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X-RAY DIFFRACTION
Materials and Methods page
4BCK
  •   Crystallization Hide
    Crystallization Experiments
    pH 7
    Details COCRYSTALS WERE GROWN IN 1-1.25M AMMONIUM SULFATE, 0.5-0.9M KCL, 100MM HEPES, PH 7.0, 5MM DTT AND IN THE PRESENCE OF COMPOUND.
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 77.2 α = 90
    b = 140.37 β = 90
    c = 155.17 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type DIAMOND BEAMLINE I04
    Wavelength 0.98
    Site DIAMOND
    Beamline I04
     
     
  •   Refinement Data Hide
    Reflection Details
    Resolution(High) 2.05
    Resolution(Low) 29.86
    Number Reflections(Observed) 101828
    Percent Possible(Observed) 96.5
    R Merge I(Observed) 0.04
    B(Isotropic) From Wilson Plot 38.86
    Redundancy 3.74
     
    High Resolution Shell Details
    Resolution(High) 2.05
    Resolution(Low) 2.16
    Percent Possible(All) 83.6
    R Merge I(Observed) 0.54
    Mean I Over Sigma(Observed) 1.45
    Redundancy 2.94
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.052
    Resolution(Low) 29.863
    Cut-off Sigma(F) 1.34
    Number of Reflections(Observed) 101785
    Number of Reflections(R-Free) 5083
    Percent Reflections(Observed) 96.07
    R-Factor(Observed) 0.1954
    R-Work 0.1932
    R-Free 0.2358
     
    Temperature Factor Modeling
    Anisotropic B[1][1] -2.007
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 2.7655
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -0.7585
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0521
    Shell Resolution(Low) 2.0754
    Number of Reflections(R-Free) 110
    Number of Reflections(R-Work) 2288
    R-Factor(R-Work) 0.3217
    R-Factor(R-Free) 0.3747
    Percent Reflections(Observed) 69.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0754
    Shell Resolution(Low) 2.0998
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 2729
    R-Factor(R-Work) 0.3148
    R-Factor(R-Free) 0.3304
    Percent Reflections(Observed) 82.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0998
    Shell Resolution(Low) 2.1254
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2879
    R-Factor(R-Work) 0.2965
    R-Factor(R-Free) 0.343
    Percent Reflections(Observed) 86.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1254
    Shell Resolution(Low) 2.1523
    Number of Reflections(R-Free) 151
    Number of Reflections(R-Work) 2984
    R-Factor(R-Work) 0.2836
    R-Factor(R-Free) 0.3477
    Percent Reflections(Observed) 90.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1523
    Shell Resolution(Low) 2.1806
    Number of Reflections(R-Free) 152
    Number of Reflections(R-Work) 3098
    R-Factor(R-Work) 0.2709
    R-Factor(R-Free) 0.3179
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1806
    Shell Resolution(Low) 2.2105
    Number of Reflections(R-Free) 195
    Number of Reflections(R-Work) 3229
    R-Factor(R-Work) 0.2487
    R-Factor(R-Free) 0.296
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2105
    Shell Resolution(Low) 2.2421
    Number of Reflections(R-Free) 167
    Number of Reflections(R-Work) 3293
    R-Factor(R-Work) 0.2381
    R-Factor(R-Free) 0.2942
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2421
    Shell Resolution(Low) 2.2755
    Number of Reflections(R-Free) 184
    Number of Reflections(R-Work) 3339
    R-Factor(R-Work) 0.2259
    R-Factor(R-Free) 0.2677
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2755
    Shell Resolution(Low) 2.3111
    Number of Reflections(R-Free) 163
    Number of Reflections(R-Work) 3280
    R-Factor(R-Work) 0.2184
    R-Factor(R-Free) 0.2876
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3111
    Shell Resolution(Low) 2.3489
    Number of Reflections(R-Free) 188
    Number of Reflections(R-Work) 3332
    R-Factor(R-Work) 0.2209
    R-Factor(R-Free) 0.2966
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3489
    Shell Resolution(Low) 2.3894
    Number of Reflections(R-Free) 212
    Number of Reflections(R-Work) 3240
    R-Factor(R-Work) 0.2061
    R-Factor(R-Free) 0.2954
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3894
    Shell Resolution(Low) 2.4329
    Number of Reflections(R-Free) 157
    Number of Reflections(R-Work) 3343
    R-Factor(R-Work) 0.1991
    R-Factor(R-Free) 0.2417
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4329
    Shell Resolution(Low) 2.4796
    Number of Reflections(R-Free) 182
    Number of Reflections(R-Work) 3312
    R-Factor(R-Work) 0.1913
    R-Factor(R-Free) 0.2273
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4796
    Shell Resolution(Low) 2.5302
    Number of Reflections(R-Free) 156
    Number of Reflections(R-Work) 3314
    R-Factor(R-Work) 0.1949
    R-Factor(R-Free) 0.2556
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5302
    Shell Resolution(Low) 2.5852
    Number of Reflections(R-Free) 191
    Number of Reflections(R-Work) 3357
    R-Factor(R-Work) 0.2004
    R-Factor(R-Free) 0.2385
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5852
    Shell Resolution(Low) 2.6453
    Number of Reflections(R-Free) 163
    Number of Reflections(R-Work) 3319
    R-Factor(R-Work) 0.2107
    R-Factor(R-Free) 0.2473
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6453
    Shell Resolution(Low) 2.7114
    Number of Reflections(R-Free) 174
    Number of Reflections(R-Work) 3333
    R-Factor(R-Work) 0.2195
    R-Factor(R-Free) 0.2738
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7114
    Shell Resolution(Low) 2.7847
    Number of Reflections(R-Free) 172
    Number of Reflections(R-Work) 3313
    R-Factor(R-Work) 0.2225
    R-Factor(R-Free) 0.2766
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7847
    Shell Resolution(Low) 2.8666
    Number of Reflections(R-Free) 179
    Number of Reflections(R-Work) 3344
    R-Factor(R-Work) 0.2232
    R-Factor(R-Free) 0.2583
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8666
    Shell Resolution(Low) 2.959
    Number of Reflections(R-Free) 166
    Number of Reflections(R-Work) 3319
    R-Factor(R-Work) 0.2154
    R-Factor(R-Free) 0.2863
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.959
    Shell Resolution(Low) 3.0647
    Number of Reflections(R-Free) 165
    Number of Reflections(R-Work) 3341
    R-Factor(R-Work) 0.2226
    R-Factor(R-Free) 0.2666
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0647
    Shell Resolution(Low) 3.1872
    Number of Reflections(R-Free) 188
    Number of Reflections(R-Work) 3307
    R-Factor(R-Work) 0.2238
    R-Factor(R-Free) 0.259
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1872
    Shell Resolution(Low) 3.3321
    Number of Reflections(R-Free) 188
    Number of Reflections(R-Work) 3339
    R-Factor(R-Work) 0.2149
    R-Factor(R-Free) 0.2648
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3321
    Shell Resolution(Low) 3.5075
    Number of Reflections(R-Free) 157
    Number of Reflections(R-Work) 3314
    R-Factor(R-Work) 0.1942
    R-Factor(R-Free) 0.2447
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5075
    Shell Resolution(Low) 3.7269
    Number of Reflections(R-Free) 170
    Number of Reflections(R-Work) 3311
    R-Factor(R-Work) 0.1784
    R-Factor(R-Free) 0.2262
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7269
    Shell Resolution(Low) 4.014
    Number of Reflections(R-Free) 173
    Number of Reflections(R-Work) 3299
    R-Factor(R-Work) 0.1676
    R-Factor(R-Free) 0.2172
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.014
    Shell Resolution(Low) 4.4168
    Number of Reflections(R-Free) 174
    Number of Reflections(R-Work) 3253
    R-Factor(R-Work) 0.1495
    R-Factor(R-Free) 0.1928
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.4168
    Shell Resolution(Low) 5.0533
    Number of Reflections(R-Free) 170
    Number of Reflections(R-Work) 3295
    R-Factor(R-Work) 0.1341
    R-Factor(R-Free) 0.182
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.0533
    Shell Resolution(Low) 6.3565
    Number of Reflections(R-Free) 165
    Number of Reflections(R-Work) 3309
    R-Factor(R-Work) 0.1714
    R-Factor(R-Free) 0.2043
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 6.3565
    Shell Resolution(Low) 29.8666
    Number of Reflections(R-Free) 188
    Number of Reflections(R-Work) 3289
    R-Factor(R-Work) 0.1855
    R-Factor(R-Free) 0.1827
    Percent Reflections(Observed) 92.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.007
    f_chiral_restr 0.113
    f_dihedral_angle_d 18.07
    f_angle_d 1.675
    f_bond_d 0.023
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 8887
    Nucleic Acid Atoms 0
    Heterogen Atoms 60
    Solvent Atoms 629
     
     
  •   Software and Computing Hide
    Computing
    Structure Solution PHASER
    Structure Refinement PHENIX (PHENIX.REFINE)
     
    Software
    refinement PHENIX version: (PHENIX.REFINE)
    model building PHASER