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X-RAY DIFFRACTION
Materials and Methods page
4BEJ
  •   Crystallization Hide
    Crystallization Experiments
    pH 7.5
    Details 12% PEG3350, 50 MM K(HCOO), pH 7.5
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 101.47 α = 90
    b = 80.77 β = 93.45
    c = 208.27 γ = 90
     
    Space Group
    Space Group Name:    P 1 2 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD (MX-225)
    Type MARRESEARCH
    Details MIRRORS
    Collection Date 2010-11-24
     
    Diffraction Radiation
    Monochromator SI111 DOUBLE CRYSTAL
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type BESSY BEAMLINE 14.1
    Wavelength 0.918410
    Site BESSY
    Beamline 14.1
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) -3.0
    Resolution(High) 3.48
    Resolution(Low) 50
    Number Reflections(Observed) 42403
    Percent Possible(Observed) 97.3
    R Merge I(Observed) 0.21
    B(Isotropic) From Wilson Plot 75.8
    Redundancy 3.94
     
    High Resolution Shell Details
    Resolution(High) 3.48
    Resolution(Low) 3.69
    Percent Possible(All) 84.3
    R Merge I(Observed) 0.68
    Mean I Over Sigma(Observed) 2.41
    Redundancy 3.68
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 3.483
    Resolution(Low) 47.574
    Cut-off Sigma(F) 1.99
    Number of Reflections(Observed) 42384
    Number of Reflections(R-Free) 2121
    Percent Reflections(Observed) 97.27
    R-Factor(Observed) 0.2522
    R-Work 0.2509
    R-Free 0.2761
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.483
    Shell Resolution(Low) 3.564
    Number of Reflections(R-Free) 86
    Number of Reflections(R-Work) 1674
    R-Factor(R-Work) 0.3364
    R-Factor(R-Free) 0.3583
    Percent Reflections(Observed) 62.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.564
    Shell Resolution(Low) 3.6531
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 2760
    R-Factor(R-Work) 0.3183
    R-Factor(R-Free) 0.3544
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.6531
    Shell Resolution(Low) 3.7518
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 2708
    R-Factor(R-Work) 0.3125
    R-Factor(R-Free) 0.3222
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7518
    Shell Resolution(Low) 3.8622
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2758
    R-Factor(R-Work) 0.2981
    R-Factor(R-Free) 0.3561
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.8622
    Shell Resolution(Low) 3.9868
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2741
    R-Factor(R-Work) 0.2907
    R-Factor(R-Free) 0.2932
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.9868
    Shell Resolution(Low) 4.1292
    Number of Reflections(R-Free) 155
    Number of Reflections(R-Work) 2705
    R-Factor(R-Work) 0.2714
    R-Factor(R-Free) 0.2753
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.1292
    Shell Resolution(Low) 4.2944
    Number of Reflections(R-Free) 158
    Number of Reflections(R-Work) 2736
    R-Factor(R-Work) 0.2409
    R-Factor(R-Free) 0.2912
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.2944
    Shell Resolution(Low) 4.4897
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 2756
    R-Factor(R-Work) 0.2354
    R-Factor(R-Free) 0.2848
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.4897
    Shell Resolution(Low) 4.7262
    Number of Reflections(R-Free) 152
    Number of Reflections(R-Work) 2746
    R-Factor(R-Work) 0.2245
    R-Factor(R-Free) 0.2478
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.7262
    Shell Resolution(Low) 5.0221
    Number of Reflections(R-Free) 123
    Number of Reflections(R-Work) 2780
    R-Factor(R-Work) 0.2266
    R-Factor(R-Free) 0.2868
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.0221
    Shell Resolution(Low) 5.4093
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 2759
    R-Factor(R-Work) 0.2458
    R-Factor(R-Free) 0.2635
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.4093
    Shell Resolution(Low) 5.9527
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 2765
    R-Factor(R-Work) 0.2677
    R-Factor(R-Free) 0.2732
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.9527
    Shell Resolution(Low) 6.812
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2782
    R-Factor(R-Work) 0.2755
    R-Factor(R-Free) 0.3201
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 6.812
    Shell Resolution(Low) 8.5742
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2792
    R-Factor(R-Work) 0.2239
    R-Factor(R-Free) 0.2332
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 8.5742
    Shell Resolution(Low) 47.5781
    Number of Reflections(R-Free) 174
    Number of Reflections(R-Work) 2801
    R-Factor(R-Work) 0.2015
    R-Factor(R-Free) 0.2259
    Percent Reflections(Observed) 98.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.006
    f_chiral_restr 0.081
    f_dihedral_angle_d 15.048
    f_angle_d 1.618
    f_bond_d 0.007
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 17076
    Nucleic Acid Atoms 0
    Heterogen Atoms 0
    Solvent Atoms 0
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) XDS
    Structure Solution XDS, CCP4, PHENIX, COOT
    Structure Refinement PHENIX (PHENIX.REFINE)
     
    Software
    refinement PHENIX version: (PHENIX.REFINE)
    model building COOT
    model building PHENIX
    model building CCP4
    model building XDS