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X-RAY DIFFRACTION
Materials and Methods page
4B7T
  •   Crystallization Hide
    Crystallization Experiments
    Details 0.1 M TRIS-HCL, PH 8.0, 0.15 M MGCL2, 15% (W/V) PEG 4000
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 81.58 α = 90
    b = 81.58 β = 90
    c = 283.65 γ = 120
     
    Space Group
    Space Group Name:    P 61 2 2
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector IMAGE PLATE
    Type MARRESEARCH
    Details OSMIC OPTICS
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source ROTATING ANODE
    Type RIGAKU RUH3R
    Wavelength 1.5418
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) -3.0
    Resolution(High) 2.77
    Resolution(Low) 29.99
    Number Reflections(Observed) 14709
    Percent Possible(Observed) 97.3
    R Merge I(Observed) 0.06
    B(Isotropic) From Wilson Plot 46.68
    Redundancy 7.2
     
    High Resolution Shell Details
    Resolution(High) 2.77
    Resolution(Low) 2.94
    Percent Possible(All) 91.1
    R Merge I(Observed) 0.27
    Mean I Over Sigma(Observed) 7.1
    Redundancy 7.2
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.772
    Resolution(Low) 29.986
    Cut-off Sigma(F) 1.38
    Number of Reflections(Observed) 14707
    Number of Reflections(R-Free) 747
    Percent Reflections(Observed) 97.66
    R-Factor(Observed) 0.1973
    R-Work 0.1952
    R-Free 0.2353
     
    Temperature Factor Modeling
    Anisotropic B[1][1] 5.6648
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 5.6648
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -11.3297
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7722
    Shell Resolution(Low) 2.986
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 2572
    R-Factor(R-Work) 0.2626
    R-Factor(R-Free) 0.3111
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.986
    Shell Resolution(Low) 3.2862
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 2764
    R-Factor(R-Work) 0.2368
    R-Factor(R-Free) 0.2865
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2862
    Shell Resolution(Low) 3.7609
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 2794
    R-Factor(R-Work) 0.2042
    R-Factor(R-Free) 0.2406
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7609
    Shell Resolution(Low) 4.7354
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 2822
    R-Factor(R-Work) 0.1654
    R-Factor(R-Free) 0.2005
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.7354
    Shell Resolution(Low) 29.9879
    Number of Reflections(R-Free) 160
    Number of Reflections(R-Work) 3008
    R-Factor(R-Work) 0.1789
    R-Factor(R-Free) 0.2162
    Percent Reflections(Observed) 98.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.003
    f_chiral_restr 0.039
    f_dihedral_angle_d 12.29
    f_angle_d 0.585
    f_bond_d 0.002
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2946
    Nucleic Acid Atoms 0
    Heterogen Atoms 21
    Solvent Atoms 53
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) XSCALE
    Structure Solution PHASER
    Structure Refinement PHENIX (PHENIX.REFINE)
     
    Software
    refinement PHENIX version: (PHENIX.REFINE)
    model building PHASER