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X-RAY DIFFRACTION
Materials and Methods page
4B7L
  •   Crystallization Hide
    Crystallization Experiments
    pH 8.5
    Details 30% PEG 4000, 0.1 M TRIS HCL PH 8.5, 0.2 M SODIUM ACETATE
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 72.18 α = 90
    b = 69.69 β = 111.1
    c = 73.46 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 120
     
    Diffraction Detector
    Detector RAXIS IV (IMAGE PLATE)
    Type RIGAKU
    Details MIRRORS
    Collection Date 2011-01-14
     
    Diffraction Radiation
    Monochromator OSMIC MIRRORS
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source ROTATING ANODE
    Type RIGAKU MICROMAX-007 HF
    Wavelength 1.5418
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 2.5
    Resolution(High) 2.05
    Resolution(Low) 35.7
    Number Reflections(Observed) 41595
    Percent Possible(Observed) 97.5
    R Merge I(Observed) 0.11
    B(Isotropic) From Wilson Plot 29.19
    Redundancy 4.2
     
    High Resolution Shell Details
    Resolution(High) 2.05
    Resolution(Low) 2.16
    Percent Possible(All) 95.6
    R Merge I(Observed) 0.56
    Mean I Over Sigma(Observed) 2.5
    Redundancy 4.2
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.05
    Resolution(Low) 35.738
    Cut-off Sigma(F) 0.0
    Number of Reflections(Observed) 41576
    Number of Reflections(R-Free) 2094
    Percent Reflections(Observed) 97.09
    R-Factor(Observed) 0.185
    R-Work 0.1831
    R-Free 0.219
     
    Temperature Factor Modeling
    Mean Isotropic B Value 29.3
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.05
    Shell Resolution(Low) 2.0977
    Number of Reflections(R-Free) 124
    Number of Reflections(R-Work) 2576
    R-Factor(R-Work) 0.267
    R-Factor(R-Free) 0.3007
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0977
    Shell Resolution(Low) 2.1502
    Number of Reflections(R-Free) 155
    Number of Reflections(R-Work) 2542
    R-Factor(R-Work) 0.2518
    R-Factor(R-Free) 0.3056
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1502
    Shell Resolution(Low) 2.2083
    Number of Reflections(R-Free) 123
    Number of Reflections(R-Work) 2598
    R-Factor(R-Work) 0.2345
    R-Factor(R-Free) 0.2344
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2083
    Shell Resolution(Low) 2.2733
    Number of Reflections(R-Free) 109
    Number of Reflections(R-Work) 2616
    R-Factor(R-Work) 0.2173
    R-Factor(R-Free) 0.2939
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2733
    Shell Resolution(Low) 2.3466
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 2602
    R-Factor(R-Work) 0.2097
    R-Factor(R-Free) 0.2688
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3466
    Shell Resolution(Low) 2.4305
    Number of Reflections(R-Free) 130
    Number of Reflections(R-Work) 2599
    R-Factor(R-Work) 0.2023
    R-Factor(R-Free) 0.2406
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4305
    Shell Resolution(Low) 2.5278
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 2622
    R-Factor(R-Work) 0.198
    R-Factor(R-Free) 0.2406
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5278
    Shell Resolution(Low) 2.6428
    Number of Reflections(R-Free) 161
    Number of Reflections(R-Work) 2600
    R-Factor(R-Work) 0.1993
    R-Factor(R-Free) 0.2407
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6428
    Shell Resolution(Low) 2.782
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 2627
    R-Factor(R-Work) 0.1919
    R-Factor(R-Free) 0.23
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.782
    Shell Resolution(Low) 2.9563
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 2652
    R-Factor(R-Work) 0.2002
    R-Factor(R-Free) 0.2429
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9563
    Shell Resolution(Low) 3.1844
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2644
    R-Factor(R-Work) 0.1895
    R-Factor(R-Free) 0.2572
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1844
    Shell Resolution(Low) 3.5046
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2681
    R-Factor(R-Work) 0.1706
    R-Factor(R-Free) 0.2081
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5046
    Shell Resolution(Low) 4.0111
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 2690
    R-Factor(R-Work) 0.1566
    R-Factor(R-Free) 0.1796
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.0111
    Shell Resolution(Low) 5.0513
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 2685
    R-Factor(R-Work) 0.1492
    R-Factor(R-Free) 0.1913
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.0513
    Shell Resolution(Low) 35.7433
    Number of Reflections(R-Free) 166
    Number of Reflections(R-Work) 2748
    R-Factor(R-Work) 0.167
    R-Factor(R-Free) 0.1789
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.002
    f_chiral_restr 0.037
    f_dihedral_angle_d 12.192
    f_angle_d 0.598
    f_bond_d 0.002
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 5265
    Nucleic Acid Atoms 0
    Heterogen Atoms 0
    Solvent Atoms 421
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) MOSFLM
    Data Reduction (data scaling) SCALA
    Structure Solution PHASER
    Structure Refinement PHENIX (PHENIX.REFINE)
     
    Software
    refinement PHENIX version: (PHENIX.REFINE)
    model building PHASER