X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
pH 4.6
Details 0.1 M SODIUM ACETATE PH 4.6, 0.4-1.5 M SODIUM CHLORIDE, 0.00067 M PROTEIN, 0.012 M LANTHANIDE COMPLEX, 293 K, 3-7 DAYS

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 77.51 α = 90
b = 77.51 β = 90
c = 38.48 γ = 90
Symmetry
Space Group P 43 21 2

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD (QUANTUM 315R) ADSC MIRRORS 2010-07-01
Diffraction Radiation
Monochromator Protocol
EITHER 111 OR 311 SILICON SINGLE CRISTALS MAD
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ESRF BEAMLINE BM30A -- ESRF BM30A

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.21 38.75 99.7 0.05 -- -- 7.6 -- 36469 -- 3.0 10.84
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.21 1.27 98.8 0.6 -- 1.3 7.2 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MAD 1.207 38.755 -- 1.35 -- 36424 1823 99.59 -- 0.1591 0.1581 0.1783 --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.2071 1.2397 -- 136 2576 0.2342 0.2749 -- 98.0
X Ray Diffraction 1.2397 1.2762 -- 138 2627 0.2115 0.1922 -- 100.0
X Ray Diffraction 1.2762 1.3174 -- 138 2620 0.1867 0.2059 -- 100.0
X Ray Diffraction 1.3174 1.3645 -- 138 2625 0.1784 0.2069 -- 100.0
X Ray Diffraction 1.3645 1.4191 -- 139 2649 0.1611 0.2138 -- 100.0
X Ray Diffraction 1.4191 1.4837 -- 138 2629 0.1464 0.1596 -- 100.0
X Ray Diffraction 1.4837 1.562 -- 140 2646 0.1367 0.1625 -- 100.0
X Ray Diffraction 1.562 1.6598 -- 141 2666 0.1349 0.1545 -- 100.0
X Ray Diffraction 1.6598 1.788 -- 139 2660 0.1329 0.1882 -- 100.0
X Ray Diffraction 1.788 1.9679 -- 141 2674 0.1405 0.1871 -- 100.0
X Ray Diffraction 1.9679 2.2526 -- 143 2698 0.1438 0.1642 -- 100.0
X Ray Diffraction 2.2526 2.838 -- 142 2724 0.1551 0.1816 -- 100.0
X Ray Diffraction 2.838 38.7745 -- 150 2807 0.1707 0.1692 -- 97.0
Temperature Factor Modeling
Temperature Factor Value
Mean Isotropic B 13.35
Anisotropic B[1][1] 0.073
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] 0.0
Anisotropic B[2][2] 0.073
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] -0.1459
RMS Deviations
Key Refinement Restraint Deviation
f_plane_restr 0.005
f_chiral_restr 0.088
f_dihedral_angle_d 25.572
f_angle_d 1.252
f_bond_d 0.008
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 1000
Nucleic Acid Atoms 0
Heterogen Atoms 87
Solvent Atoms 146

Software

Computing
Computing Package Purpose
XDS, VERSION JANUARY 30, 2009 Data Reduction (intensity integration)
SCALA, VERSION 3.3.16 Data Reduction (data scaling)
SHARP Structure Solution
PHENIX (PHENIX.REFINE) Structure Refinement
Software
Software Name Purpose
PHENIX version: (PHENIX.REFINE) refinement
SHARP model building