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X-RAY DIFFRACTION
Materials and Methods page
4B7R
  •   Crystallization Hide
    Crystallization Experiments
    Details 15% PEG3350, 0.1M BIS-TRIS PROPANE AND 0.1M SODIUM ACETATE BUFFER (PH 4.6)
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 82.65 α = 90
    b = 148.82 β = 90
    c = 166.6 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 77
     
    Diffraction Detector
    Detector CCD (QUANTUM 315)
    Type ADSC
    Collection Date 2010-02-24
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type DIAMOND BEAMLINE I02
    Wavelength 0.97950
    Site DIAMOND
    Beamline I02
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 2.0
    Resolution(High) 1.9
    Resolution(Low) 30
    Number Reflections(Observed) 163254
    Percent Possible(Observed) 99.7
    R Merge I(Observed) 0.12
    B(Isotropic) From Wilson Plot 28.07
    Redundancy 6.4
     
    High Resolution Shell Details
    Resolution(High) 1.9
    Resolution(Low) 1.99
    Percent Possible(All) 98.0
    R Merge I(Observed) 0.73
    Mean I Over Sigma(Observed) 3.0
    Redundancy 4.8
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.9
    Resolution(Low) 29.818
    Cut-off Sigma(F) 100.0
    Number of Reflections(Observed) 163045
    Number of Reflections(R-Free) 8184
    Percent Reflections(Observed) 99.66
    R-Factor(Observed) 0.1471
    R-Work 0.1457
    R-Free 0.1732
     
    Temperature Factor Modeling
    Mean Isotropic B Value 28.6
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9
    Shell Resolution(Low) 1.9216
    Number of Reflections(R-Free) 229
    Number of Reflections(R-Work) 4844
    R-Factor(R-Work) 0.3005
    R-Factor(R-Free) 0.3045
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9216
    Shell Resolution(Low) 1.9442
    Number of Reflections(R-Free) 259
    Number of Reflections(R-Work) 5024
    R-Factor(R-Work) 0.2259
    R-Factor(R-Free) 0.2647
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9442
    Shell Resolution(Low) 1.9679
    Number of Reflections(R-Free) 268
    Number of Reflections(R-Work) 5041
    R-Factor(R-Work) 0.2038
    R-Factor(R-Free) 0.2504
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9679
    Shell Resolution(Low) 1.9928
    Number of Reflections(R-Free) 245
    Number of Reflections(R-Work) 5180
    R-Factor(R-Work) 0.183
    R-Factor(R-Free) 0.1979
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9928
    Shell Resolution(Low) 2.019
    Number of Reflections(R-Free) 261
    Number of Reflections(R-Work) 5112
    R-Factor(R-Work) 0.1756
    R-Factor(R-Free) 0.2238
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.019
    Shell Resolution(Low) 2.0467
    Number of Reflections(R-Free) 267
    Number of Reflections(R-Work) 5130
    R-Factor(R-Work) 0.1731
    R-Factor(R-Free) 0.2076
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0467
    Shell Resolution(Low) 2.0759
    Number of Reflections(R-Free) 277
    Number of Reflections(R-Work) 5142
    R-Factor(R-Work) 0.1805
    R-Factor(R-Free) 0.225
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0759
    Shell Resolution(Low) 2.1069
    Number of Reflections(R-Free) 236
    Number of Reflections(R-Work) 5179
    R-Factor(R-Work) 0.1621
    R-Factor(R-Free) 0.2115
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1069
    Shell Resolution(Low) 2.1398
    Number of Reflections(R-Free) 270
    Number of Reflections(R-Work) 5141
    R-Factor(R-Work) 0.1482
    R-Factor(R-Free) 0.195
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1398
    Shell Resolution(Low) 2.1749
    Number of Reflections(R-Free) 251
    Number of Reflections(R-Work) 5133
    R-Factor(R-Work) 0.1489
    R-Factor(R-Free) 0.1719
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1749
    Shell Resolution(Low) 2.2124
    Number of Reflections(R-Free) 280
    Number of Reflections(R-Work) 5139
    R-Factor(R-Work) 0.1557
    R-Factor(R-Free) 0.1862
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2124
    Shell Resolution(Low) 2.2526
    Number of Reflections(R-Free) 302
    Number of Reflections(R-Work) 5143
    R-Factor(R-Work) 0.1924
    R-Factor(R-Free) 0.227
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2526
    Shell Resolution(Low) 2.2959
    Number of Reflections(R-Free) 271
    Number of Reflections(R-Work) 5099
    R-Factor(R-Work) 0.1631
    R-Factor(R-Free) 0.1979
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2959
    Shell Resolution(Low) 2.3427
    Number of Reflections(R-Free) 280
    Number of Reflections(R-Work) 5156
    R-Factor(R-Work) 0.1495
    R-Factor(R-Free) 0.1938
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3427
    Shell Resolution(Low) 2.3936
    Number of Reflections(R-Free) 283
    Number of Reflections(R-Work) 5129
    R-Factor(R-Work) 0.1453
    R-Factor(R-Free) 0.1857
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3936
    Shell Resolution(Low) 2.4493
    Number of Reflections(R-Free) 304
    Number of Reflections(R-Work) 5146
    R-Factor(R-Work) 0.1459
    R-Factor(R-Free) 0.1916
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4493
    Shell Resolution(Low) 2.5105
    Number of Reflections(R-Free) 289
    Number of Reflections(R-Work) 5141
    R-Factor(R-Work) 0.147
    R-Factor(R-Free) 0.1792
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5105
    Shell Resolution(Low) 2.5784
    Number of Reflections(R-Free) 307
    Number of Reflections(R-Work) 5103
    R-Factor(R-Work) 0.1459
    R-Factor(R-Free) 0.1793
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5784
    Shell Resolution(Low) 2.6542
    Number of Reflections(R-Free) 271
    Number of Reflections(R-Work) 5158
    R-Factor(R-Work) 0.1474
    R-Factor(R-Free) 0.192
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6542
    Shell Resolution(Low) 2.7398
    Number of Reflections(R-Free) 241
    Number of Reflections(R-Work) 5204
    R-Factor(R-Work) 0.1511
    R-Factor(R-Free) 0.176
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7398
    Shell Resolution(Low) 2.8377
    Number of Reflections(R-Free) 276
    Number of Reflections(R-Work) 5183
    R-Factor(R-Work) 0.1455
    R-Factor(R-Free) 0.1777
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8377
    Shell Resolution(Low) 2.9512
    Number of Reflections(R-Free) 290
    Number of Reflections(R-Work) 5181
    R-Factor(R-Work) 0.1457
    R-Factor(R-Free) 0.1958
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9512
    Shell Resolution(Low) 3.0854
    Number of Reflections(R-Free) 274
    Number of Reflections(R-Work) 5175
    R-Factor(R-Work) 0.138
    R-Factor(R-Free) 0.1618
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0854
    Shell Resolution(Low) 3.2478
    Number of Reflections(R-Free) 273
    Number of Reflections(R-Work) 5192
    R-Factor(R-Work) 0.1405
    R-Factor(R-Free) 0.1728
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2478
    Shell Resolution(Low) 3.451
    Number of Reflections(R-Free) 266
    Number of Reflections(R-Work) 5236
    R-Factor(R-Work) 0.1348
    R-Factor(R-Free) 0.1571
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.451
    Shell Resolution(Low) 3.717
    Number of Reflections(R-Free) 268
    Number of Reflections(R-Work) 5232
    R-Factor(R-Work) 0.13
    R-Factor(R-Free) 0.1501
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.717
    Shell Resolution(Low) 4.0903
    Number of Reflections(R-Free) 291
    Number of Reflections(R-Work) 5204
    R-Factor(R-Work) 0.1219
    R-Factor(R-Free) 0.1393
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.0903
    Shell Resolution(Low) 4.6802
    Number of Reflections(R-Free) 253
    Number of Reflections(R-Work) 5318
    R-Factor(R-Work) 0.1132
    R-Factor(R-Free) 0.1314
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.6802
    Shell Resolution(Low) 5.8891
    Number of Reflections(R-Free) 308
    Number of Reflections(R-Work) 5296
    R-Factor(R-Work) 0.1324
    R-Factor(R-Free) 0.1529
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.8891
    Shell Resolution(Low) 29.8221
    Number of Reflections(R-Free) 294
    Number of Reflections(R-Work) 5500
    R-Factor(R-Work) 0.1632
    R-Factor(R-Free) 0.1758
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.005
    f_chiral_restr 0.087
    f_dihedral_angle_d 14.779
    f_angle_d 1.19
    f_bond_d 0.007
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 11976
    Nucleic Acid Atoms 0
    Heterogen Atoms 344
    Solvent Atoms 956
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) DENZO
    Data Reduction (data scaling) SCALEPACK
    Structure Solution PHASER
    Structure Refinement PHENIX (PHENIX.REFINE)
     
    Software
    refinement PHENIX version: (PHENIX.REFINE)
    model building PHASER