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X-RAY DIFFRACTION
Materials and Methods page
4BDX
  •   Crystallization Hide
    Crystallization Experiments
    pH 8.5
    Details 0.1 M TRIS PH 8.5 16-18% PEG4, 0.2 M POTASSIUM ACETATE
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 96.79 α = 90
    b = 96.79 β = 90
    c = 47.48 γ = 90
     
    Space Group
    Space Group Name:    I 41 2 2
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector PIXEL (PILATUS 6M)
    Type DECTRIS
    Details DYNAMICALLY BENDABLE MIRROR
    Collection Date 2010-05-15
     
    Diffraction Radiation
    Monochromator LN2 COOLED FIXED-EXIT SI(111) MONOCHROMATOR
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type SLS BEAMLINE X06SA
    Wavelength 1.03961
    Site SLS
    Beamline X06SA
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 3.5
    Resolution(High) 1.62
    Resolution(Low) 48.39
    Number Reflections(Observed) 14626
    Percent Possible(Observed) 99.7
    R Merge I(Observed) 0.08
    B(Isotropic) From Wilson Plot 21.03
    Redundancy 23.5
     
    High Resolution Shell Details
    Resolution(High) 1.62
    Resolution(Low) 1.65
    Percent Possible(All) 96.0
    R Merge I(Observed) 0.65
    Mean I Over Sigma(Observed) 3.5
    Redundancy 10.7
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method SIRAS
    reflnsShellList 1.62
    Resolution(Low) 48.394
    Cut-off Sigma(F) 1.53
    Number of Reflections(Observed) 14618
    Number of Reflections(R-Free) 1389
    Percent Reflections(Observed) 99.73
    R-Factor(Observed) 0.2171
    R-Work 0.2156
    R-Free 0.2474
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6201
    Shell Resolution(Low) 1.678
    Number of Reflections(R-Free) 161
    Number of Reflections(R-Work) 2506
    R-Factor(R-Work) 0.2778
    R-Factor(R-Free) 0.2592
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.678
    Shell Resolution(Low) 1.7451
    Number of Reflections(R-Free) 163
    Number of Reflections(R-Work) 2585
    R-Factor(R-Work) 0.2525
    R-Factor(R-Free) 0.2517
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7451
    Shell Resolution(Low) 1.8246
    Number of Reflections(R-Free) 150
    Number of Reflections(R-Work) 2607
    R-Factor(R-Work) 0.2177
    R-Factor(R-Free) 0.2277
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8246
    Shell Resolution(Low) 1.9208
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 2566
    R-Factor(R-Work) 0.2059
    R-Factor(R-Free) 0.2142
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9208
    Shell Resolution(Low) 2.0411
    Number of Reflections(R-Free) 150
    Number of Reflections(R-Work) 2597
    R-Factor(R-Work) 0.2186
    R-Factor(R-Free) 0.2343
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0411
    Shell Resolution(Low) 2.1987
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 2631
    R-Factor(R-Work) 0.2019
    R-Factor(R-Free) 0.2264
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1987
    Shell Resolution(Low) 2.42
    Number of Reflections(R-Free) 109
    Number of Reflections(R-Work) 2625
    R-Factor(R-Work) 0.2177
    R-Factor(R-Free) 0.2296
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.42
    Shell Resolution(Low) 2.7701
    Number of Reflections(R-Free) 127
    Number of Reflections(R-Work) 2622
    R-Factor(R-Work) 0.2336
    R-Factor(R-Free) 0.2423
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7701
    Shell Resolution(Low) 3.4899
    Number of Reflections(R-Free) 123
    Number of Reflections(R-Work) 2599
    R-Factor(R-Work) 0.2144
    R-Factor(R-Free) 0.2573
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4899
    Shell Resolution(Low) 48.4156
    Number of Reflections(R-Free) 128
    Number of Reflections(R-Work) 2638
    R-Factor(R-Work) 0.2048
    R-Factor(R-Free) 0.2665
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.005
    f_chiral_restr 0.081
    f_dihedral_angle_d 14.871
    f_angle_d 1.128
    f_bond_d 0.008
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 653
    Nucleic Acid Atoms 0
    Heterogen Atoms 4
    Solvent Atoms 67
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) AIMLESS
    Structure Solution PHENIX.AUTOSOL
    Structure Refinement PHENIX (PHENIX.REFINE)
     
    Software
    refinement PHENIX version: (PHENIX.REFINE)
    model building PHENIX.AUTOSOL