X-RAY DIFFRACTION Experimental Data & Validation


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Crystallization

Crystalization Experiments
pH 7.5
Details 12% PEG3350, 50 MM K(HCOO), pH 7.5

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 101.47 α = 90
b = 80.77 β = 93.45
c = 208.27 γ = 90
Symmetry
Space Group P 1 2 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD (MX-225) MARRESEARCH MIRRORS 2010-11-24
Diffraction Radiation
Monochromator Protocol
SI111 DOUBLE CRYSTAL SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON BESSY BEAMLINE 14.1 -- BESSY 14.1

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
3.48 50 97.3 0.21 -- -- 3.94 -- 42403 -- -3.0 75.8
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
3.48 3.69 84.3 0.68 -- 2.41 3.68 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 3.483 47.574 -- 1.99 -- 42384 2121 97.27 -- 0.2522 0.2509 0.2761 --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 3.483 3.564 -- 86 1674 0.3364 0.3583 -- 62.0
X Ray Diffraction 3.564 3.6531 -- 137 2760 0.3183 0.3544 -- 100.0
X Ray Diffraction 3.6531 3.7518 -- 148 2708 0.3125 0.3222 -- 100.0
X Ray Diffraction 3.7518 3.8622 -- 138 2758 0.2981 0.3561 -- 100.0
X Ray Diffraction 3.8622 3.9868 -- 138 2741 0.2907 0.2932 -- 100.0
X Ray Diffraction 3.9868 4.1292 -- 155 2705 0.2714 0.2753 -- 100.0
X Ray Diffraction 4.1292 4.2944 -- 158 2736 0.2409 0.2912 -- 100.0
X Ray Diffraction 4.2944 4.4897 -- 137 2756 0.2354 0.2848 -- 100.0
X Ray Diffraction 4.4897 4.7262 -- 152 2746 0.2245 0.2478 -- 100.0
X Ray Diffraction 4.7262 5.0221 -- 123 2780 0.2266 0.2868 -- 100.0
X Ray Diffraction 5.0221 5.4093 -- 145 2759 0.2458 0.2635 -- 100.0
X Ray Diffraction 5.4093 5.9527 -- 149 2765 0.2677 0.2732 -- 100.0
X Ray Diffraction 5.9527 6.812 -- 140 2782 0.2755 0.3201 -- 100.0
X Ray Diffraction 6.812 8.5742 -- 141 2792 0.2239 0.2332 -- 100.0
X Ray Diffraction 8.5742 47.5781 -- 174 2801 0.2015 0.2259 -- 98.0
RMS Deviations
Key Refinement Restraint Deviation
f_plane_restr 0.006
f_chiral_restr 0.081
f_dihedral_angle_d 15.048
f_angle_d 1.618
f_bond_d 0.007
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 17076
Nucleic Acid Atoms 0
Heterogen Atoms 0
Solvent Atoms 0

Software

Computing
Computing Package Purpose
XDS Data Reduction (intensity integration)
XDS Data Reduction (data scaling)
XDS, CCP4, PHENIX, COOT Structure Solution
PHENIX (PHENIX.REFINE) Structure Refinement
Software
Software Name Purpose
PHENIX version: (PHENIX.REFINE) refinement
COOT model building
PHENIX model building
CCP4 model building
XDS model building