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X-RAY DIFFRACTION
Materials and Methods page
4BCZ
  •   Crystallization Hide
    Crystallization Experiments
    Details 30% PEG 1500, 0.1M MIB BUFFER, PH 4.0, 20 C
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 74.43 α = 90
    b = 74.43 β = 90
    c = 59.27 γ = 120
     
    Space Group
    Space Group Name:    P 65
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD (165MM)
    Type MARRESEARCH
    Details HORIZONTALLY FOCUSING MIRROR
    Collection Date 2011-03-15
     
    Diffraction Radiation
    Monochromator BENT SI(111) CRYSTAL
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type MAX II BEAMLINE I911-2
    Wavelength 1.0379
    Site MAX II
    Beamline I911-2
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 1.93
    Resolution(Low) 30
    Number Reflections(Observed) 14115
    Percent Possible(Observed) 99.8
    R Merge I(Observed) 0.06
    B(Isotropic) From Wilson Plot 28.83
    Redundancy 6.7
     
    High Resolution Shell Details
    Resolution(High) 1.93
    Resolution(Low) 1.98
    Percent Possible(All) 99.9
    R Merge I(Observed) 0.65
    Mean I Over Sigma(Observed) 3.5
    Redundancy 6.7
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.93
    Resolution(Low) 30.0
    Cut-off Sigma(F) 0.0
    Number of Reflections(Observed) 14115
    Number of Reflections(R-Free) 707
    Percent Reflections(Observed) 99.8
    R-Factor(Observed) 0.1718
    R-Work 0.1693
    R-Free 0.2195
     
    Temperature Factor Modeling
    Mean Isotropic B Value 36.6
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9301
    Shell Resolution(Low) 2.0791
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2669
    R-Factor(R-Work) 0.2025
    R-Factor(R-Free) 0.2882
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0791
    Shell Resolution(Low) 2.2883
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2679
    R-Factor(R-Work) 0.1923
    R-Factor(R-Free) 0.2573
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2883
    Shell Resolution(Low) 2.6192
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 2664
    R-Factor(R-Work) 0.1919
    R-Factor(R-Free) 0.2387
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6192
    Shell Resolution(Low) 3.2991
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2690
    R-Factor(R-Work) 0.1845
    R-Factor(R-Free) 0.2733
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2991
    Shell Resolution(Low) 28.3169
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2706
    R-Factor(R-Work) 0.1445
    R-Factor(R-Free) 0.1689
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.003
    f_chiral_restr 0.079
    f_dihedral_angle_d 12.668
    f_angle_d 1.121
    f_bond_d 0.008
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 1543
    Nucleic Acid Atoms 0
    Heterogen Atoms 0
    Solvent Atoms 147
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) XSCALE
    Structure Solution PHASER
    Structure Refinement PHENIX (PHENIX.REFINE)
     
    Software
    refinement PHENIX version: (PHENIX.REFINE)
    model building PHASER