Number of Reflections(R-Work) 19987
    R-Factor(R-Work) 0.1767
    R-Factor(R-Free) 0.198
    Percent Reflections(Observed) 98.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.005
    f_chiral_restr 0.075
    f_dihedral_angle_d 20.536
    f_angle_d 1.186
    f_bond_d 0.006
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 41716
    Nucleic Acid Atoms 36629
    Heterogen Atoms 83
    Solvent Atoms 474
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) XSCALE
    Structure Solution PHASER
    Structure Refinement PHENIX (PHENIX.REFINE)
     
    Software
    phasing PHASER
    data scaling XSCALE
    data reduction XDS
    refinement PHENIX version: (PHENIX.REFINE)
    model building PHASER