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X-RAY DIFFRACTION
Materials and Methods page
4BD0
  •   Crystallization Hide
    Crystallization Experiments
    Details 2.0 M AMMONIUM SULFATE AND 0.1 M SODIUM CITRATE PD 5.1 PREPARED IN 99.9 PERCENT D2O AT 20 C
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 72.5 α = 90
    b = 72.5 β = 90
    c = 97.67 γ = 120
     
    Space Group
    Space Group Name:    P 32 2 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD (QUANTUM 315)
    Type ADSC
    Collection Date 2012-08-08
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 19-ID
    Wavelength 0.97
    Site APS
    Beamline 19-ID
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 2.9
    Resolution(High) 1.21
    Resolution(Low) 26.41
    Number Reflections(Observed) 91485
    Percent Possible(Observed) 99.9
    R Merge I(Observed) 0.08
    B(Isotropic) From Wilson Plot 8.37
    Redundancy 10.1
     
    High Resolution Shell Details
    Resolution(High) 1.21
    Resolution(Low) 1.27
    Percent Possible(All) 100.0
    R Merge I(Observed) 0.23
    Mean I Over Sigma(Observed) 2.9
    Redundancy 9.3
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.207
    Resolution(Low) 26.408
    Cut-off Sigma(F) 1.35
    Number of Reflections(Observed) 91418
    Number of Reflections(R-Free) 4585
    Percent Reflections(Observed) 99.89
    R-Factor(Observed) 0.1181
    R-Work 0.1173
    R-Free 0.1327
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.207
    Shell Resolution(Low) 1.2207
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 2843
    R-Factor(R-Work) 0.1111
    R-Factor(R-Free) 0.1459
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.2207
    Shell Resolution(Low) 1.2351
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 2859
    R-Factor(R-Work) 0.1025
    R-Factor(R-Free) 0.1086
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.2351
    Shell Resolution(Low) 1.2502
    Number of Reflections(R-Free) 165
    Number of Reflections(R-Work) 2877
    R-Factor(R-Work) 0.106
    R-Factor(R-Free) 0.1146
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.2502
    Shell Resolution(Low) 1.266
    Number of Reflections(R-Free) 163
    Number of Reflections(R-Work) 2831
    R-Factor(R-Work) 0.125
    R-Factor(R-Free) 0.1339
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.266
    Shell Resolution(Low) 1.2826
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2899
    R-Factor(R-Work) 0.1164
    R-Factor(R-Free) 0.1529
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.2826
    Shell Resolution(Low) 1.3002
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2825
    R-Factor(R-Work) 0.1043
    R-Factor(R-Free) 0.1161
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.3002
    Shell Resolution(Low) 1.3188
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2950
    R-Factor(R-Work) 0.0976
    R-Factor(R-Free) 0.1147
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.3188
    Shell Resolution(Low) 1.3385
    Number of Reflections(R-Free) 153
    Number of Reflections(R-Work) 2848
    R-Factor(R-Work) 0.0939
    R-Factor(R-Free) 0.1208
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.3385
    Shell Resolution(Low) 1.3594
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 2884
    R-Factor(R-Work) 0.0965
    R-Factor(R-Free) 0.1216
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.3594
    Shell Resolution(Low) 1.3817
    Number of Reflections(R-Free) 155
    Number of Reflections(R-Work) 2886
    R-Factor(R-Work) 0.0966
    R-Factor(R-Free) 0.1106
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.3817
    Shell Resolution(Low) 1.4055
    Number of Reflections(R-Free) 164
    Number of Reflections(R-Work) 2830
    R-Factor(R-Work) 0.101
    R-Factor(R-Free) 0.135
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.4055
    Shell Resolution(Low) 1.431
    Number of Reflections(R-Free) 159
    Number of Reflections(R-Work) 2899
    R-Factor(R-Work) 0.1043
    R-Factor(R-Free) 0.1442
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.431
    Shell Resolution(Low) 1.4586
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 2866
    R-Factor(R-Work) 0.1027
    R-Factor(R-Free) 0.1216
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.4586
    Shell Resolution(Low) 1.4883
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2882
    R-Factor(R-Work) 0.0974
    R-Factor(R-Free) 0.1232
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.4883
    Shell Resolution(Low) 1.5207
    Number of Reflections(R-Free) 161
    Number of Reflections(R-Work) 2887
    R-Factor(R-Work) 0.094
    R-Factor(R-Free) 0.109
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5207
    Shell Resolution(Low) 1.5561
    Number of Reflections(R-Free) 151
    Number of Reflections(R-Work) 2883
    R-Factor(R-Work) 0.0902
    R-Factor(R-Free) 0.1139
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5561
    Shell Resolution(Low) 1.595
    Number of Reflections(R-Free) 162
    Number of Reflections(R-Work) 2869
    R-Factor(R-Work) 0.0954
    R-Factor(R-Free) 0.1203
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.595
    Shell Resolution(Low) 1.6381
    Number of Reflections(R-Free) 150
    Number of Reflections(R-Work) 2885
    R-Factor(R-Work) 0.0962
    R-Factor(R-Free) 0.111
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6381
    Shell Resolution(Low) 1.6863
    Number of Reflections(R-Free) 164
    Number of Reflections(R-Work) 2890
    R-Factor(R-Work) 0.097
    R-Factor(R-Free) 0.1337
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6863
    Shell Resolution(Low) 1.7407
    Number of Reflections(R-Free) 150
    Number of Reflections(R-Work) 2886
    R-Factor(R-Work) 0.1001
    R-Factor(R-Free) 0.1169
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7407
    Shell Resolution(Low) 1.8029
    Number of Reflections(R-Free) 150
    Number of Reflections(R-Work) 2898
    R-Factor(R-Work) 0.1003
    R-Factor(R-Free) 0.1265
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8029
    Shell Resolution(Low) 1.8751
    Number of Reflections(R-Free) 162
    Number of Reflections(R-Work) 2910
    R-Factor(R-Work) 0.0978
    R-Factor(R-Free) 0.1259
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8751
    Shell Resolution(Low) 1.9604
    Number of Reflections(R-Free) 158
    Number of Reflections(R-Work) 2901
    R-Factor(R-Work) 0.1035
    R-Factor(R-Free) 0.1153
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9604
    Shell Resolution(Low) 2.0637
    Number of Reflections(R-Free) 170
    Number of Reflections(R-Work) 2890
    R-Factor(R-Work) 0.1048
    R-Factor(R-Free) 0.1162
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0637
    Shell Resolution(Low) 2.1929
    Number of Reflections(R-Free) 162
    Number of Reflections(R-Work) 2901
    R-Factor(R-Work) 0.105
    R-Factor(R-Free) 0.1445
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1929
    Shell Resolution(Low) 2.3622
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 2934
    R-Factor(R-Work) 0.1119
    R-Factor(R-Free) 0.1249
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3622
    Shell Resolution(Low) 2.5997
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 2944
    R-Factor(R-Work) 0.1197
    R-Factor(R-Free) 0.1424
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5997
    Shell Resolution(Low) 2.9754
    Number of Reflections(R-Free) 154
    Number of Reflections(R-Work) 2964
    R-Factor(R-Work) 0.134
    R-Factor(R-Free) 0.1433
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9754
    Shell Resolution(Low) 3.747
    Number of Reflections(R-Free) 164
    Number of Reflections(R-Work) 2971
    R-Factor(R-Work) 0.1376
    R-Factor(R-Free) 0.1358
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.747
    Shell Resolution(Low) 26.4139
    Number of Reflections(R-Free) 158
    Number of Reflections(R-Work) 3041
    R-Factor(R-Work) 0.177
    R-Factor(R-Free) 0.1709
    Percent Reflections(Observed) 98.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.009
    f_chiral_restr 0.084
    f_dihedral_angle_d 12.823
    f_angle_d 1.432
    f_bond_d 0.012
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 1970
    Nucleic Acid Atoms 0
    Heterogen Atoms 42
    Solvent Atoms 397
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) MOSFLM
    Data Reduction (data scaling) SCALA
    Structure Solution PHASER
    Structure Refinement PHENIX (PHENIX.REFINE)
     
    Software
    refinement PHENIX version: (PHENIX.REFINE)
    model building PHASER