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X-RAY DIFFRACTION
Materials and Methods page
4BBS
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 222.17 α = 90
    b = 386.01 β = 90
    c = 254.47 γ = 90
     
    Space Group
    Space Group Name:    C 2 2 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector PIXEL
    Type PILATUS 6M
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type SLS BEAMLINE X06SA
    Wavelength 0.9188
    Site SLS
    Beamline X06SA
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 2.0
    Resolution(High) 3.6
    Resolution(Low) 50
    Number Reflections(Observed) 126022
    Percent Possible(Observed) 99.9
    R Merge I(Observed) 0.23
    B(Isotropic) From Wilson Plot 86.97
    Redundancy 7.5
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 3.6
    Resolution(Low) 49.273
    Cut-off Sigma(F) 1.99
    Number of Reflections(Observed) 125981
    Number of Reflections(R-Free) 2519
    Percent Reflections(Observed) 99.95
    R-Factor(Observed) 0.1855
    R-Work 0.1847
    R-Free 0.225
     
    Temperature Factor Modeling
    Anisotropic B[1][1] -8.364
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] -0.8756
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -12.6202
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5999
    Shell Resolution(Low) 3.6692
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 6800
    R-Factor(R-Work) 0.2982
    R-Factor(R-Free) 0.343
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.6692
    Shell Resolution(Low) 3.744
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 6784
    R-Factor(R-Work) 0.2769
    R-Factor(R-Free) 0.3054
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.744
    Shell Resolution(Low) 3.8254
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 6802
    R-Factor(R-Work) 0.2606
    R-Factor(R-Free) 0.3085
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.8254
    Shell Resolution(Low) 3.9144
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 6819
    R-Factor(R-Work) 0.2497
    R-Factor(R-Free) 0.2858
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.9144
    Shell Resolution(Low) 4.0122
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 6813
    R-Factor(R-Work) 0.2331
    R-Factor(R-Free) 0.2842
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.0122
    Shell Resolution(Low) 4.1206
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 6834
    R-Factor(R-Work) 0.2089
    R-Factor(R-Free) 0.238
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.1206
    Shell Resolution(Low) 4.2418
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 6773
    R-Factor(R-Work) 0.1879
    R-Factor(R-Free) 0.2427
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.2418
    Shell Resolution(Low) 4.3787
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 6845
    R-Factor(R-Work) 0.1692
    R-Factor(R-Free) 0.216
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.3787
    Shell Resolution(Low) 4.535
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 6826
    R-Factor(R-Work) 0.1477
    R-Factor(R-Free) 0.1951
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.535
    Shell Resolution(Low) 4.7165
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 6833
    R-Factor(R-Work) 0.1421
    R-Factor(R-Free) 0.1646
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.7165
    Shell Resolution(Low) 4.931
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 6835
    R-Factor(R-Work) 0.1433
    R-Factor(R-Free) 0.1758
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.931
    Shell Resolution(Low) 5.1907
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 6874
    R-Factor(R-Work) 0.1555
    R-Factor(R-Free) 0.2041
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.1907
    Shell Resolution(Low) 5.5155
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 6835
    R-Factor(R-Work) 0.1681
    R-Factor(R-Free) 0.209
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.5155
    Shell Resolution(Low) 5.9407
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 6884
    R-Factor(R-Work) 0.1808
    R-Factor(R-Free) 0.2254
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.9407
    Shell Resolution(Low) 6.5373
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 6898
    R-Factor(R-Work) 0.1877
    R-Factor(R-Free) 0.2378
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 6.5373
    Shell Resolution(Low) 7.4804
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 6899
    R-Factor(R-Work) 0.167
    R-Factor(R-Free) 0.2085
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 7.4804
    Shell Resolution(Low) 9.4138
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 6985
    R-Factor(R-Work) 0.1414
    R-Factor(R-Free) 0.1952
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 9.4138
    Shell Resolution(Low) 49.2778
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 7123
    R-Factor(R-Work) 0.1937
    R-Factor(R-Free) 0.211
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.004
    f_chiral_restr 0.075
    f_dihedral_angle_d 17.621
    f_angle_d 1.12
    f_bond_d 0.008
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 32797
    Nucleic Acid Atoms 612
    Heterogen Atoms 11
    Solvent Atoms 0
     
     
  •   Software and Computing Hide
    Computing
    Structure Refinement PHENIX (PHENIX.REFINE)
     
    Software
    refinement PHENIX version: (PHENIX.REFINE)