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X-RAY DIFFRACTION
Materials and Methods page
4BDU
  •   Crystallization Hide
    Crystallization Experiments
    Details 10% PEG3350, 20% MPD, 0.5% CHAPS, 0.1 M TRIS PH 8.0
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 112.31 α = 90
    b = 112.31 β = 90
    c = 293.27 γ = 120
     
    Space Group
    Space Group Name:    P 64
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD (QUANTUM 315R)
    Type ADSC
    Collection Date 2012-05-25
     
    Diffraction Radiation
    Monochromator SI(111)
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type AUSTRALIAN SYNCHROTRON BEAMLINE MX2
    Wavelength 0.9537
    Site AUSTRALIAN SYNCHROTRON
    Beamline MX2
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) -3.0
    Resolution(High) 3
    Resolution(Low) 19.9
    Number Reflections(Observed) 41413
    Percent Possible(Observed) 99.5
    R Merge I(Observed) 0.1731
    B(Isotropic) From Wilson Plot 82.07
    Redundancy 20.7
     
    High Resolution Shell Details
    Resolution(High) 3.0
    Resolution(Low) 3.1
    Percent Possible(All) 95.7
    R Merge I(Observed) 1.731
    Mean I Over Sigma(Observed) 2.26
    Redundancy 17.5
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.998
    Resolution(Low) 19.959
    Cut-off Sigma(F) 1.99
    Number of Reflections(Observed) 41413
    Number of Reflections(R-Free) 2071
    Percent Reflections(Observed) 99.38
    R-Factor(Observed) 0.2165
    R-Work 0.2149
    R-Free 0.246
     
    Temperature Factor Modeling
    Mean Isotropic B Value 120.51
    Anisotropic B[1][1] 2.8299
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 2.8299
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -5.6597
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9984
    Shell Resolution(Low) 3.0679
    Number of Reflections(R-Free) 107
    Number of Reflections(R-Work) 2478
    R-Factor(R-Work) 0.3547
    R-Factor(R-Free) 0.3656
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0679
    Shell Resolution(Low) 3.1444
    Number of Reflections(R-Free) 210
    Number of Reflections(R-Work) 2568
    R-Factor(R-Work) 0.3099
    R-Factor(R-Free) 0.3242
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1444
    Shell Resolution(Low) 3.229
    Number of Reflections(R-Free) 109
    Number of Reflections(R-Work) 2657
    R-Factor(R-Work) 0.2763
    R-Factor(R-Free) 0.3685
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.229
    Shell Resolution(Low) 3.3236
    Number of Reflections(R-Free) 108
    Number of Reflections(R-Work) 2646
    R-Factor(R-Work) 0.2731
    R-Factor(R-Free) 0.3306
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3236
    Shell Resolution(Low) 3.4304
    Number of Reflections(R-Free) 103
    Number of Reflections(R-Work) 2675
    R-Factor(R-Work) 0.2473
    R-Factor(R-Free) 0.3225
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4304
    Shell Resolution(Low) 3.5523
    Number of Reflections(R-Free) 209
    Number of Reflections(R-Work) 2569
    R-Factor(R-Work) 0.2445
    R-Factor(R-Free) 0.2854
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5523
    Shell Resolution(Low) 3.6937
    Number of Reflections(R-Free) 106
    Number of Reflections(R-Work) 2668
    R-Factor(R-Work) 0.2334
    R-Factor(R-Free) 0.3642
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.6937
    Shell Resolution(Low) 3.8607
    Number of Reflections(R-Free) 102
    Number of Reflections(R-Work) 2688
    R-Factor(R-Work) 0.2314
    R-Factor(R-Free) 0.2652
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.8607
    Shell Resolution(Low) 4.0626
    Number of Reflections(R-Free) 211
    Number of Reflections(R-Work) 2552
    R-Factor(R-Work) 0.2097
    R-Factor(R-Free) 0.269
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.0626
    Shell Resolution(Low) 4.3147
    Number of Reflections(R-Free) 105
    Number of Reflections(R-Work) 2667
    R-Factor(R-Work) 0.1919
    R-Factor(R-Free) 0.2098
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.3147
    Shell Resolution(Low) 4.644
    Number of Reflections(R-Free) 101
    Number of Reflections(R-Work) 2675
    R-Factor(R-Work) 0.1696
    R-Factor(R-Free) 0.1842
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.644
    Shell Resolution(Low) 5.1043
    Number of Reflections(R-Free) 205
    Number of Reflections(R-Work) 2587
    R-Factor(R-Work) 0.1654
    R-Factor(R-Free) 0.1956
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.1043
    Shell Resolution(Low) 5.8267
    Number of Reflections(R-Free) 101
    Number of Reflections(R-Work) 2661
    R-Factor(R-Work) 0.1996
    R-Factor(R-Free) 0.2796
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.8267
    Shell Resolution(Low) 7.2813
    Number of Reflections(R-Free) 102
    Number of Reflections(R-Work) 2681
    R-Factor(R-Work) 0.2266
    R-Factor(R-Free) 0.231
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 7.2813
    Shell Resolution(Low) 19.9592
    Number of Reflections(R-Free) 192
    Number of Reflections(R-Work) 2570
    R-Factor(R-Work) 0.1998
    R-Factor(R-Free) 0.2039
    Percent Reflections(Observed) 98.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.004
    f_chiral_restr 0.112
    f_dihedral_angle_d 15.087
    f_angle_d 1.39
    f_bond_d 0.009
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 9464
    Nucleic Acid Atoms 0
    Heterogen Atoms 0
    Solvent Atoms 84
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) XDS
    Structure Solution PHASER
    Structure Refinement PHENIX (PHENIX.REFINE)
     
    Software
    refinement PHENIX version: (PHENIX.REFINE)
    model building PHASER