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X-RAY DIFFRACTION
Materials and Methods page
4BAL
  •   Crystallization Hide
    Crystallization Experiments
    pH 6.5
    Details 0.1 M BIS-TRIS PROPANE PH 6.5, 0.3-0.9 SODIUM POTASSIUM TARTRATE, 0.0006 M PROTEIN, 0.010 M LANTHANIDE COMPLEX, 293 K, 5 DAYS
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 57.99 α = 90
    b = 57.99 β = 90
    c = 150.18 γ = 90
     
    Space Group
    Space Group Name:    P 41 21 2
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD (QUANTUM 315R)
    Type ADSC
    Details MIRRORS
    Collection Date 2010-11-27
     
    Diffraction Radiation
    Monochromator EITHER 111 OR 311 SILICON SINGLE CRISTALS
    Diffraction Protocol MAD
     
    Diffraction Source
    Source SYNCHROTRON
    Type ESRF BEAMLINE BM30A
    Wavelength 0.979
    Site ESRF
    Beamline BM30A
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 3.0
    Resolution(High) 1.3
    Resolution(Low) 45.9
    Number Reflections(Observed) 64239
    Percent Possible(Observed) 99.9
    R Merge I(Observed) 0.05
    B(Isotropic) From Wilson Plot 10.0
    Redundancy 6.6
     
    High Resolution Shell Details
    Resolution(High) 1.3
    Resolution(Low) 1.37
    Percent Possible(All) 99.4
    R Merge I(Observed) 0.45
    Mean I Over Sigma(Observed) 1.7
    Redundancy 6.5
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.298
    Resolution(Low) 28.994
    Cut-off Sigma(F) 1.34
    Number of Reflections(Observed) 64138
    Number of Reflections(R-Free) 3207
    Percent Reflections(Observed) 99.88
    R-Factor(Observed) 0.1362
    R-Work 0.135
    R-Free 0.1574
     
    Temperature Factor Modeling
    Mean Isotropic B Value 11.9
    Anisotropic B[1][1] 0.3483
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 0.3483
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -0.6966
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.2983
    Shell Resolution(Low) 1.3177
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 2554
    R-Factor(R-Work) 0.1946
    R-Factor(R-Free) 0.2113
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.3177
    Shell Resolution(Low) 1.3382
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 2599
    R-Factor(R-Work) 0.1711
    R-Factor(R-Free) 0.2226
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.3382
    Shell Resolution(Low) 1.3602
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 2592
    R-Factor(R-Work) 0.1666
    R-Factor(R-Free) 0.1853
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.3602
    Shell Resolution(Low) 1.3836
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 2620
    R-Factor(R-Work) 0.1488
    R-Factor(R-Free) 0.1772
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.3836
    Shell Resolution(Low) 1.4088
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 2599
    R-Factor(R-Work) 0.1415
    R-Factor(R-Free) 0.1857
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.4088
    Shell Resolution(Low) 1.4359
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 2611
    R-Factor(R-Work) 0.1303
    R-Factor(R-Free) 0.1506
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.4359
    Shell Resolution(Low) 1.4652
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2621
    R-Factor(R-Work) 0.1215
    R-Factor(R-Free) 0.157
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.4652
    Shell Resolution(Low) 1.4971
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 2599
    R-Factor(R-Work) 0.1129
    R-Factor(R-Free) 0.1578
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.4971
    Shell Resolution(Low) 1.5319
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2628
    R-Factor(R-Work) 0.1086
    R-Factor(R-Free) 0.149
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5319
    Shell Resolution(Low) 1.5702
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2637
    R-Factor(R-Work) 0.1028
    R-Factor(R-Free) 0.1177
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5702
    Shell Resolution(Low) 1.6126
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2617
    R-Factor(R-Work) 0.0961
    R-Factor(R-Free) 0.1238
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6126
    Shell Resolution(Low) 1.6601
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2633
    R-Factor(R-Work) 0.0999
    R-Factor(R-Free) 0.1456
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6601
    Shell Resolution(Low) 1.7137
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2624
    R-Factor(R-Work) 0.0994
    R-Factor(R-Free) 0.1268
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7137
    Shell Resolution(Low) 1.7749
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2627
    R-Factor(R-Work) 0.1046
    R-Factor(R-Free) 0.1352
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7749
    Shell Resolution(Low) 1.846
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2630
    R-Factor(R-Work) 0.1089
    R-Factor(R-Free) 0.1473
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.846
    Shell Resolution(Low) 1.93
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2660
    R-Factor(R-Work) 0.1103
    R-Factor(R-Free) 0.1305
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.93
    Shell Resolution(Low) 2.0317
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2649
    R-Factor(R-Work) 0.1101
    R-Factor(R-Free) 0.1068
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0317
    Shell Resolution(Low) 2.1589
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2687
    R-Factor(R-Work) 0.1209
    R-Factor(R-Free) 0.1551
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1589
    Shell Resolution(Low) 2.3256
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2669
    R-Factor(R-Work) 0.1246
    R-Factor(R-Free) 0.1474
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3256
    Shell Resolution(Low) 2.5595
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2689
    R-Factor(R-Work) 0.1427
    R-Factor(R-Free) 0.1568
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5595
    Shell Resolution(Low) 2.9295
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 2719
    R-Factor(R-Work) 0.1525
    R-Factor(R-Free) 0.1835
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9295
    Shell Resolution(Low) 3.6897
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 2749
    R-Factor(R-Work) 0.1519
    R-Factor(R-Free) 0.161
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.6897
    Shell Resolution(Low) 29.0012
    Number of Reflections(R-Free) 154
    Number of Reflections(R-Work) 2918
    R-Factor(R-Work) 0.1699
    R-Factor(R-Free) 0.1839
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.007
    f_chiral_restr 0.083
    f_dihedral_angle_d 21.42
    f_angle_d 1.268
    f_bond_d 0.01
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 1551
    Nucleic Acid Atoms 0
    Heterogen Atoms 58
    Solvent Atoms 376
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) XDS, VERSION JANUARY 30, 2009
    Data Reduction (data scaling) SCALA, VERSION 3.3.16
    Structure Solution PHASER
    Structure Refinement PHENIX (PHENIX.REFINE)
     
    Software
    refinement PHENIX version: (PHENIX.REFINE)
    model building PHASER