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X-RAY DIFFRACTION
Materials and Methods page
4BC1
  •   Crystallization Hide
    Crystallization Experiments
    pH 7.4
    Details 0.1 M TRIS HCL BUFFER PH 7.4, 1.6 M AMMONIUM SULFATE
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 135.54 α = 90
    b = 173.25 β = 90
    c = 224.94 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD (QUANTUM 315R)
    Type ADSC
    Collection Date 2010-04-15
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type ESRF BEAMLINE ID14-4
    Wavelength 0.9765
    Site ESRF
    Beamline ID14-4
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) -3.0
    Resolution(High) 2.95
    Resolution(Low) 48.3
    Number Reflections(Observed) 111473
    Percent Possible(Observed) 99.7
    R Merge I(Observed) 0.08
    B(Isotropic) From Wilson Plot 63.89
    Redundancy 4.5
     
    High Resolution Shell Details
    Resolution(High) 2.95
    Resolution(Low) 3.0
    Percent Possible(All) 99.4
    R Merge I(Observed) 0.53
    Mean I Over Sigma(Observed) 3.1
    Redundancy 4.5
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.95
    Resolution(Low) 48.285
    Cut-off Sigma(F) 1.36
    Number of Reflections(Observed) 111450
    Number of Reflections(R-Free) 3344
    Percent Reflections(Observed) 99.66
    R-Factor(Observed) 0.1879
    R-Work 0.1863
    R-Free 0.2378
     
    Temperature Factor Modeling
    Mean Isotropic B Value 46.8
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.95
    Shell Resolution(Low) 2.9921
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 4428
    R-Factor(R-Work) 0.3279
    R-Factor(R-Free) 0.3706
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9921
    Shell Resolution(Low) 3.0368
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 4434
    R-Factor(R-Work) 0.3245
    R-Factor(R-Free) 0.394
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0368
    Shell Resolution(Low) 3.0842
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 4470
    R-Factor(R-Work) 0.3061
    R-Factor(R-Free) 0.3756
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0842
    Shell Resolution(Low) 3.1348
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 4402
    R-Factor(R-Work) 0.2942
    R-Factor(R-Free) 0.3627
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1348
    Shell Resolution(Low) 3.1888
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 4456
    R-Factor(R-Work) 0.2896
    R-Factor(R-Free) 0.3721
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1888
    Shell Resolution(Low) 3.2468
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 4456
    R-Factor(R-Work) 0.2737
    R-Factor(R-Free) 0.3262
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2468
    Shell Resolution(Low) 3.3092
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 4477
    R-Factor(R-Work) 0.262
    R-Factor(R-Free) 0.3264
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3092
    Shell Resolution(Low) 3.3768
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 4441
    R-Factor(R-Work) 0.2493
    R-Factor(R-Free) 0.3
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3768
    Shell Resolution(Low) 3.4502
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 4481
    R-Factor(R-Work) 0.2331
    R-Factor(R-Free) 0.2892
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4502
    Shell Resolution(Low) 3.5304
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 4464
    R-Factor(R-Work) 0.2199
    R-Factor(R-Free) 0.2797
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5304
    Shell Resolution(Low) 3.6187
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 4486
    R-Factor(R-Work) 0.2014
    R-Factor(R-Free) 0.2493
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.6187
    Shell Resolution(Low) 3.7165
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 4481
    R-Factor(R-Work) 0.1943
    R-Factor(R-Free) 0.2733
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7165
    Shell Resolution(Low) 3.8258
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 4489
    R-Factor(R-Work) 0.1826
    R-Factor(R-Free) 0.2466
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.8258
    Shell Resolution(Low) 3.9492
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 4523
    R-Factor(R-Work) 0.1688
    R-Factor(R-Free) 0.2252
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.9492
    Shell Resolution(Low) 4.0903
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 4495
    R-Factor(R-Work) 0.1585
    R-Factor(R-Free) 0.2264
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.0903
    Shell Resolution(Low) 4.254
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 4515
    R-Factor(R-Work) 0.1521
    R-Factor(R-Free) 0.1975
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.254
    Shell Resolution(Low) 4.4475
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 4504
    R-Factor(R-Work) 0.1388
    R-Factor(R-Free) 0.1875
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.4475
    Shell Resolution(Low) 4.6818
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 4544
    R-Factor(R-Work) 0.1324
    R-Factor(R-Free) 0.1851
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.6818
    Shell Resolution(Low) 4.9748
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 4520
    R-Factor(R-Work) 0.131
    R-Factor(R-Free) 0.2069
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.9748
    Shell Resolution(Low) 5.3585
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 4548
    R-Factor(R-Work) 0.1432
    R-Factor(R-Free) 0.1946
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.3585
    Shell Resolution(Low) 5.8969
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 4547
    R-Factor(R-Work) 0.1431
    R-Factor(R-Free) 0.1888
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.8969
    Shell Resolution(Low) 6.7482
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 4581
    R-Factor(R-Work) 0.1587
    R-Factor(R-Free) 0.1911
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 6.7482
    Shell Resolution(Low) 8.4944
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 4599
    R-Factor(R-Work) 0.1563
    R-Factor(R-Free) 0.1991
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 8.4944
    Shell Resolution(Low) 48.2913
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 4765
    R-Factor(R-Work) 0.1872
    R-Factor(R-Free) 0.2008
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.007
    f_chiral_restr 0.085
    f_dihedral_angle_d 16.498
    f_angle_d 1.368
    f_bond_d 0.009
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 16791
    Nucleic Acid Atoms 0
    Heterogen Atoms 260
    Solvent Atoms 835
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) XSCALE
    Structure Solution MOLREP
    Structure Refinement PHENIX (PHENIX.REFINE: 1.8.1_1168)
     
    Software
    refinement PHENIX version: (PHENIX.REFINE: 1.8.1_1168)
    model building MOLREP