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X-RAY DIFFRACTION
Materials and Methods page
4B9Q
  •   Crystallization Hide
    Crystallization Experiments
    pH 7.6
    Details 28% PEG4000, 5% GLYCEROL, 0.1 M AMMONIUM ACETATE, 0.085 M SODIUM CITRATE PH 5.6, 5 MM ATP, 10 MM MGCL2, 291 K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 202.33 α = 90
    b = 77.47 β = 101.71
    c = 182.96 γ = 90
     
    Space Group
    Space Group Name:    C 1 2 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC
    Collection Date 2011-11-07
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type ESRF BEAMLINE ID23-1
    Wavelength 0.9792
    Site ESRF
    Beamline ID23-1
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 2.4
    Resolution(Low) 59.72
    Number Reflections(Observed) 108374
    Percent Possible(Observed) 99.6
    R Merge I(Observed) 0.088
    B(Isotropic) From Wilson Plot 44.05
    Redundancy 3.2
     
    High Resolution Shell Details
    Resolution(High) 2.4
    Resolution(Low) 2.47
    Percent Possible(All) 100.0
    R Merge I(Observed) 0.49
    Mean I Over Sigma(Observed) 1.55
    Redundancy 3.2
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.4
    Resolution(Low) 59.717
    Cut-off Sigma(F) 0.46
    Number of Reflections(Observed) 108315
    Number of Reflections(R-Free) 5501
    Percent Reflections(Observed) 99.54
    R-Factor(Observed) 0.1986
    R-Work 0.1964
    R-Free 0.2387
     
    Temperature Factor Modeling
    Mean Isotropic B Value 70.6
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4
    Shell Resolution(Low) 2.4273
    Number of Reflections(R-Free) 177
    Number of Reflections(R-Work) 3408
    R-Factor(R-Work) 0.2942
    R-Factor(R-Free) 0.3554
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4273
    Shell Resolution(Low) 2.4558
    Number of Reflections(R-Free) 188
    Number of Reflections(R-Work) 3404
    R-Factor(R-Work) 0.2836
    R-Factor(R-Free) 0.3883
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4558
    Shell Resolution(Low) 2.4858
    Number of Reflections(R-Free) 172
    Number of Reflections(R-Work) 3454
    R-Factor(R-Work) 0.2774
    R-Factor(R-Free) 0.3462
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4858
    Shell Resolution(Low) 2.5172
    Number of Reflections(R-Free) 174
    Number of Reflections(R-Work) 3433
    R-Factor(R-Work) 0.263
    R-Factor(R-Free) 0.3326
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5172
    Shell Resolution(Low) 2.5504
    Number of Reflections(R-Free) 182
    Number of Reflections(R-Work) 3392
    R-Factor(R-Work) 0.2511
    R-Factor(R-Free) 0.3259
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5504
    Shell Resolution(Low) 2.5853
    Number of Reflections(R-Free) 178
    Number of Reflections(R-Work) 3465
    R-Factor(R-Work) 0.2367
    R-Factor(R-Free) 0.3226
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5853
    Shell Resolution(Low) 2.6222
    Number of Reflections(R-Free) 197
    Number of Reflections(R-Work) 3330
    R-Factor(R-Work) 0.2386
    R-Factor(R-Free) 0.2709
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6222
    Shell Resolution(Low) 2.6614
    Number of Reflections(R-Free) 197
    Number of Reflections(R-Work) 3456
    R-Factor(R-Work) 0.2311
    R-Factor(R-Free) 0.2959
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6614
    Shell Resolution(Low) 2.703
    Number of Reflections(R-Free) 176
    Number of Reflections(R-Work) 3425
    R-Factor(R-Work) 0.2272
    R-Factor(R-Free) 0.2939
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.703
    Shell Resolution(Low) 2.7473
    Number of Reflections(R-Free) 196
    Number of Reflections(R-Work) 3367
    R-Factor(R-Work) 0.2259
    R-Factor(R-Free) 0.3038
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7473
    Shell Resolution(Low) 2.7947
    Number of Reflections(R-Free) 177
    Number of Reflections(R-Work) 3443
    R-Factor(R-Work) 0.231
    R-Factor(R-Free) 0.2967
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7947
    Shell Resolution(Low) 2.8455
    Number of Reflections(R-Free) 173
    Number of Reflections(R-Work) 3462
    R-Factor(R-Work) 0.2271
    R-Factor(R-Free) 0.3237
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8455
    Shell Resolution(Low) 2.9002
    Number of Reflections(R-Free) 185
    Number of Reflections(R-Work) 3419
    R-Factor(R-Work) 0.2177
    R-Factor(R-Free) 0.2676
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9002
    Shell Resolution(Low) 2.9594
    Number of Reflections(R-Free) 171
    Number of Reflections(R-Work) 3429
    R-Factor(R-Work) 0.2163
    R-Factor(R-Free) 0.2755
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9594
    Shell Resolution(Low) 3.0237
    Number of Reflections(R-Free) 195
    Number of Reflections(R-Work) 3404
    R-Factor(R-Work) 0.2134
    R-Factor(R-Free) 0.3044
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0237
    Shell Resolution(Low) 3.0941
    Number of Reflections(R-Free) 190
    Number of Reflections(R-Work) 3463
    R-Factor(R-Work) 0.2066
    R-Factor(R-Free) 0.2574
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0941
    Shell Resolution(Low) 3.1715
    Number of Reflections(R-Free) 189
    Number of Reflections(R-Work) 3387
    R-Factor(R-Work) 0.219
    R-Factor(R-Free) 0.2883
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1715
    Shell Resolution(Low) 3.2572
    Number of Reflections(R-Free) 179
    Number of Reflections(R-Work) 3434
    R-Factor(R-Work) 0.2144
    R-Factor(R-Free) 0.2517
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2572
    Shell Resolution(Low) 3.353
    Number of Reflections(R-Free) 183
    Number of Reflections(R-Work) 3452
    R-Factor(R-Work) 0.2071
    R-Factor(R-Free) 0.2612
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.353
    Shell Resolution(Low) 3.4612
    Number of Reflections(R-Free) 180
    Number of Reflections(R-Work) 3405
    R-Factor(R-Work) 0.2015
    R-Factor(R-Free) 0.2558
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4612
    Shell Resolution(Low) 3.5849
    Number of Reflections(R-Free) 197
    Number of Reflections(R-Work) 3444
    R-Factor(R-Work) 0.1944
    R-Factor(R-Free) 0.2511
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5849
    Shell Resolution(Low) 3.7285
    Number of Reflections(R-Free) 172
    Number of Reflections(R-Work) 3424
    R-Factor(R-Work) 0.1796
    R-Factor(R-Free) 0.2009
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7285
    Shell Resolution(Low) 3.8981
    Number of Reflections(R-Free) 174
    Number of Reflections(R-Work) 3451
    R-Factor(R-Work) 0.1724
    R-Factor(R-Free) 0.1984
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.8981
    Shell Resolution(Low) 4.1036
    Number of Reflections(R-Free) 171
    Number of Reflections(R-Work) 3426
    R-Factor(R-Work) 0.1791
    R-Factor(R-Free) 0.1991
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.1036
    Shell Resolution(Low) 4.3606
    Number of Reflections(R-Free) 181
    Number of Reflections(R-Work) 3435
    R-Factor(R-Work) 0.1627
    R-Factor(R-Free) 0.191
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.3606
    Shell Resolution(Low) 4.6972
    Number of Reflections(R-Free) 183
    Number of Reflections(R-Work) 3426
    R-Factor(R-Work) 0.1581
    R-Factor(R-Free) 0.2114
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.6972
    Shell Resolution(Low) 5.1696
    Number of Reflections(R-Free) 178
    Number of Reflections(R-Work) 3450
    R-Factor(R-Work) 0.1635
    R-Factor(R-Free) 0.2287
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.1696
    Shell Resolution(Low) 5.9171
    Number of Reflections(R-Free) 206
    Number of Reflections(R-Work) 3430
    R-Factor(R-Work) 0.1751
    R-Factor(R-Free) 0.1902
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.9171
    Shell Resolution(Low) 7.4527
    Number of Reflections(R-Free) 180
    Number of Reflections(R-Work) 3457
    R-Factor(R-Work) 0.1984
    R-Factor(R-Free) 0.2094
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 7.4527
    Shell Resolution(Low) 59.7352
    Number of Reflections(R-Free) 200
    Number of Reflections(R-Work) 3439
    R-Factor(R-Work) 0.1832
    R-Factor(R-Free) 0.1861
    Percent Reflections(Observed) 96.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.005
    f_chiral_restr 0.066
    f_dihedral_angle_d 14.479
    f_angle_d 1.099
    f_bond_d 0.009
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 18118
    Nucleic Acid Atoms 0
    Heterogen Atoms 128
    Solvent Atoms 514
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) MOSFLM
    Data Reduction (data scaling) SCALA
    Structure Solution PHASER
    Structure Refinement PHENIX (PHENIX.REFINE: 1.8_1069)
     
    Software
    refinement PHENIX version: (PHENIX.REFINE: 1.8_1069)
    model building PHASER