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X-RAY DIFFRACTION
Materials and Methods page
4B8P
  •   Crystallization Hide
    Crystallization Experiments
    pH 7
    Details 0.1 M BIS-TRIS PROPANE PH 7.0, 15% PEG 3350, 0.2 M NDSB-221 AND 0.2 M NAF
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 62.42 α = 90
    b = 140.97 β = 89.98
    c = 73.17 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD (QUANTUM 315R)
    Type ADSC
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type AUSTRALIAN SYNCHROTRON BEAMLINE MX2
    Wavelength 0.9537
    Site AUSTRALIAN SYNCHROTRON
    Beamline MX2
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 2.0
    Resolution(High) 2.3
    Resolution(Low) 19.82
    Number Reflections(Observed) 55804
    Percent Possible(Observed) 99.5
    R Merge I(Observed) 0.15
    Redundancy 3.3
     
    High Resolution Shell Details
    Resolution(High) 2.3
    Resolution(Low) 19.82
    Percent Possible(All) 98.7
    R Merge I(Observed) 0.48
    Mean I Over Sigma(Observed) 2.0
    Redundancy 3.0
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.3
    Resolution(Low) 19.818
    Cut-off Sigma(F) 1.38
    Number of Reflections(Observed) 55640
    Number of Reflections(R-Free) 2848
    Percent Reflections(Observed) 99.38
    R-Factor(Observed) 0.1896
    R-Work 0.1888
    R-Free 0.2038
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3
    Shell Resolution(Low) 2.3396
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 2588
    R-Factor(R-Work) 0.2733
    R-Factor(R-Free) 0.2698
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3396
    Shell Resolution(Low) 2.3821
    Number of Reflections(R-Free) 119
    Number of Reflections(R-Work) 2589
    R-Factor(R-Work) 0.2638
    R-Factor(R-Free) 0.2388
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3821
    Shell Resolution(Low) 2.4278
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 2572
    R-Factor(R-Work) 0.2527
    R-Factor(R-Free) 0.3154
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4278
    Shell Resolution(Low) 2.4773
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2645
    R-Factor(R-Work) 0.2537
    R-Factor(R-Free) 0.2691
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4773
    Shell Resolution(Low) 2.531
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 2659
    R-Factor(R-Work) 0.2499
    R-Factor(R-Free) 0.288
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.531
    Shell Resolution(Low) 2.5898
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2603
    R-Factor(R-Work) 0.2421
    R-Factor(R-Free) 0.2876
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5898
    Shell Resolution(Low) 2.6544
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 2613
    R-Factor(R-Work) 0.2368
    R-Factor(R-Free) 0.2557
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6544
    Shell Resolution(Low) 2.7259
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 2644
    R-Factor(R-Work) 0.2234
    R-Factor(R-Free) 0.2122
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7259
    Shell Resolution(Low) 2.8059
    Number of Reflections(R-Free) 153
    Number of Reflections(R-Work) 2614
    R-Factor(R-Work) 0.2204
    R-Factor(R-Free) 0.228
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8059
    Shell Resolution(Low) 2.8962
    Number of Reflections(R-Free) 122
    Number of Reflections(R-Work) 2668
    R-Factor(R-Work) 0.2177
    R-Factor(R-Free) 0.2294
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8962
    Shell Resolution(Low) 2.9993
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 2671
    R-Factor(R-Work) 0.2202
    R-Factor(R-Free) 0.2363
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9993
    Shell Resolution(Low) 3.119
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 2647
    R-Factor(R-Work) 0.214
    R-Factor(R-Free) 0.2112
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.119
    Shell Resolution(Low) 3.2602
    Number of Reflections(R-Free) 157
    Number of Reflections(R-Work) 2609
    R-Factor(R-Work) 0.2104
    R-Factor(R-Free) 0.2385
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2602
    Shell Resolution(Low) 3.4312
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2664
    R-Factor(R-Work) 0.2042
    R-Factor(R-Free) 0.2357
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4312
    Shell Resolution(Low) 3.6448
    Number of Reflections(R-Free) 166
    Number of Reflections(R-Work) 2637
    R-Factor(R-Work) 0.1854
    R-Factor(R-Free) 0.177
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.6448
    Shell Resolution(Low) 3.9241
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2660
    R-Factor(R-Work) 0.1619
    R-Factor(R-Free) 0.1791
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.9241
    Shell Resolution(Low) 4.3149
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 2670
    R-Factor(R-Work) 0.1404
    R-Factor(R-Free) 0.1589
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.3149
    Shell Resolution(Low) 4.9301
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2662
    R-Factor(R-Work) 0.1337
    R-Factor(R-Free) 0.1834
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.9301
    Shell Resolution(Low) 6.1769
    Number of Reflections(R-Free) 160
    Number of Reflections(R-Work) 2663
    R-Factor(R-Work) 0.1628
    R-Factor(R-Free) 0.1705
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 6.1769
    Shell Resolution(Low) 19.2216
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 2721
    R-Factor(R-Work) 0.1393
    R-Factor(R-Free) 0.1498
    Percent Reflections(Observed) 95.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.006
    f_chiral_restr 0.066
    f_dihedral_angle_d 14.009
    f_angle_d 1.145
    f_bond_d 0.009
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 6560
    Nucleic Acid Atoms 0
    Heterogen Atoms 0
    Solvent Atoms 220
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) SCALA
    Structure Solution MOLREP
    Structure Refinement PHENIX (PHENIX.REFINE: 1.8_1069)
     
    Software
    refinement PHENIX version: (PHENIX.REFINE: 1.8_1069)
    model building MOLREP