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X-RAY DIFFRACTION
Materials and Methods page
4BCO
  •   Crystallization Hide
    Crystallization Experiments
    pH 7
    Details COCRYSTALS WERE GROWN IN 1-1.25M AMMONIUM SULFATE, 0.5-0.9M KCL, 100MM HEPES, PH 7.0, 5MM DTT AND IN THE PRESENCE OF COMPOUND.
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 73.9 α = 90
    b = 133.81 β = 90
    c = 148.38 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type DIAMOND BEAMLINE I03
    Wavelength 0.9763
    Site DIAMOND
    Beamline I03
     
     
  •   Refinement Data Hide
    Reflection Details
    Resolution(High) 1.58
    Resolution(Low) 52.36
    Number Reflections(Observed) 92057
    Percent Possible(Observed) 99.2
    R Merge I(Observed) 0.08
    B(Isotropic) From Wilson Plot 32.61
    Redundancy 3.22
     
    High Resolution Shell Details
    Resolution(High) 2.05
    Resolution(Low) 2.16
    Percent Possible(All) 99.4
    R Merge I(Observed) 0.54
    Mean I Over Sigma(Observed) 1.41
    Redundancy 3.29
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.05
    Resolution(Low) 49.599
    Cut-off Sigma(F) 0.0
    Number of Reflections(Observed) 91969
    Number of Reflections(R-Free) 4595
    Percent Reflections(Observed) 98.96
    R-Factor(Observed) 0.1906
    R-Work 0.1887
    R-Free 0.226
     
    Temperature Factor Modeling
    Anisotropic B[1][1] -0.7662
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] -0.0647
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 0.8309
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.05
    Shell Resolution(Low) 2.0733
    Number of Reflections(R-Free) 175
    Number of Reflections(R-Work) 2809
    R-Factor(R-Work) 0.2492
    R-Factor(R-Free) 0.2848
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0733
    Shell Resolution(Low) 2.0977
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 2901
    R-Factor(R-Work) 0.2431
    R-Factor(R-Free) 0.2987
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0977
    Shell Resolution(Low) 2.1233
    Number of Reflections(R-Free) 152
    Number of Reflections(R-Work) 2930
    R-Factor(R-Work) 0.2428
    R-Factor(R-Free) 0.293
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1233
    Shell Resolution(Low) 2.1502
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 2903
    R-Factor(R-Work) 0.2329
    R-Factor(R-Free) 0.2629
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1502
    Shell Resolution(Low) 2.1785
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 2900
    R-Factor(R-Work) 0.221
    R-Factor(R-Free) 0.3085
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1785
    Shell Resolution(Low) 2.2083
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 2888
    R-Factor(R-Work) 0.2151
    R-Factor(R-Free) 0.2345
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2083
    Shell Resolution(Low) 2.2398
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 2965
    R-Factor(R-Work) 0.2227
    R-Factor(R-Free) 0.2972
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2398
    Shell Resolution(Low) 2.2733
    Number of Reflections(R-Free) 169
    Number of Reflections(R-Work) 2831
    R-Factor(R-Work) 0.2173
    R-Factor(R-Free) 0.2741
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2733
    Shell Resolution(Low) 2.3088
    Number of Reflections(R-Free) 129
    Number of Reflections(R-Work) 2945
    R-Factor(R-Work) 0.2091
    R-Factor(R-Free) 0.2342
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3088
    Shell Resolution(Low) 2.3467
    Number of Reflections(R-Free) 174
    Number of Reflections(R-Work) 2876
    R-Factor(R-Work) 0.2076
    R-Factor(R-Free) 0.2714
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3467
    Shell Resolution(Low) 2.3871
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2880
    R-Factor(R-Work) 0.2171
    R-Factor(R-Free) 0.2675
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3871
    Shell Resolution(Low) 2.4305
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 2868
    R-Factor(R-Work) 0.221
    R-Factor(R-Free) 0.2653
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4305
    Shell Resolution(Low) 2.4773
    Number of Reflections(R-Free) 162
    Number of Reflections(R-Work) 2911
    R-Factor(R-Work) 0.2193
    R-Factor(R-Free) 0.3042
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4773
    Shell Resolution(Low) 2.5278
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2911
    R-Factor(R-Work) 0.2079
    R-Factor(R-Free) 0.263
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5278
    Shell Resolution(Low) 2.5828
    Number of Reflections(R-Free) 184
    Number of Reflections(R-Work) 2865
    R-Factor(R-Work) 0.196
    R-Factor(R-Free) 0.2156
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5828
    Shell Resolution(Low) 2.6429
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 2959
    R-Factor(R-Work) 0.1888
    R-Factor(R-Free) 0.2108
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6429
    Shell Resolution(Low) 2.709
    Number of Reflections(R-Free) 154
    Number of Reflections(R-Work) 2872
    R-Factor(R-Work) 0.1935
    R-Factor(R-Free) 0.2369
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.709
    Shell Resolution(Low) 2.7822
    Number of Reflections(R-Free) 159
    Number of Reflections(R-Work) 2929
    R-Factor(R-Work) 0.2031
    R-Factor(R-Free) 0.237
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7822
    Shell Resolution(Low) 2.8641
    Number of Reflections(R-Free) 130
    Number of Reflections(R-Work) 2890
    R-Factor(R-Work) 0.2057
    R-Factor(R-Free) 0.2539
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8641
    Shell Resolution(Low) 2.9565
    Number of Reflections(R-Free) 159
    Number of Reflections(R-Work) 2888
    R-Factor(R-Work) 0.208
    R-Factor(R-Free) 0.2339
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9565
    Shell Resolution(Low) 3.0621
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 2902
    R-Factor(R-Work) 0.1893
    R-Factor(R-Free) 0.2349
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0621
    Shell Resolution(Low) 3.1847
    Number of Reflections(R-Free) 160
    Number of Reflections(R-Work) 2926
    R-Factor(R-Work) 0.188
    R-Factor(R-Free) 0.2274
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1847
    Shell Resolution(Low) 3.3296
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2941
    R-Factor(R-Work) 0.1821
    R-Factor(R-Free) 0.1958
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3296
    Shell Resolution(Low) 3.5051
    Number of Reflections(R-Free) 175
    Number of Reflections(R-Work) 2899
    R-Factor(R-Work) 0.1749
    R-Factor(R-Free) 0.2054
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5051
    Shell Resolution(Low) 3.7247
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 2877
    R-Factor(R-Work) 0.1708
    R-Factor(R-Free) 0.2097
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7247
    Shell Resolution(Low) 4.0122
    Number of Reflections(R-Free) 170
    Number of Reflections(R-Work) 2888
    R-Factor(R-Work) 0.1675
    R-Factor(R-Free) 0.1839
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.0122
    Shell Resolution(Low) 4.4157
    Number of Reflections(R-Free) 157
    Number of Reflections(R-Work) 2964
    R-Factor(R-Work) 0.1568
    R-Factor(R-Free) 0.1948
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.4157
    Shell Resolution(Low) 5.0541
    Number of Reflections(R-Free) 161
    Number of Reflections(R-Work) 2974
    R-Factor(R-Work) 0.1525
    R-Factor(R-Free) 0.1905
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.0541
    Shell Resolution(Low) 6.3655
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 3000
    R-Factor(R-Work) 0.1932
    R-Factor(R-Free) 0.2649
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 6.3655
    Shell Resolution(Low) 49.6138
    Number of Reflections(R-Free) 162
    Number of Reflections(R-Work) 3082
    R-Factor(R-Work) 0.1856
    R-Factor(R-Free) 0.1985
    Percent Reflections(Observed) 97.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.004
    f_chiral_restr 0.061
    f_dihedral_angle_d 14.168
    f_angle_d 0.902
    f_bond_d 0.005
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 8722
    Nucleic Acid Atoms 0
    Heterogen Atoms 100
    Solvent Atoms 519
     
     
  •   Software and Computing Hide
    Computing
    Structure Solution PHASER
    Structure Refinement PHENIX (PHENIX.REFINE)
     
    Software
    refinement PHENIX version: (PHENIX.REFINE)
    model building PHASER