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X-RAY DIFFRACTION
Materials and Methods page
4B9Y
  •   Crystallization Hide
    Crystallization Experiments
    Details 1.8 M AMMONIUM SULFATE, 0.1 M HEPES (PH7.0), 2% PEG400
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 197.33 α = 90
    b = 197.33 β = 90
    c = 103.03 γ = 120
     
    Space Group
    Space Group Name:    P 6 2 2
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type DIAMOND BEAMLINE I02
    Wavelength 1
    Site DIAMOND
    Beamline I02
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 1.9
    Resolution(Low) 49.3
    Number Reflections(Observed) 92667
    Percent Possible(Observed) 100.0
    R Merge I(Observed) 0.1
    B(Isotropic) From Wilson Plot 22.54
    Redundancy 22.0
     
    High Resolution Shell Details
    Resolution(High) 1.9
    Resolution(Low) 2.0
    Percent Possible(All) 100.0
    R Merge I(Observed) 0.52
    Mean I Over Sigma(Observed) 6.0
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method SAD
    reflnsShellList 1.9
    Resolution(Low) 49.324
    Cut-off Sigma(F) 0.0
    Number of Reflections(Observed) 92667
    Number of Reflections(R-Free) 4639
    Percent Reflections(Observed) 99.99
    R-Factor(Observed) 0.1641
    R-Work 0.1627
    R-Free 0.191
     
    Temperature Factor Modeling
    Anisotropic B[1][1] -3.1167
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] -3.1167
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 6.2335
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9
    Shell Resolution(Low) 1.9216
    Number of Reflections(R-Free) 171
    Number of Reflections(R-Work) 2841
    R-Factor(R-Work) 0.2077
    R-Factor(R-Free) 0.2554
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9216
    Shell Resolution(Low) 1.9442
    Number of Reflections(R-Free) 156
    Number of Reflections(R-Work) 2906
    R-Factor(R-Work) 0.1906
    R-Factor(R-Free) 0.24
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9442
    Shell Resolution(Low) 1.9679
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 2884
    R-Factor(R-Work) 0.1866
    R-Factor(R-Free) 0.2144
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9679
    Shell Resolution(Low) 1.9928
    Number of Reflections(R-Free) 150
    Number of Reflections(R-Work) 2902
    R-Factor(R-Work) 0.1717
    R-Factor(R-Free) 0.2205
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9928
    Shell Resolution(Low) 2.019
    Number of Reflections(R-Free) 156
    Number of Reflections(R-Work) 2893
    R-Factor(R-Work) 0.172
    R-Factor(R-Free) 0.2161
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.019
    Shell Resolution(Low) 2.0467
    Number of Reflections(R-Free) 159
    Number of Reflections(R-Work) 2889
    R-Factor(R-Work) 0.1604
    R-Factor(R-Free) 0.1987
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0467
    Shell Resolution(Low) 2.0759
    Number of Reflections(R-Free) 156
    Number of Reflections(R-Work) 2894
    R-Factor(R-Work) 0.1636
    R-Factor(R-Free) 0.1883
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0759
    Shell Resolution(Low) 2.1069
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 2909
    R-Factor(R-Work) 0.1599
    R-Factor(R-Free) 0.2252
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1069
    Shell Resolution(Low) 2.1398
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2904
    R-Factor(R-Work) 0.1675
    R-Factor(R-Free) 0.2196
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1398
    Shell Resolution(Low) 2.1749
    Number of Reflections(R-Free) 128
    Number of Reflections(R-Work) 2924
    R-Factor(R-Work) 0.1667
    R-Factor(R-Free) 0.2157
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1749
    Shell Resolution(Low) 2.2124
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2919
    R-Factor(R-Work) 0.1562
    R-Factor(R-Free) 0.2098
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2124
    Shell Resolution(Low) 2.2527
    Number of Reflections(R-Free) 168
    Number of Reflections(R-Work) 2892
    R-Factor(R-Work) 0.1599
    R-Factor(R-Free) 0.192
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2527
    Shell Resolution(Low) 2.296
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 2926
    R-Factor(R-Work) 0.156
    R-Factor(R-Free) 0.2064
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.296
    Shell Resolution(Low) 2.3429
    Number of Reflections(R-Free) 162
    Number of Reflections(R-Work) 2915
    R-Factor(R-Work) 0.1575
    R-Factor(R-Free) 0.185
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3429
    Shell Resolution(Low) 2.3938
    Number of Reflections(R-Free) 167
    Number of Reflections(R-Work) 2877
    R-Factor(R-Work) 0.1625
    R-Factor(R-Free) 0.1882
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3938
    Shell Resolution(Low) 2.4495
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2911
    R-Factor(R-Work) 0.1548
    R-Factor(R-Free) 0.1872
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4495
    Shell Resolution(Low) 2.5107
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 2947
    R-Factor(R-Work) 0.1693
    R-Factor(R-Free) 0.2168
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5107
    Shell Resolution(Low) 2.5786
    Number of Reflections(R-Free) 153
    Number of Reflections(R-Work) 2917
    R-Factor(R-Work) 0.1722
    R-Factor(R-Free) 0.209
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5786
    Shell Resolution(Low) 2.6545
    Number of Reflections(R-Free) 159
    Number of Reflections(R-Work) 2908
    R-Factor(R-Work) 0.1738
    R-Factor(R-Free) 0.2087
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6545
    Shell Resolution(Low) 2.7402
    Number of Reflections(R-Free) 157
    Number of Reflections(R-Work) 2935
    R-Factor(R-Work) 0.1778
    R-Factor(R-Free) 0.2
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7402
    Shell Resolution(Low) 2.8381
    Number of Reflections(R-Free) 177
    Number of Reflections(R-Work) 2902
    R-Factor(R-Work) 0.1812
    R-Factor(R-Free) 0.2226
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8381
    Shell Resolution(Low) 2.9517
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 2948
    R-Factor(R-Work) 0.1866
    R-Factor(R-Free) 0.2215
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9517
    Shell Resolution(Low) 3.086
    Number of Reflections(R-Free) 159
    Number of Reflections(R-Work) 2942
    R-Factor(R-Work) 0.1896
    R-Factor(R-Free) 0.227
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.086
    Shell Resolution(Low) 3.2487
    Number of Reflections(R-Free) 154
    Number of Reflections(R-Work) 2958
    R-Factor(R-Work) 0.1816
    R-Factor(R-Free) 0.2034
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2487
    Shell Resolution(Low) 3.4522
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 2961
    R-Factor(R-Work) 0.1715
    R-Factor(R-Free) 0.1926
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4522
    Shell Resolution(Low) 3.7186
    Number of Reflections(R-Free) 162
    Number of Reflections(R-Work) 2975
    R-Factor(R-Work) 0.1511
    R-Factor(R-Free) 0.1896
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7186
    Shell Resolution(Low) 4.0927
    Number of Reflections(R-Free) 160
    Number of Reflections(R-Work) 2972
    R-Factor(R-Work) 0.1339
    R-Factor(R-Free) 0.1562
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.0927
    Shell Resolution(Low) 4.6845
    Number of Reflections(R-Free) 158
    Number of Reflections(R-Work) 3018
    R-Factor(R-Work) 0.1182
    R-Factor(R-Free) 0.1314
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.6845
    Shell Resolution(Low) 5.9005
    Number of Reflections(R-Free) 164
    Number of Reflections(R-Work) 3037
    R-Factor(R-Work) 0.1366
    R-Factor(R-Free) 0.138
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.9005
    Shell Resolution(Low) 49.3402
    Number of Reflections(R-Free) 169
    Number of Reflections(R-Work) 3222
    R-Factor(R-Work) 0.1884
    R-Factor(R-Free) 0.2008
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.005
    f_chiral_restr 0.078
    f_dihedral_angle_d 12.987
    f_angle_d 1.064
    f_bond_d 0.007
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 6183
    Nucleic Acid Atoms 0
    Heterogen Atoms 93
    Solvent Atoms 647
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) MOSFLM
    Data Reduction (data scaling) SCALEPACK
    Structure Solution AUTOSHARP
    Structure Refinement PHENIX (PHENIX.REFINE)
     
    Software
    refinement PHENIX version: (PHENIX.REFINE)
    model building AUTOSHARP