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X-RAY DIFFRACTION
Materials and Methods page
4BD8
  •   Crystallization Hide
    Crystallization Experiments
    Details 1.8 M NH4SO4, 0.1 M HEPES PH 6.5, 10 MM PRCL3
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 142.95 α = 90
    b = 142.95 β = 90
    c = 86.71 γ = 120
     
    Space Group
    Space Group Name:    H 3
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD (QUANTUM 315R)
    Type ADSC
    Collection Date 2011-06-22
     
    Diffraction Radiation
    Monochromator SI(111)
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type AUSTRALIAN SYNCHROTRON BEAMLINE MX2
    Wavelength 0.9537
    Site AUSTRALIAN SYNCHROTRON
    Beamline MX2
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) -3.0
    Resolution(High) 2.22
    Resolution(Low) 19.82
    Number Reflections(Observed) 32132
    Percent Possible(Observed) 98.6
    R Merge I(Observed) 0.07
    B(Isotropic) From Wilson Plot 46.17
    Redundancy 93.5
     
    High Resolution Shell Details
    Resolution(High) 2.22
    Resolution(Low) 2.35
    Percent Possible(All) 93.5
    R Merge I(Observed) 0.88
    Mean I Over Sigma(Observed) 1.9
    Redundancy 5.3
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.22
    Resolution(Low) 19.823
    Cut-off Sigma(F) 1.99
    Number of Reflections(Observed) 32132
    Number of Reflections(R-Free) 1607
    Percent Reflections(Observed) 98.53
    R-Factor(Observed) 0.2003
    R-Work 0.1972
    R-Free 0.2555
     
    Temperature Factor Modeling
    Mean Isotropic B Value 79.95
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2203
    Shell Resolution(Low) 2.2918
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 2549
    R-Factor(R-Work) 0.5215
    R-Factor(R-Free) 0.5687
    Percent Reflections(Observed) 89.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2918
    Shell Resolution(Low) 2.3736
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2720
    R-Factor(R-Work) 0.3156
    R-Factor(R-Free) 0.3398
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3736
    Shell Resolution(Low) 2.4685
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 2810
    R-Factor(R-Work) 0.2335
    R-Factor(R-Free) 0.2736
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4685
    Shell Resolution(Low) 2.5806
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 2837
    R-Factor(R-Work) 0.2169
    R-Factor(R-Free) 0.2678
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5806
    Shell Resolution(Low) 2.7163
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 2795
    R-Factor(R-Work) 0.2042
    R-Factor(R-Free) 0.2747
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7163
    Shell Resolution(Low) 2.886
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 2825
    R-Factor(R-Work) 0.202
    R-Factor(R-Free) 0.3089
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.886
    Shell Resolution(Low) 3.1081
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 2810
    R-Factor(R-Work) 0.2062
    R-Factor(R-Free) 0.2533
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1081
    Shell Resolution(Low) 3.4194
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 2807
    R-Factor(R-Work) 0.1955
    R-Factor(R-Free) 0.2504
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4194
    Shell Resolution(Low) 3.9109
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 2803
    R-Factor(R-Work) 0.1732
    R-Factor(R-Free) 0.2528
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.9109
    Shell Resolution(Low) 4.9149
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 2827
    R-Factor(R-Work) 0.1587
    R-Factor(R-Free) 0.2052
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.9149
    Shell Resolution(Low) 19.824
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 2742
    R-Factor(R-Work) 0.1804
    R-Factor(R-Free) 0.242
    Percent Reflections(Observed) 97.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.004
    f_chiral_restr 0.071
    f_dihedral_angle_d 14.145
    f_angle_d 1.068
    f_bond_d 0.008
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 4404
    Nucleic Acid Atoms 0
    Heterogen Atoms 34
    Solvent Atoms 226
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) XDS
    Structure Solution PHASER
    Structure Refinement PHENIX (PHENIX.REFINE)
     
    Software
    refinement PHENIX version: (PHENIX.REFINE)
    model building PHASER