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X-RAY DIFFRACTION
Materials and Methods page
4B6G
  •   Crystallization Hide
    Crystallization Experiments
    pH 6.5
    Details 25 MM BIS-TRIS (PH 6.5), 200 MM LITHIUM SULFATE AND 25% PEG 3350.
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 111.27 α = 90
    b = 111.27 β = 90
    c = 169.86 γ = 120
     
    Space Group
    Space Group Name:    P 65 2 2
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD (QUANTUM 315R)
    Type ADSC
    Details SILICON MIRRORS (ADAPTIVE AND U-BENT)
    Collection Date 2010-10-30
     
    Diffraction Radiation
    Monochromator DOUBLE CRYSTAL MONOCHROMATOR (SI111)
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type AUSTRALIAN SYNCHROTRON BEAMLINE MX2
    Wavelength 0.95369
    Site AUSTRALIAN SYNCHROTRON
    Beamline MX2
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 2.0
    Resolution(High) 1.3
    Resolution(Low) 19.84
    Number Reflections(Observed) 151514
    Percent Possible(Observed) 99.4
    R Merge I(Observed) 0.06
    B(Isotropic) From Wilson Plot 10.91
    Redundancy 5.2
     
    High Resolution Shell Details
    Resolution(High) 1.3
    Resolution(Low) 1.37
    Percent Possible(All) 98.0
    R Merge I(Observed) 0.68
    Mean I Over Sigma(Observed) 2.3
    Redundancy 5.1
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.4
    Resolution(Low) 19.842
    Cut-off Sigma(F) 0.0
    Number of Reflections(Observed) 121215
    Number of Reflections(R-Free) 3610
    Percent Reflections(Observed) 99.65
    R-Factor(Observed) 0.1434
    R-Work 0.1431
    R-Free 0.1539
     
    Temperature Factor Modeling
    Mean Isotropic B Value 21.023
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.4
    Shell Resolution(Low) 1.4184
    Number of Reflections(R-Free) 161
    Number of Reflections(R-Work) 4433
    R-Factor(R-Work) 0.2209
    R-Factor(R-Free) 0.2448
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.4184
    Shell Resolution(Low) 1.4379
    Number of Reflections(R-Free) 111
    Number of Reflections(R-Work) 4469
    R-Factor(R-Work) 0.219
    R-Factor(R-Free) 0.2222
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.4379
    Shell Resolution(Low) 1.4584
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 4471
    R-Factor(R-Work) 0.2018
    R-Factor(R-Free) 0.2566
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.4584
    Shell Resolution(Low) 1.4801
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 4469
    R-Factor(R-Work) 0.1915
    R-Factor(R-Free) 0.1958
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.4801
    Shell Resolution(Low) 1.5033
    Number of Reflections(R-Free) 126
    Number of Reflections(R-Work) 4516
    R-Factor(R-Work) 0.184
    R-Factor(R-Free) 0.1897
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5033
    Shell Resolution(Low) 1.5279
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 4444
    R-Factor(R-Work) 0.1783
    R-Factor(R-Free) 0.1762
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5279
    Shell Resolution(Low) 1.5542
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 4474
    R-Factor(R-Work) 0.1645
    R-Factor(R-Free) 0.1627
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5542
    Shell Resolution(Low) 1.5825
    Number of Reflections(R-Free) 122
    Number of Reflections(R-Work) 4493
    R-Factor(R-Work) 0.1589
    R-Factor(R-Free) 0.1772
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5825
    Shell Resolution(Low) 1.6129
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 4505
    R-Factor(R-Work) 0.1544
    R-Factor(R-Free) 0.1563
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6129
    Shell Resolution(Low) 1.6458
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 4477
    R-Factor(R-Work) 0.1442
    R-Factor(R-Free) 0.1512
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6458
    Shell Resolution(Low) 1.6816
    Number of Reflections(R-Free) 127
    Number of Reflections(R-Work) 4499
    R-Factor(R-Work) 0.1482
    R-Factor(R-Free) 0.158
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6816
    Shell Resolution(Low) 1.7207
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 4500
    R-Factor(R-Work) 0.1489
    R-Factor(R-Free) 0.1712
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7207
    Shell Resolution(Low) 1.7637
    Number of Reflections(R-Free) 153
    Number of Reflections(R-Work) 4492
    R-Factor(R-Work) 0.1462
    R-Factor(R-Free) 0.1665
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7637
    Shell Resolution(Low) 1.8114
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 4490
    R-Factor(R-Work) 0.1379
    R-Factor(R-Free) 0.1553
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8114
    Shell Resolution(Low) 1.8646
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 4511
    R-Factor(R-Work) 0.1324
    R-Factor(R-Free) 0.1372
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8646
    Shell Resolution(Low) 1.9248
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 4523
    R-Factor(R-Work) 0.132
    R-Factor(R-Free) 0.1433
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9248
    Shell Resolution(Low) 1.9935
    Number of Reflections(R-Free) 131
    Number of Reflections(R-Work) 4537
    R-Factor(R-Work) 0.1295
    R-Factor(R-Free) 0.1278
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9935
    Shell Resolution(Low) 2.0732
    Number of Reflections(R-Free) 121
    Number of Reflections(R-Work) 4563
    R-Factor(R-Work) 0.131
    R-Factor(R-Free) 0.1503
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0732
    Shell Resolution(Low) 2.1675
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 4532
    R-Factor(R-Work) 0.1281
    R-Factor(R-Free) 0.1348
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1675
    Shell Resolution(Low) 2.2816
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 4542
    R-Factor(R-Work) 0.1288
    R-Factor(R-Free) 0.1347
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2816
    Shell Resolution(Low) 2.4243
    Number of Reflections(R-Free) 156
    Number of Reflections(R-Work) 4553
    R-Factor(R-Work) 0.123
    R-Factor(R-Free) 0.13
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4243
    Shell Resolution(Low) 2.6111
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 4575
    R-Factor(R-Work) 0.1329
    R-Factor(R-Free) 0.1478
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6111
    Shell Resolution(Low) 2.8732
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 4593
    R-Factor(R-Work) 0.1383
    R-Factor(R-Free) 0.1518
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8732
    Shell Resolution(Low) 3.2873
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 4603
    R-Factor(R-Work) 0.1428
    R-Factor(R-Free) 0.1549
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2873
    Shell Resolution(Low) 4.1355
    Number of Reflections(R-Free) 180
    Number of Reflections(R-Work) 4592
    R-Factor(R-Work) 0.1337
    R-Factor(R-Free) 0.1479
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.1355
    Shell Resolution(Low) 19.8436
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 4749
    R-Factor(R-Work) 0.1429
    R-Factor(R-Free) 0.1552
    Percent Reflections(Observed) 96.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.007
    f_chiral_restr 0.077
    f_dihedral_angle_d 14.519
    f_angle_d 1.222
    f_bond_d 0.011
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 4512
    Nucleic Acid Atoms 0
    Heterogen Atoms 0
    Solvent Atoms 726
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) SCALA
    Structure Solution PHASER
    Structure Refinement PHENIX (PHENIX.REFINE)
     
    Software
    refinement PHENIX version: (PHENIX.REFINE)
    model building PHASER