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X-RAY DIFFRACTION
Materials and Methods page
4BC0
  •   Crystallization Hide
    Crystallization Experiments
    pH 7.4
    Details 0.1 M TRIS HCL BUFFER PH 7.4, 1.6 M AMMONIUM SULFATE
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 136.94 α = 90
    b = 174.04 β = 90
    c = 225.62 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD (QUANTUM 315R)
    Type ADSC
    Collection Date 2010-04-15
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type ESRF BEAMLINE ID14-4
    Wavelength 0.9765
    Site ESRF
    Beamline ID14-4
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) -3.0
    Resolution(High) 3.35
    Resolution(Low) 48.6
    Number Reflections(Observed) 75488
    Percent Possible(Observed) 96.6
    R Merge I(Observed) 0.08
    Redundancy 3.5
     
    High Resolution Shell Details
    Resolution(High) 3.35
    Resolution(Low) 3.4
    Percent Possible(All) 98.6
    R Merge I(Observed) 0.58
    Mean I Over Sigma(Observed) 2.8
    Redundancy 3.4
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 3.35
    Resolution(Low) 48.615
    Cut-off Sigma(F) 1.36
    Number of Reflections(Observed) 75467
    Number of Reflections(R-Free) 2265
    Percent Reflections(Observed) 96.66
    R-Factor(Observed) 0.1631
    R-Work 0.1618
    R-Free 0.2076
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.35
    Shell Resolution(Low) 3.4228
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 4577
    R-Factor(R-Work) 0.3099
    R-Factor(R-Free) 0.3324
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4228
    Shell Resolution(Low) 3.5024
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 4587
    R-Factor(R-Work) 0.2724
    R-Factor(R-Free) 0.3306
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5024
    Shell Resolution(Low) 3.59
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 4602
    R-Factor(R-Work) 0.2434
    R-Factor(R-Free) 0.3231
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.59
    Shell Resolution(Low) 3.687
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 4591
    R-Factor(R-Work) 0.2201
    R-Factor(R-Free) 0.2878
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.687
    Shell Resolution(Low) 3.7955
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 4575
    R-Factor(R-Work) 0.1967
    R-Factor(R-Free) 0.2294
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7955
    Shell Resolution(Low) 3.9179
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 4575
    R-Factor(R-Work) 0.1796
    R-Factor(R-Free) 0.2341
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.9179
    Shell Resolution(Low) 4.0579
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 4611
    R-Factor(R-Work) 0.1588
    R-Factor(R-Free) 0.2154
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.0579
    Shell Resolution(Low) 4.2203
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 4556
    R-Factor(R-Work) 0.1478
    R-Factor(R-Free) 0.1801
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.2203
    Shell Resolution(Low) 4.4122
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 4605
    R-Factor(R-Work) 0.1311
    R-Factor(R-Free) 0.1661
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.4122
    Shell Resolution(Low) 4.6447
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 4553
    R-Factor(R-Work) 0.1188
    R-Factor(R-Free) 0.1639
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.6447
    Shell Resolution(Low) 4.9354
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 4565
    R-Factor(R-Work) 0.1146
    R-Factor(R-Free) 0.1708
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.9354
    Shell Resolution(Low) 5.3161
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 4555
    R-Factor(R-Work) 0.1199
    R-Factor(R-Free) 0.1512
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.3161
    Shell Resolution(Low) 5.8502
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 4574
    R-Factor(R-Work) 0.1284
    R-Factor(R-Free) 0.1845
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.8502
    Shell Resolution(Low) 6.6949
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 4547
    R-Factor(R-Work) 0.1481
    R-Factor(R-Free) 0.2121
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 6.6949
    Shell Resolution(Low) 8.4277
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 4523
    R-Factor(R-Work) 0.1525
    R-Factor(R-Free) 0.2013
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 8.4277
    Shell Resolution(Low) 48.6198
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 4606
    R-Factor(R-Work) 0.1725
    R-Factor(R-Free) 0.1997
    Percent Reflections(Observed) 92.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.008
    f_chiral_restr 0.108
    f_dihedral_angle_d 17.136
    f_angle_d 1.482
    f_bond_d 0.009
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 16806
    Nucleic Acid Atoms 0
    Heterogen Atoms 215
    Solvent Atoms 411
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) XSCALE
    Structure Solution MOLREP
    Structure Refinement PHENIX (PHENIX.REFINE: 1.8.1_1168)
     
    Software
    refinement PHENIX version: (PHENIX.REFINE: 1.8.1_1168)
    model building MOLREP