POP-OUT | CLOSE
 
X-RAY DIFFRACTION
Materials and Methods page
4BA0
  •   Crystallization Hide
    Crystallization Experiments
    Details 1.8 M AMMONIUM SULFATE, 0.1 M HEPES (PH7.0), 2% PEG400
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 197.23 α = 90
    b = 197.23 β = 90
    c = 103.06 γ = 120
     
    Space Group
    Space Group Name:    P 6 2 2
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD (QUANTUM 315R)
    Type ADSC
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type ESRF BEAMLINE ID29
    Wavelength 1
    Site ESRF
    Beamline ID29
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 1.85
    Resolution(Low) 44.48
    Number Reflections(Observed) 100216
    Percent Possible(Observed) 100.0
    R Merge I(Observed) 0.1
    B(Isotropic) From Wilson Plot 21.2
    Redundancy 20.8
     
    High Resolution Shell Details
    Resolution(High) 1.85
    Resolution(Low) 1.95
    Percent Possible(All) 100.0
    R Merge I(Observed) 0.52
    Mean I Over Sigma(Observed) 5.9
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.85
    Resolution(Low) 44.479
    Cut-off Sigma(F) 1.34
    Number of Reflections(Observed) 100216
    Number of Reflections(R-Free) 5007
    Percent Reflections(Observed) 99.98
    R-Factor(Observed) 0.1684
    R-Work 0.1671
    R-Free 0.1932
     
    Temperature Factor Modeling
    Anisotropic B[1][1] -4.0845
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] -4.0845
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 8.1689
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.85
    Shell Resolution(Low) 1.9161
    Number of Reflections(R-Free) 456
    Number of Reflections(R-Work) 9424
    R-Factor(R-Work) 0.1926
    R-Factor(R-Free) 0.2345
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9161
    Shell Resolution(Low) 1.9928
    Number of Reflections(R-Free) 517
    Number of Reflections(R-Work) 9375
    R-Factor(R-Work) 0.1801
    R-Factor(R-Free) 0.2144
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9928
    Shell Resolution(Low) 2.0835
    Number of Reflections(R-Free) 528
    Number of Reflections(R-Work) 9374
    R-Factor(R-Work) 0.1753
    R-Factor(R-Free) 0.2088
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0835
    Shell Resolution(Low) 2.1934
    Number of Reflections(R-Free) 477
    Number of Reflections(R-Work) 9455
    R-Factor(R-Work) 0.1782
    R-Factor(R-Free) 0.2147
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1934
    Shell Resolution(Low) 2.3308
    Number of Reflections(R-Free) 495
    Number of Reflections(R-Work) 9419
    R-Factor(R-Work) 0.1716
    R-Factor(R-Free) 0.2131
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3308
    Shell Resolution(Low) 2.5107
    Number of Reflections(R-Free) 487
    Number of Reflections(R-Work) 9477
    R-Factor(R-Work) 0.1725
    R-Factor(R-Free) 0.2132
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5107
    Shell Resolution(Low) 2.7634
    Number of Reflections(R-Free) 527
    Number of Reflections(R-Work) 9473
    R-Factor(R-Work) 0.1705
    R-Factor(R-Free) 0.1969
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7634
    Shell Resolution(Low) 3.1632
    Number of Reflections(R-Free) 502
    Number of Reflections(R-Work) 9546
    R-Factor(R-Work) 0.1875
    R-Factor(R-Free) 0.216
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1632
    Shell Resolution(Low) 3.9848
    Number of Reflections(R-Free) 514
    Number of Reflections(R-Work) 9634
    R-Factor(R-Work) 0.1535
    R-Factor(R-Free) 0.1679
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.9848
    Shell Resolution(Low) 44.4918
    Number of Reflections(R-Free) 504
    Number of Reflections(R-Work) 10032
    R-Factor(R-Work) 0.1494
    R-Factor(R-Free) 0.1664
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.005
    f_chiral_restr 0.077
    f_dihedral_angle_d 15.282
    f_angle_d 1.072
    f_bond_d 0.006
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 6167
    Nucleic Acid Atoms 0
    Heterogen Atoms 80
    Solvent Atoms 557
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) MOSFLM
    Data Reduction (data scaling) SCALEPACK
    Structure Solution MOLREP
    Structure Refinement PHENIX (PHENIX.REFINE)
     
    Software
    refinement PHENIX version: (PHENIX.REFINE)
    model building MOLREP