X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 242.44 α = 90
b = 242.44 β = 90
c = 110.36 γ = 120
Symmetry
Space Group H 3 2

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
PIXEL (PILATUS 6M) DECTRIS -- --
Diffraction Radiation
Monochromator Protocol
-- SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SLS BEAMLINE X06SA -- SLS X06SA

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
3.3 40 99.4 0.31 -- -- 20.2 -- 18833 -- -- 81.51
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
3.3 3.47 97.4 -- -- 1.43 20.5 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 3.3 40.0 -- 1.99 -- 18833 941 99.4 -- 0.2299 0.2292 0.2443 --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 3.3001 3.4738 -- 133 2519 0.3068 0.3093 -- 100.0
X Ray Diffraction 3.4738 3.6911 -- 134 2548 0.2592 0.3187 -- 100.0
X Ray Diffraction 3.6911 3.9754 -- 134 2534 0.2187 0.26 -- 100.0
X Ray Diffraction 3.9754 4.3743 -- 134 2544 0.1938 0.2265 -- 100.0
X Ray Diffraction 4.3743 5.0046 -- 134 2553 0.2004 0.1941 -- 100.0
X Ray Diffraction 5.0046 6.2949 -- 135 2569 0.241 0.2429 -- 100.0
X Ray Diffraction 6.2949 29.3238 -- 137 2625 0.2346 0.2454 -- 100.0
Temperature Factor Modeling
Temperature Factor Value
Mean Isotropic B 55.66
RMS Deviations
Key Refinement Restraint Deviation
f_plane_restr 0.007
f_chiral_restr 0.116
f_dihedral_angle_d 20.704
f_angle_d 1.601
f_bond_d 0.011
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 2595
Nucleic Acid Atoms 0
Heterogen Atoms 96
Solvent Atoms 12

Software

Computing
Computing Package Purpose
XDS Data Reduction (intensity integration)
XSCALE Data Reduction (data scaling)
PHASER MR Structure Solution
PHENIX (PHENIX.REFINE) Structure Refinement
Software
Software Name Purpose
PHENIX version: (PHENIX.REFINE) refinement
PHASER version: MR model building