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X-RAY DIFFRACTION
Materials and Methods page
4BD4
  •   Crystallization Hide
    Crystallization Experiments
    Details 18 % PEG 1500, 15% GLYCEROL
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 235.03 α = 90
    b = 49.89 β = 97.19
    c = 97.94 γ = 90
     
    Space Group
    Space Group Name:    C 1 2 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD (165MM)
    Type MARRESEARCH
    Details HORIZONTALLY FOCUSING MIRROR
    Collection Date 2012-05-18
     
    Diffraction Radiation
    Monochromator BENT SI(111) CRYSTAL
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type MAX II BEAMLINE I911-2
    Wavelength 1.0409
    Site MAX II
    Beamline I911-2
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 2.78
    Resolution(Low) 30
    Number Reflections(Observed) 28537
    Percent Possible(Observed) 98.2
    R Merge I(Observed) 0.05
    B(Isotropic) From Wilson Plot 69.56
    Redundancy 2.7
     
    High Resolution Shell Details
    Resolution(High) 2.78
    Resolution(Low) 2.85
    Percent Possible(All) 99.3
    R Merge I(Observed) 0.86
    Mean I Over Sigma(Observed) 2.1
    Redundancy 2.7
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.78
    Resolution(Low) 29.148
    Cut-off Sigma(F) 2.0
    Number of Reflections(Observed) 28343
    Number of Reflections(R-Free) 1437
    Percent Reflections(Observed) 98.12
    R-Factor(Observed) 0.1837
    R-Work 0.1802
    R-Free 0.2461
     
    Temperature Factor Modeling
    Mean Isotropic B Value 85.4
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7801
    Shell Resolution(Low) 2.8794
    Number of Reflections(R-Free) 154
    Number of Reflections(R-Work) 2664
    R-Factor(R-Work) 0.3132
    R-Factor(R-Free) 0.3701
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8794
    Shell Resolution(Low) 2.9946
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 2669
    R-Factor(R-Work) 0.2793
    R-Factor(R-Free) 0.3408
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9946
    Shell Resolution(Low) 3.1307
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 2720
    R-Factor(R-Work) 0.2461
    R-Factor(R-Free) 0.3054
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1307
    Shell Resolution(Low) 3.2955
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2699
    R-Factor(R-Work) 0.2252
    R-Factor(R-Free) 0.2894
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2955
    Shell Resolution(Low) 3.5017
    Number of Reflections(R-Free) 130
    Number of Reflections(R-Work) 2699
    R-Factor(R-Work) 0.2007
    R-Factor(R-Free) 0.3046
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5017
    Shell Resolution(Low) 3.7715
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2696
    R-Factor(R-Work) 0.1851
    R-Factor(R-Free) 0.2467
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7715
    Shell Resolution(Low) 4.1501
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 2688
    R-Factor(R-Work) 0.1683
    R-Factor(R-Free) 0.2318
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.1501
    Shell Resolution(Low) 4.7484
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2675
    R-Factor(R-Work) 0.1437
    R-Factor(R-Free) 0.2044
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.7484
    Shell Resolution(Low) 5.974
    Number of Reflections(R-Free) 155
    Number of Reflections(R-Work) 2676
    R-Factor(R-Work) 0.1575
    R-Factor(R-Free) 0.2303
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.974
    Shell Resolution(Low) 29.1496
    Number of Reflections(R-Free) 154
    Number of Reflections(R-Work) 2720
    R-Factor(R-Work) 0.1578
    R-Factor(R-Free) 0.2197
    Percent Reflections(Observed) 95.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.005
    f_chiral_restr 0.087
    f_dihedral_angle_d 14.751
    f_angle_d 1.284
    f_bond_d 0.008
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 6687
    Nucleic Acid Atoms 0
    Heterogen Atoms 24
    Solvent Atoms 53
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) XSCALE
    Structure Solution PHASER
    Structure Refinement PHENIX (PHENIX.REFINE)
     
    Software
    refinement PHENIX version: (PHENIX.REFINE)
    model building PHASER