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X-RAY DIFFRACTION
Materials and Methods page
4BAX
  •   Crystallization Hide
    Crystallization Experiments
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 97.12 α = 90
    b = 113 β = 98.55
    c = 194.44 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD (MX-225)
    Type MARRESEARCH
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type SLS BEAMLINE X10SA
    Wavelength 1
    Site SLS
    Beamline X10SA
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 2.0
    Resolution(High) 2.55
    Resolution(Low) 25
    Number Reflections(Observed) 134887
    Percent Possible(Observed) 99.6
    R Merge I(Observed) 0.09
    Redundancy 3.8
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.55
    Resolution(Low) 24.996
    Cut-off Sigma(F) 1.36
    Number of Reflections(Observed) 134887
    Number of Reflections(R-Free) 6741
    Percent Reflections(Observed) 99.64
    R-Factor(Observed) 0.2076
    R-Work 0.206
    R-Free 0.2358
     
    Temperature Factor Modeling
    Anisotropic B[1][1] -4.7082
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] -1.3655
    Anisotropic B[2][2] 3.2116
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 1.4966
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.55
    Shell Resolution(Low) 2.5789
    Number of Reflections(R-Free) 223
    Number of Reflections(R-Work) 4245
    R-Factor(R-Work) 0.3327
    R-Factor(R-Free) 0.3481
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5789
    Shell Resolution(Low) 2.6093
    Number of Reflections(R-Free) 226
    Number of Reflections(R-Work) 4284
    R-Factor(R-Work) 0.3048
    R-Factor(R-Free) 0.346
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6093
    Shell Resolution(Low) 2.641
    Number of Reflections(R-Free) 223
    Number of Reflections(R-Work) 4240
    R-Factor(R-Work) 0.2973
    R-Factor(R-Free) 0.324
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.641
    Shell Resolution(Low) 2.6744
    Number of Reflections(R-Free) 225
    Number of Reflections(R-Work) 4271
    R-Factor(R-Work) 0.2958
    R-Factor(R-Free) 0.3419
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6744
    Shell Resolution(Low) 2.7096
    Number of Reflections(R-Free) 226
    Number of Reflections(R-Work) 4301
    R-Factor(R-Work) 0.2836
    R-Factor(R-Free) 0.304
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7096
    Shell Resolution(Low) 2.7467
    Number of Reflections(R-Free) 221
    Number of Reflections(R-Work) 4197
    R-Factor(R-Work) 0.2753
    R-Factor(R-Free) 0.3069
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7467
    Shell Resolution(Low) 2.7859
    Number of Reflections(R-Free) 225
    Number of Reflections(R-Work) 4283
    R-Factor(R-Work) 0.2748
    R-Factor(R-Free) 0.2995
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7859
    Shell Resolution(Low) 2.8274
    Number of Reflections(R-Free) 223
    Number of Reflections(R-Work) 4238
    R-Factor(R-Work) 0.2625
    R-Factor(R-Free) 0.3098
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8274
    Shell Resolution(Low) 2.8715
    Number of Reflections(R-Free) 226
    Number of Reflections(R-Work) 4294
    R-Factor(R-Work) 0.2509
    R-Factor(R-Free) 0.2795
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8715
    Shell Resolution(Low) 2.9185
    Number of Reflections(R-Free) 226
    Number of Reflections(R-Work) 4289
    R-Factor(R-Work) 0.2455
    R-Factor(R-Free) 0.2864
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9185
    Shell Resolution(Low) 2.9688
    Number of Reflections(R-Free) 222
    Number of Reflections(R-Work) 4215
    R-Factor(R-Work) 0.2342
    R-Factor(R-Free) 0.2531
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9688
    Shell Resolution(Low) 3.0226
    Number of Reflections(R-Free) 225
    Number of Reflections(R-Work) 4275
    R-Factor(R-Work) 0.242
    R-Factor(R-Free) 0.2826
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0226
    Shell Resolution(Low) 3.0807
    Number of Reflections(R-Free) 224
    Number of Reflections(R-Work) 4254
    R-Factor(R-Work) 0.2435
    R-Factor(R-Free) 0.2776
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0807
    Shell Resolution(Low) 3.1434
    Number of Reflections(R-Free) 226
    Number of Reflections(R-Work) 4306
    R-Factor(R-Work) 0.2325
    R-Factor(R-Free) 0.2716
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1434
    Shell Resolution(Low) 3.2117
    Number of Reflections(R-Free) 224
    Number of Reflections(R-Work) 4251
    R-Factor(R-Work) 0.2259
    R-Factor(R-Free) 0.2604
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2117
    Shell Resolution(Low) 3.2862
    Number of Reflections(R-Free) 225
    Number of Reflections(R-Work) 4278
    R-Factor(R-Work) 0.2174
    R-Factor(R-Free) 0.2496
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2862
    Shell Resolution(Low) 3.3682
    Number of Reflections(R-Free) 224
    Number of Reflections(R-Work) 4256
    R-Factor(R-Work) 0.2109
    R-Factor(R-Free) 0.2355
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3682
    Shell Resolution(Low) 3.459
    Number of Reflections(R-Free) 228
    Number of Reflections(R-Work) 4330
    R-Factor(R-Work) 0.2056
    R-Factor(R-Free) 0.2516
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.459
    Shell Resolution(Low) 3.5606
    Number of Reflections(R-Free) 223
    Number of Reflections(R-Work) 4232
    R-Factor(R-Work) 0.2122
    R-Factor(R-Free) 0.2631
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5606
    Shell Resolution(Low) 3.6751
    Number of Reflections(R-Free) 224
    Number of Reflections(R-Work) 4251
    R-Factor(R-Work) 0.2069
    R-Factor(R-Free) 0.2575
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.6751
    Shell Resolution(Low) 3.8061
    Number of Reflections(R-Free) 225
    Number of Reflections(R-Work) 4279
    R-Factor(R-Work) 0.1967
    R-Factor(R-Free) 0.2324
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.8061
    Shell Resolution(Low) 3.9579
    Number of Reflections(R-Free) 225
    Number of Reflections(R-Work) 4282
    R-Factor(R-Work) 0.181
    R-Factor(R-Free) 0.2013
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.9579
    Shell Resolution(Low) 4.1372
    Number of Reflections(R-Free) 224
    Number of Reflections(R-Work) 4256
    R-Factor(R-Work) 0.16
    R-Factor(R-Free) 0.1704
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.1372
    Shell Resolution(Low) 4.3543
    Number of Reflections(R-Free) 225
    Number of Reflections(R-Work) 4281
    R-Factor(R-Work) 0.1506
    R-Factor(R-Free) 0.1713
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.3543
    Shell Resolution(Low) 4.6255
    Number of Reflections(R-Free) 224
    Number of Reflections(R-Work) 4254
    R-Factor(R-Work) 0.1493
    R-Factor(R-Free) 0.1695
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.6255
    Shell Resolution(Low) 4.98
    Number of Reflections(R-Free) 224
    Number of Reflections(R-Work) 4256
    R-Factor(R-Work) 0.1586
    R-Factor(R-Free) 0.1717
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.98
    Shell Resolution(Low) 5.4764
    Number of Reflections(R-Free) 224
    Number of Reflections(R-Work) 4271
    R-Factor(R-Work) 0.1724
    R-Factor(R-Free) 0.1946
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.4764
    Shell Resolution(Low) 6.258
    Number of Reflections(R-Free) 224
    Number of Reflections(R-Work) 4283
    R-Factor(R-Work) 0.1971
    R-Factor(R-Free) 0.2188
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 6.258
    Shell Resolution(Low) 7.8438
    Number of Reflections(R-Free) 227
    Number of Reflections(R-Work) 4308
    R-Factor(R-Work) 0.1891
    R-Factor(R-Free) 0.2199
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 7.8438
    Shell Resolution(Low) 24.9969
    Number of Reflections(R-Free) 230
    Number of Reflections(R-Work) 4386
    R-Factor(R-Work) 0.1655
    R-Factor(R-Free) 0.1974
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.009
    f_chiral_restr 0.089
    f_dihedral_angle_d 15.482
    f_angle_d 1.321
    f_bond_d 0.01
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 26270
    Nucleic Acid Atoms 0
    Heterogen Atoms 8
    Solvent Atoms 1076
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) XSCALE
    Structure Solution MOLREP
    Structure Refinement PHENIX (PHENIX.REFINE)
     
    Software
    refinement PHENIX version: (PHENIX.REFINE)
    model building MOLREP