X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Details 10% PEG3350, 20% MPD, 0.5% CHAPS, 0.1 M TRIS PH 8.0

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 112.31 α = 90
b = 112.31 β = 90
c = 293.27 γ = 120
Symmetry
Space Group P 64

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD (QUANTUM 315R) ADSC -- 2012-05-25
Diffraction Radiation
Monochromator Protocol
SI(111) SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON AUSTRALIAN SYNCHROTRON BEAMLINE MX2 -- AUSTRALIAN SYNCHROTRON MX2

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
3 19.9 99.5 0.1731 -- -- 20.7 -- 41413 -- -3.0 82.07
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
3.0 3.1 95.7 1.731 -- 2.26 17.5 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 2.998 19.959 -- 1.99 -- 41413 2071 99.38 -- 0.2165 0.2149 0.246 --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.9984 3.0679 -- 107 2478 0.3547 0.3656 -- 94.0
X Ray Diffraction 3.0679 3.1444 -- 210 2568 0.3099 0.3242 -- 100.0
X Ray Diffraction 3.1444 3.229 -- 109 2657 0.2763 0.3685 -- 100.0
X Ray Diffraction 3.229 3.3236 -- 108 2646 0.2731 0.3306 -- 100.0
X Ray Diffraction 3.3236 3.4304 -- 103 2675 0.2473 0.3225 -- 100.0
X Ray Diffraction 3.4304 3.5523 -- 209 2569 0.2445 0.2854 -- 100.0
X Ray Diffraction 3.5523 3.6937 -- 106 2668 0.2334 0.3642 -- 100.0
X Ray Diffraction 3.6937 3.8607 -- 102 2688 0.2314 0.2652 -- 100.0
X Ray Diffraction 3.8607 4.0626 -- 211 2552 0.2097 0.269 -- 100.0
X Ray Diffraction 4.0626 4.3147 -- 105 2667 0.1919 0.2098 -- 100.0
X Ray Diffraction 4.3147 4.644 -- 101 2675 0.1696 0.1842 -- 100.0
X Ray Diffraction 4.644 5.1043 -- 205 2587 0.1654 0.1956 -- 100.0
X Ray Diffraction 5.1043 5.8267 -- 101 2661 0.1996 0.2796 -- 100.0
X Ray Diffraction 5.8267 7.2813 -- 102 2681 0.2266 0.231 -- 100.0
X Ray Diffraction 7.2813 19.9592 -- 192 2570 0.1998 0.2039 -- 98.0
Temperature Factor Modeling
Temperature Factor Value
Mean Isotropic B 120.51
Anisotropic B[1][1] 2.8299
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] 0.0
Anisotropic B[2][2] 2.8299
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] -5.6597
RMS Deviations
Key Refinement Restraint Deviation
f_plane_restr 0.004
f_chiral_restr 0.112
f_dihedral_angle_d 15.087
f_angle_d 1.39
f_bond_d 0.009
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 9464
Nucleic Acid Atoms 0
Heterogen Atoms 0
Solvent Atoms 84

Software

Computing
Computing Package Purpose
XDS Data Reduction (intensity integration)
XDS Data Reduction (data scaling)
PHASER Structure Solution
PHENIX (PHENIX.REFINE) Structure Refinement
Software
Software Name Purpose
PHENIX version: (PHENIX.REFINE) refinement
PHASER model building