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X-RAY DIFFRACTION
Materials and Methods page
4B7Q
  •   Crystallization Hide
    Crystallization Experiments
    Details 15% PEG3350, 0.1M BIS-TRIS PROPANE AND 0.1M SODIUM ACETATE BUFFER (PH 4.6)
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 82.65 α = 90
    b = 148.82 β = 90
    c = 166.6 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 77
     
    Diffraction Detector
    Detector CCD (QUANTUM)
    Type ADSC
    Collection Date 2010-05-10
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type DIAMOND
    Wavelength 0.97630
    Site DIAMOND
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 2.0
    Resolution(High) 2.73
    Resolution(Low) 82.65
    Number Reflections(Observed) 55091
    Percent Possible(Observed) 99.2
    R Merge I(Observed) 0.2
    B(Isotropic) From Wilson Plot 35.14
    Redundancy 6.8
     
    High Resolution Shell Details
    Resolution(High) 2.73
    Resolution(Low) 2.8
    Percent Possible(All) 99.0
    R Merge I(Observed) 0.54
    Mean I Over Sigma(Observed) 2.5
    Redundancy 6.4
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.728
    Resolution(Low) 55.494
    Cut-off Sigma(F) 1.34
    Number of Reflections(Observed) 54976
    Number of Reflections(R-Free) 2790
    Percent Reflections(Observed) 99.02
    R-Factor(Observed) 0.1783
    R-Work 0.174
    R-Free 0.2581
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7276
    Shell Resolution(Low) 2.7747
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2571
    R-Factor(R-Work) 0.1973
    R-Factor(R-Free) 0.3154
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7747
    Shell Resolution(Low) 2.8251
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 2525
    R-Factor(R-Work) 0.1912
    R-Factor(R-Free) 0.3058
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8251
    Shell Resolution(Low) 2.8795
    Number of Reflections(R-Free) 161
    Number of Reflections(R-Work) 2554
    R-Factor(R-Work) 0.1853
    R-Factor(R-Free) 0.3111
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8795
    Shell Resolution(Low) 2.9382
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 2605
    R-Factor(R-Work) 0.1965
    R-Factor(R-Free) 0.2899
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9382
    Shell Resolution(Low) 3.0021
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2565
    R-Factor(R-Work) 0.1893
    R-Factor(R-Free) 0.3322
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0021
    Shell Resolution(Low) 3.0719
    Number of Reflections(R-Free) 123
    Number of Reflections(R-Work) 2604
    R-Factor(R-Work) 0.1982
    R-Factor(R-Free) 0.3149
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0719
    Shell Resolution(Low) 3.1488
    Number of Reflections(R-Free) 129
    Number of Reflections(R-Work) 2618
    R-Factor(R-Work) 0.1969
    R-Factor(R-Free) 0.3105
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1488
    Shell Resolution(Low) 3.2339
    Number of Reflections(R-Free) 152
    Number of Reflections(R-Work) 2570
    R-Factor(R-Work) 0.192
    R-Factor(R-Free) 0.2906
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2339
    Shell Resolution(Low) 3.329
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2603
    R-Factor(R-Work) 0.1939
    R-Factor(R-Free) 0.3279
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.329
    Shell Resolution(Low) 3.4365
    Number of Reflections(R-Free) 115
    Number of Reflections(R-Work) 2638
    R-Factor(R-Work) 0.1816
    R-Factor(R-Free) 0.2663
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4365
    Shell Resolution(Low) 3.5593
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 2589
    R-Factor(R-Work) 0.1748
    R-Factor(R-Free) 0.2528
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5593
    Shell Resolution(Low) 3.7018
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2576
    R-Factor(R-Work) 0.1695
    R-Factor(R-Free) 0.2638
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7018
    Shell Resolution(Low) 3.8702
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 2587
    R-Factor(R-Work) 0.1694
    R-Factor(R-Free) 0.2426
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.8702
    Shell Resolution(Low) 4.0742
    Number of Reflections(R-Free) 152
    Number of Reflections(R-Work) 2572
    R-Factor(R-Work) 0.1588
    R-Factor(R-Free) 0.2258
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.0742
    Shell Resolution(Low) 4.3293
    Number of Reflections(R-Free) 122
    Number of Reflections(R-Work) 2621
    R-Factor(R-Work) 0.1417
    R-Factor(R-Free) 0.228
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.3293
    Shell Resolution(Low) 4.6635
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2597
    R-Factor(R-Work) 0.1477
    R-Factor(R-Free) 0.1931
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.6635
    Shell Resolution(Low) 5.1325
    Number of Reflections(R-Free) 131
    Number of Reflections(R-Work) 2627
    R-Factor(R-Work) 0.1465
    R-Factor(R-Free) 0.218
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.1325
    Shell Resolution(Low) 5.8744
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 2672
    R-Factor(R-Work) 0.1626
    R-Factor(R-Free) 0.243
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.8744
    Shell Resolution(Low) 7.3984
    Number of Reflections(R-Free) 130
    Number of Reflections(R-Work) 2697
    R-Factor(R-Work) 0.1815
    R-Factor(R-Free) 0.226
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 7.3984
    Shell Resolution(Low) 55.5051
    Number of Reflections(R-Free) 165
    Number of Reflections(R-Work) 2795
    R-Factor(R-Work) 0.1929
    R-Factor(R-Free) 0.2487
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.005
    f_chiral_restr 0.078
    f_dihedral_angle_d 13.915
    f_angle_d 1.205
    f_bond_d 0.008
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 11976
    Nucleic Acid Atoms 0
    Heterogen Atoms 209
    Solvent Atoms 386
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) DENZO
    Data Reduction (data scaling) SCALA
    Structure Solution PHASER
    Structure Refinement PHENIX (PHENIX.REFINE: 1.8_1069)
     
    Software
    refinement PHENIX version: (PHENIX.REFINE: 1.8_1069)
    model building PHASER