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X-RAY DIFFRACTION
Materials and Methods page
4BCQ
  •   Crystallization Hide
    Crystallization Experiments
    Details COCRYSTALS WERE GROWN IN 1-1.25M AMMONIUM SULFATE, 0.5-0.9M KCL, 100MM HEPES, PH 7.0, 5MM DTT AND IN THE PRESENCE OF COMPOUND.
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 77.08 α = 90
    b = 141.16 β = 90
    c = 155.52 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type DIAMOND BEAMLINE I04
    Wavelength 0.98
    Site DIAMOND
    Beamline I04
     
     
  •   Refinement Data Hide
    Reflection Details
    Resolution(High) 2.19
    Resolution(Low) 52.26
    Number Reflections(Observed) 65528
    Percent Possible(Observed) 97.9
    R Merge I(Observed) 0.13
    B(Isotropic) From Wilson Plot 43.82
    Redundancy 3.2
     
    High Resolution Shell Details
    Resolution(High) 2.4
    Resolution(Low) 2.53
    Percent Possible(All) 93.0
    R Merge I(Observed) 0.46
    Mean I Over Sigma(Observed) 1.65
    Redundancy 2.91
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.4
    Resolution(Low) 48.662
    Cut-off Sigma(F) 1.34
    Number of Reflections(Observed) 65380
    Number of Reflections(R-Free) 3315
    Percent Reflections(Observed) 97.45
    R-Factor(Observed) 0.2171
    R-Work 0.2152
    R-Free 0.2518
     
    Temperature Factor Modeling
    Anisotropic B[1][1] 3.3092
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] -0.4663
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -2.8428
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4
    Shell Resolution(Low) 2.4343
    Number of Reflections(R-Free) 114
    Number of Reflections(R-Work) 2376
    R-Factor(R-Work) 0.3205
    R-Factor(R-Free) 0.3748
    Percent Reflections(Observed) 90.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4343
    Shell Resolution(Low) 2.4706
    Number of Reflections(R-Free) 117
    Number of Reflections(R-Work) 2363
    R-Factor(R-Work) 0.3264
    R-Factor(R-Free) 0.4227
    Percent Reflections(Observed) 91.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4706
    Shell Resolution(Low) 2.5092
    Number of Reflections(R-Free) 130
    Number of Reflections(R-Work) 2443
    R-Factor(R-Work) 0.2972
    R-Factor(R-Free) 0.3648
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5092
    Shell Resolution(Low) 2.5504
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2465
    R-Factor(R-Work) 0.3027
    R-Factor(R-Free) 0.3502
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5504
    Shell Resolution(Low) 2.5943
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 2476
    R-Factor(R-Work) 0.2781
    R-Factor(R-Free) 0.3463
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5943
    Shell Resolution(Low) 2.6415
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2502
    R-Factor(R-Work) 0.2664
    R-Factor(R-Free) 0.3016
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6415
    Shell Resolution(Low) 2.6923
    Number of Reflections(R-Free) 127
    Number of Reflections(R-Work) 2593
    R-Factor(R-Work) 0.2698
    R-Factor(R-Free) 0.3131
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6923
    Shell Resolution(Low) 2.7473
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2548
    R-Factor(R-Work) 0.2551
    R-Factor(R-Free) 0.3338
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7473
    Shell Resolution(Low) 2.807
    Number of Reflections(R-Free) 130
    Number of Reflections(R-Work) 2618
    R-Factor(R-Work) 0.2594
    R-Factor(R-Free) 0.27
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.807
    Shell Resolution(Low) 2.8723
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 2612
    R-Factor(R-Work) 0.262
    R-Factor(R-Free) 0.2857
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8723
    Shell Resolution(Low) 2.9441
    Number of Reflections(R-Free) 128
    Number of Reflections(R-Work) 2623
    R-Factor(R-Work) 0.2594
    R-Factor(R-Free) 0.3246
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9441
    Shell Resolution(Low) 3.0237
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2600
    R-Factor(R-Work) 0.2629
    R-Factor(R-Free) 0.3058
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0237
    Shell Resolution(Low) 3.1127
    Number of Reflections(R-Free) 125
    Number of Reflections(R-Work) 2660
    R-Factor(R-Work) 0.267
    R-Factor(R-Free) 0.2936
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1127
    Shell Resolution(Low) 3.2131
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 2658
    R-Factor(R-Work) 0.2539
    R-Factor(R-Free) 0.3312
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2131
    Shell Resolution(Low) 3.3279
    Number of Reflections(R-Free) 129
    Number of Reflections(R-Work) 2611
    R-Factor(R-Work) 0.2513
    R-Factor(R-Free) 0.2966
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3279
    Shell Resolution(Low) 3.4611
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 2638
    R-Factor(R-Work) 0.2294
    R-Factor(R-Free) 0.2617
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4611
    Shell Resolution(Low) 3.6186
    Number of Reflections(R-Free) 163
    Number of Reflections(R-Work) 2622
    R-Factor(R-Work) 0.2144
    R-Factor(R-Free) 0.2518
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.6186
    Shell Resolution(Low) 3.8093
    Number of Reflections(R-Free) 182
    Number of Reflections(R-Work) 2604
    R-Factor(R-Work) 0.2006
    R-Factor(R-Free) 0.2434
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.8093
    Shell Resolution(Low) 4.0479
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 2647
    R-Factor(R-Work) 0.1844
    R-Factor(R-Free) 0.2295
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.0479
    Shell Resolution(Low) 4.3602
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2649
    R-Factor(R-Work) 0.1722
    R-Factor(R-Free) 0.2092
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.3602
    Shell Resolution(Low) 4.7987
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 2651
    R-Factor(R-Work) 0.1504
    R-Factor(R-Free) 0.2106
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.7987
    Shell Resolution(Low) 5.4922
    Number of Reflections(R-Free) 153
    Number of Reflections(R-Work) 2636
    R-Factor(R-Work) 0.1578
    R-Factor(R-Free) 0.1927
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.4922
    Shell Resolution(Low) 6.9164
    Number of Reflections(R-Free) 127
    Number of Reflections(R-Work) 2618
    R-Factor(R-Work) 0.2106
    R-Factor(R-Free) 0.2324
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 6.9164
    Shell Resolution(Low) 48.6723
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2852
    R-Factor(R-Work) 0.1849
    R-Factor(R-Free) 0.1685
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.004
    f_chiral_restr 0.056
    f_dihedral_angle_d 14.024
    f_angle_d 0.8
    f_bond_d 0.004
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 8843
    Nucleic Acid Atoms 0
    Heterogen Atoms 62
    Solvent Atoms 331
     
     
  •   Software and Computing Hide
    Computing
    Structure Solution PHASER
    Structure Refinement PHENIX (PHENIX.REFINE)
     
    Software
    refinement PHENIX version: (PHENIX.REFINE)
    model building PHASER