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X-RAY DIFFRACTION
Materials and Methods page
4B6D
  •   Crystallization Hide
    Crystallization Experiments
    pH 7.1
    Details 1.3 M SODIUM CITRATE, PH 7.1 AND 0.3 M DIMETHYLETHYLAMMONIUM PROPANE SULFONATE
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 36.85 α = 90
    b = 133.85 β = 109.03
    c = 56.68 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector PIXEL (PILATUS 6M)
    Type DECTRIS
    Collection Date 2012-07-31
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type DIAMOND BEAMLINE I02
    Wavelength 0.9795
    Site DIAMOND
    Beamline I02
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 2.6
    Resolution(High) 2.2
    Resolution(Low) 66.93
    Number Reflections(Observed) 26140
    Percent Possible(Observed) 99.4
    R Merge I(Observed) 0.15
    B(Isotropic) From Wilson Plot 33.3
    Redundancy 9.7
     
    High Resolution Shell Details
    Resolution(High) 2.2
    Resolution(Low) 2.32
    Percent Possible(All) 98.8
    R Merge I(Observed) 0.96
    Mean I Over Sigma(Observed) 2.6
    Redundancy 8.9
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method SAD
    reflnsShellList 2.2
    Resolution(Low) 66.925
    Cut-off Sigma(F) 1.14
    Number of Reflections(Observed) 24803
    Number of Reflections(R-Free) 1308
    Percent Reflections(Observed) 98.93
    R-Factor(Observed) 0.2125
    R-Work 0.2103
    R-Free 0.2355
     
    Temperature Factor Modeling
    Mean Isotropic B Value 56.8
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2004
    Shell Resolution(Low) 2.2427
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2677
    R-Factor(R-Work) 0.3106
    R-Factor(R-Free) 0.2963
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2427
    Shell Resolution(Low) 2.2885
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2695
    R-Factor(R-Work) 0.2876
    R-Factor(R-Free) 0.3224
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2885
    Shell Resolution(Low) 2.3383
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 2696
    R-Factor(R-Work) 0.2908
    R-Factor(R-Free) 0.2871
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3383
    Shell Resolution(Low) 2.3927
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2696
    R-Factor(R-Work) 0.2677
    R-Factor(R-Free) 0.2678
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3927
    Shell Resolution(Low) 2.4525
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 2758
    R-Factor(R-Work) 0.2723
    R-Factor(R-Free) 0.3565
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4525
    Shell Resolution(Low) 2.5188
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2657
    R-Factor(R-Work) 0.2637
    R-Factor(R-Free) 0.2669
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5188
    Shell Resolution(Low) 2.5929
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2779
    R-Factor(R-Work) 0.2711
    R-Factor(R-Free) 0.3132
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5929
    Shell Resolution(Low) 2.6766
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2659
    R-Factor(R-Work) 0.2655
    R-Factor(R-Free) 0.2885
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6766
    Shell Resolution(Low) 2.7723
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 2700
    R-Factor(R-Work) 0.2506
    R-Factor(R-Free) 0.2853
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7723
    Shell Resolution(Low) 2.8833
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 2720
    R-Factor(R-Work) 0.2614
    R-Factor(R-Free) 0.2725
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8833
    Shell Resolution(Low) 3.0145
    Number of Reflections(R-Free) 150
    Number of Reflections(R-Work) 2735
    R-Factor(R-Work) 0.231
    R-Factor(R-Free) 0.2468
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0145
    Shell Resolution(Low) 3.1734
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2740
    R-Factor(R-Work) 0.2402
    R-Factor(R-Free) 0.3005
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1734
    Shell Resolution(Low) 3.3722
    Number of Reflections(R-Free) 152
    Number of Reflections(R-Work) 2739
    R-Factor(R-Work) 0.2177
    R-Factor(R-Free) 0.2028
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3722
    Shell Resolution(Low) 3.6325
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2692
    R-Factor(R-Work) 0.1894
    R-Factor(R-Free) 0.2829
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.6325
    Shell Resolution(Low) 3.998
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 2711
    R-Factor(R-Work) 0.1672
    R-Factor(R-Free) 0.1943
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.998
    Shell Resolution(Low) 4.5762
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 2715
    R-Factor(R-Work) 0.1507
    R-Factor(R-Free) 0.1309
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.5762
    Shell Resolution(Low) 5.7645
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2705
    R-Factor(R-Work) 0.1609
    R-Factor(R-Free) 0.17
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.7645
    Shell Resolution(Low) 53.5985
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 2733
    R-Factor(R-Work) 0.1955
    R-Factor(R-Free) 0.2485
    Percent Reflections(Observed) 94.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.008
    f_chiral_restr 0.056
    f_dihedral_angle_d 15.123
    f_angle_d 1.128
    f_bond_d 0.007
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2734
    Nucleic Acid Atoms 0
    Heterogen Atoms 18
    Solvent Atoms 163
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) SCALA
    Structure Solution SHELXD, SHARP, SOLOMAN, MOLREP
    Structure Refinement PHENIX (PHENIX.REFINE)
     
    Software
    refinement PHENIX version: (PHENIX.REFINE)
    model building MOLREP
    model building SOLOMAN
    model building SHARP
    model building SHELXD