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X-RAY DIFFRACTION
Materials and Methods page
4BGT
  •   Crystallization Hide
    Crystallization Experiments
    pH 4.6
    Details 4-14% PEG 400, 0.1 M SODIUM ACETATE PH 4.6, 0.04 M CADMIUM ACETATE, 293 K, 1-3 DAYS
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 106.23 α = 90
    b = 106.23 β = 90
    c = 102.57 γ = 120
     
    Space Group
    Space Group Name:    P 31 2 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD (Q315R)
    Type ADSC
    Details TWO MIRRORS
    Collection Date 2009-10-06
     
    Diffraction Radiation
    Monochromator DOUBLE CRYSTALS MONOCHROMATOR
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type ESRF BEAMLINE BM30A
    Wavelength 0.979
    Site ESRF
    Beamline BM30A
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) -3.0
    Resolution(High) 1.7
    Resolution(Low) 19.7
    Number Reflections(Observed) 68673
    Percent Possible(Observed) 93.7
    R Merge I(Observed) 0.08
    B(Isotropic) From Wilson Plot 18.15
    Redundancy 4.2
     
    High Resolution Shell Details
    Resolution(High) 1.7
    Resolution(Low) 1.79
    Percent Possible(All) 95.8
    R Merge I(Observed) 0.36
    Mean I Over Sigma(Observed) 2.2
    Redundancy 3.9
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method SIRAS
    reflnsShellList 1.699
    Resolution(Low) 19.701
    Cut-off Sigma(F) 1.34
    Number of Reflections(Observed) 67827
    Number of Reflections(R-Free) 3433
    Percent Reflections(Observed) 91.93
    R-Factor(Observed) 0.172
    R-Work 0.1699
    R-Free 0.2105
     
    Temperature Factor Modeling
    Mean Isotropic B Value 21.5
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6994
    Shell Resolution(Low) 1.7227
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 2614
    R-Factor(R-Work) 0.2092
    R-Factor(R-Free) 0.2696
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7227
    Shell Resolution(Low) 1.7473
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 2649
    R-Factor(R-Work) 0.186
    R-Factor(R-Free) 0.2338
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7473
    Shell Resolution(Low) 1.7733
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 2693
    R-Factor(R-Work) 0.1856
    R-Factor(R-Free) 0.2454
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7733
    Shell Resolution(Low) 1.801
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 2666
    R-Factor(R-Work) 0.1813
    R-Factor(R-Free) 0.2391
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.801
    Shell Resolution(Low) 1.8305
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 2617
    R-Factor(R-Work) 0.1787
    R-Factor(R-Free) 0.2248
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8305
    Shell Resolution(Low) 1.8621
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 2677
    R-Factor(R-Work) 0.1936
    R-Factor(R-Free) 0.2392
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8621
    Shell Resolution(Low) 1.8959
    Number of Reflections(R-Free) 124
    Number of Reflections(R-Work) 2526
    R-Factor(R-Work) 0.253
    R-Factor(R-Free) 0.3305
    Percent Reflections(Observed) 91.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8959
    Shell Resolution(Low) 1.9324
    Number of Reflections(R-Free) 130
    Number of Reflections(R-Work) 2462
    R-Factor(R-Work) 0.362
    R-Factor(R-Free) 0.4077
    Percent Reflections(Observed) 89.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9324
    Shell Resolution(Low) 1.9718
    Number of Reflections(R-Free) 121
    Number of Reflections(R-Work) 2597
    R-Factor(R-Work) 0.202
    R-Factor(R-Free) 0.2344
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9718
    Shell Resolution(Low) 2.0146
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 2597
    R-Factor(R-Work) 0.164
    R-Factor(R-Free) 0.2041
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0146
    Shell Resolution(Low) 2.0614
    Number of Reflections(R-Free) 127
    Number of Reflections(R-Work) 2652
    R-Factor(R-Work) 0.1538
    R-Factor(R-Free) 0.1801
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0614
    Shell Resolution(Low) 2.1129
    Number of Reflections(R-Free) 154
    Number of Reflections(R-Work) 2604
    R-Factor(R-Work) 0.1512
    R-Factor(R-Free) 0.1976
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1129
    Shell Resolution(Low) 2.17
    Number of Reflections(R-Free) 128
    Number of Reflections(R-Work) 2648
    R-Factor(R-Work) 0.1637
    R-Factor(R-Free) 0.2093
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.17
    Shell Resolution(Low) 2.2337
    Number of Reflections(R-Free) 152
    Number of Reflections(R-Work) 2405
    R-Factor(R-Work) 0.2253
    R-Factor(R-Free) 0.2322
    Percent Reflections(Observed) 87.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2337
    Shell Resolution(Low) 2.3057
    Number of Reflections(R-Free) 118
    Number of Reflections(R-Work) 2424
    R-Factor(R-Work) 0.2902
    R-Factor(R-Free) 0.3616
    Percent Reflections(Observed) 86.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3057
    Shell Resolution(Low) 2.388
    Number of Reflections(R-Free) 164
    Number of Reflections(R-Work) 2553
    R-Factor(R-Work) 0.1644
    R-Factor(R-Free) 0.2401
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.388
    Shell Resolution(Low) 2.4834
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 2608
    R-Factor(R-Work) 0.1452
    R-Factor(R-Free) 0.2015
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4834
    Shell Resolution(Low) 2.5962
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 2604
    R-Factor(R-Work) 0.14
    R-Factor(R-Free) 0.1775
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5962
    Shell Resolution(Low) 2.7328
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 2554
    R-Factor(R-Work) 0.1439
    R-Factor(R-Free) 0.1838
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7328
    Shell Resolution(Low) 2.9035
    Number of Reflections(R-Free) 131
    Number of Reflections(R-Work) 2573
    R-Factor(R-Work) 0.1509
    R-Factor(R-Free) 0.1972
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9035
    Shell Resolution(Low) 3.1268
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 2585
    R-Factor(R-Work) 0.1484
    R-Factor(R-Free) 0.2181
    Percent Reflections(Observed) 91.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1268
    Shell Resolution(Low) 3.44
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 2551
    R-Factor(R-Work) 0.1452
    R-Factor(R-Free) 0.1816
    Percent Reflections(Observed) 90.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.44
    Shell Resolution(Low) 3.9343
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2511
    R-Factor(R-Work) 0.1426
    R-Factor(R-Free) 0.1713
    Percent Reflections(Observed) 89.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.9343
    Shell Resolution(Low) 4.9439
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2509
    R-Factor(R-Work) 0.1361
    R-Factor(R-Free) 0.1506
    Percent Reflections(Observed) 88.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.9439
    Shell Resolution(Low) 19.7023
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 2515
    R-Factor(R-Work) 0.1706
    R-Factor(R-Free) 0.2165
    Percent Reflections(Observed) 84.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.006
    f_chiral_restr 0.082
    f_dihedral_angle_d 13.533
    f_angle_d 1.291
    f_bond_d 0.01
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 4596
    Nucleic Acid Atoms 0
    Heterogen Atoms 60
    Solvent Atoms 945
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) XDS, VERSION 10-05-2010
    Data Reduction (data scaling) SCALA, VERSION 3.3.16
    Structure Solution SHARP
    Structure Refinement PHENIX (PHENIX.REFINE)
     
    Software
    refinement PHENIX version: (PHENIX.REFINE)
    model building SHARP